专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20130173332A1 ARCHITECTURE FOR ROOT CAUSE ANALYSIS, PREDICTION, AND MODELING AND METHODS THEREFOR 审中-公开
标题翻译：原因分析，预测及建模方法及其方法
公开(公告)号：US20130173332A1
公开(公告)日：2013-07-04
申请号：US13340574
申请日：2011-12-29
申请人： Tom Thuy Ho , Weidong Wang , Woon-Kyu Choi , Ji-Hoon Keith Han , Gabriel Serge Villareal
发明人： Tom Thuy Ho , Weidong Wang , Woon-Kyu Choi , Ji-Hoon Keith Han , Gabriel Serge Villareal
IPC分类号： G06Q10/06
CPC分类号： G06Q10/06
摘要： Systems and methods for automatically and/or systematically include more data sources and/or more detailed data in the analysis, prediction, and model building. Process data may be employed to pinpoint the process parameter excursions and domain knowledge and/or expert systems may be automatically and/or systematically incorporated into the root cause analysis, the prediction and/or the model building to improve results and/or to reduce the reliance on inconsistent and expensive human experts.
摘要翻译：用于在分析，预测和模型构建中自动和/或系统地包括更多数据源和/或更详细数据的系统和方法。可以使用过程数据来确定过程参数偏移和领域知识和/或专家系统可以被自动和/或系统地并入根本原因分析，预测和/或模型构建以改善结果和/或减少依赖不一致和昂贵的人类专家。

2. 发明申请

US20130080372A1 ARCHITECTURE AND METHODS FOR TOOL HEALTH PREDICTION 审中-公开
标题翻译：工具健康预测的结构和方法
公开(公告)号：US20130080372A1
公开(公告)日：2013-03-28
申请号：US13623825
申请日：2012-09-20
申请人： Tom Thuy Ho , Weidong Wang , Gabriel Serge Villareal , Ji-Hoon Keith Han , Woon-Kyu Choi
发明人： Tom Thuy Ho , Weidong Wang , Gabriel Serge Villareal , Ji-Hoon Keith Han , Woon-Kyu Choi
IPC分类号： G06N5/02
CPC分类号： G06N5/02
摘要： Computer-implemented methods and systems for tool health prediction for a tool having sub-systems and components are disclosed. The method includes providing parameter values from sensors to an expert system. The method also includes providing knowledge base data from a knowledge base to the expert system. The knowledge base includes at least one of tool history, part information, domain knowledge, and model history. The method also includes generating, using the expert system, at least one tool health prediction pertaining to tool maintenance. The prediction generation employs a set of prediction models that includes at least one prediction model. The prediction generation further employs at least the parameter values and the knowledge base data.
摘要翻译：公开了用于具有子系统和组件的工具的用于工具健康预测的计算机实现的方法和系统。该方法包括从传感器向专家系统提供参数值。该方法还包括将知识库数据从知识库提供给专家系统。知识库包括工具历史，零件信息，领域知识和模型历史中的至少一个。该方法还包括使用专家系统生成关于工具维护的至少一个工具健康预测。预测生成使用包括至少一个预测模型的一组预测模型。预测生成进一步至少采用参数值和知识库数据。

3. 发明申请

US20130030760A1 ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED AND MATERIAL-RELATED DATA AND METHODS THEREFOR 审中-公开
标题翻译：一体化工具相关材料分析与预测结构及其相关方法
公开(公告)号：US20130030760A1
公开(公告)日：2013-01-31
申请号：US13192387
申请日：2011-07-27
申请人： Tom Thuy Ho , Weidong Wang , Woon-Kyu Choi , Ji-Hoon Keith Han , Gabriel Serge Villareal
发明人： Tom Thuy Ho , Weidong Wang , Woon-Kyu Choi , Ji-Hoon Keith Han , Gabriel Serge Villareal
IPC分类号： G06F15/00 , G06F17/18
CPC分类号： G05B19/41875 , G05B2219/31352 , G05B2219/32179 , G05B2219/32187 , G05B2219/32194 , G05B2219/32221 , G05B2219/45031 , G06Q10/04
摘要： Integrated yield/equipment data processing system for collecting and analyzing integrated tool-related data (cause data) and material-related data (effect data) pertaining to at least one material processing tool and at least one material is disclosed. In an embodiment, the tool-related data is correlated with the material-related data, and the correlated tool-related data and material-related data is employed by logic to perform at least one of root-cause analysis, prediction model building and tool control/optimization. By integrating cause-and-effect data in a single platform, the data necessary for performing, for example, automated problem detection (e.g., automated root cause analysis) and prediction, is readily available and correlated, which for example shortens the cycle time to detection and facilitates efficient and timely automated tool management and control.
摘要翻译：公开了用于收集和分析与至少一种材料加工工具和至少一种材料相关的工具相关数据（原因数据）和材料相关数据（效果数据）的集成产量/设备数据处理系统。在一个实施例中，与工具相关的数据与材料相关的数据相关联，并且相关的工具相关数据和材料相关数据被逻辑采用以执行根本原因分析，预测模型构建和工具中的至少一个控制/优化。通过将因果数据集成在单个平台中，执行例如自动化问题检测（例如，自动根本原因分析）和预测所需的数据是容易获得和相关的，这例如缩短了周期时间检测并促进有效和及时的自动化工具管理和控制。

4. 发明申请

US20140236515A1 CLOUD-BASED ARCHITECTURE FOR ANALYSIS AND PREDICTION OF INTEGRATED TOOL-RELATED AND MATERIAL-RELATED DATA AND METHODS THEREFOR 审中-公开
标题翻译：用于分析和预测集成工具相关和材料相关数据的基于云的架构及其方法
公开(公告)号：US20140236515A1
公开(公告)日：2014-08-21
申请号：US14133499
申请日：2013-12-18
申请人： Tom Thuy Ho , Weidong Wang
发明人： Tom Thuy Ho , Weidong Wang
IPC分类号： H01L21/66
CPC分类号： H01L22/34 , G05B19/41875 , G05B2219/31352 , G05B2219/32179 , G05B2219/32187 , G05B2219/32194 , G05B2219/32221 , G05B2219/45031 , G06Q10/04
摘要： Cloud-based integrated yield/equipment data processing system for collecting and analyzing integrated tool-related data (cause data) and material-related data (effect data) pertaining to at least one material processing tool and at least one material is disclosed. In an embodiment, the tool-related data is correlated with the material-related data and the correlated tool-related data and material-related data is employed by logic to perform, using a cloud computing approach, at least one of root-cause analysis, prediction model building and tool control/optimization.
摘要翻译：公开了用于收集和分析与至少一种材料加工工具和至少一种材料有关的集成工具相关数据（原因数据）和材料相关数据（效果数据）的基于云的综合产量/设备数据处理系统。在一个实施例中，工具相关数据与材料相关数据相关，并且相关的工具相关数据和材料相关数据由逻辑采用以使用云计算方法来执行根本原因分析中的至少一个，预测模型建立和工具控制/优化。

5. 发明授权

US07958906B2 Thermally induced single-use valves and method of use 有权
标题翻译：热诱导一次性阀门及使用方法
公开(公告)号：US07958906B2
公开(公告)日：2011-06-14
申请号：US11734090
申请日：2007-04-11
申请人： Andres M. Cardenas-Valencia , Jay Dlutowski , Michelle Cardenas , John Bumgarner , Weidong Wang , Larry Langebrake
发明人： Andres M. Cardenas-Valencia , Jay Dlutowski , Michelle Cardenas , John Bumgarner , Weidong Wang , Larry Langebrake
IPC分类号： F16K17/36
CPC分类号： F16K31/025 , F16K99/0001 , F16K99/003 , F16K99/0044 , F16K2099/008 , F16K2099/0084 , Y10T137/0391 , Y10T137/1624 , Y10T137/1797
摘要： In accordance with an embodiment of the present invention, a thermally induced single-use valve is provided including a silicon wafer having a top surface and a bottom surface and at least one cavity formed in the bottom surface of the wafer, a thermally deformable membrane suspended across the cavity on the top surface of the wafer and at least one resistive element patterned on top of the thermally deformable membrane.
摘要翻译：根据本发明的实施例，提供了一种热诱导的一次性阀，其包括具有顶表面和底表面的硅晶片和形成在晶片的底表面中的至少一个空腔，可热变形的膜悬挂横跨晶片顶表面上的空腔和至少一个图案化在可热变形膜顶部的电阻元件。

6. 发明授权

US06768961B2 System and method for analyzing error information from a semiconductor fabrication process 有权
标题翻译：用于分析半导体制造工艺中的误差信息的系统和方法
公开(公告)号：US06768961B2
公开(公告)日：2004-07-27
申请号：US09952848
申请日：2001-09-14
申请人： Jonathan B. Buckheit , Weidong Wang
发明人： Jonathan B. Buckheit , Weidong Wang
IPC分类号： G06F300
CPC分类号： H01L22/20 , G01R31/2894
摘要： A system and method for analyzing error information from a semiconductor fabrication process. The system receives wafer map data describing a plurality of failing chips on a particular semiconductor wafer. The system utilizes the wafer map data to classify each of the failing chips into one of several error categories, such systematic errors, repeated or reticle errors, and random errors. The system further partitions the systematic errors into spatial clusters, which may be compared against a known library of spatial error patterns for identifying the origins of the systematic errors.
摘要翻译：一种用于分析来自半导体制造工艺的误差信息的系统和方法。系统接收描述特定半导体晶片上的多个故障芯片的晶片映射数据。该系统利用晶片映射数据将每个失败的芯片分成几个错误类别之一，例如系统误差，重复或掩模误差和随机误差。该系统进一步将系统误差分解成空间聚类，其可以与已知的空间误差模式库进行比较，以识别系统误差的起源。

7. 发明授权

US5600050A Zeolite catalyst for the liquid phase alkylation and transalkylation of benzene 失效
标题翻译：用于液相烷基化和苯烷基转移的沸石催化剂
公开(公告)号：US5600050A
公开(公告)日：1997-02-04
申请号：US355877
申请日：1994-12-14
申请人： Zhiyuan Huang , Suxian Tian , Yali Xu , Bin Zhu , Weidong Wang , Fengmei Zhang , Xie Wang
发明人： Zhiyuan Huang , Suxian Tian , Yali Xu , Bin Zhu , Weidong Wang , Fengmei Zhang , Xie Wang
IPC分类号： C07C2/66 , C07C6/12 , C07C2/70
CPC分类号： C07C6/126 , C07C2/66 , C07C2521/04 , C07C2529/70
摘要： Disclosed is a modified zeolite catalyst for the liquid phase alkylation and transalkylation of benzene comprising 30 to 70% by weight of H-beta zeolite with a silicon to aluminium ratio of 20 to 40; 0.5 to 10% by weight of halogen; and .gamma.-Al.sub.2 O.sub.3 of the balance. Also disclosed a method for preparing the said catalyst comprising adding a halogen-containing compound to a mixture of H-beta zeolite and a precursor of .gamma.-Al.sub.2 O.sub.3, forming followed by calcining.
摘要翻译：公开了用于苯的液相烷基化和烷基转移的改性沸石催化剂，其包含30至70重量％的硅铝比为20至40的H-β沸石; 0.5〜10重量％的卤素; 和余量的γ-Al2O3。还公开了一种制备所述催化剂的方法，包括向H-β沸石和γ-Al 2 O 3的前体的混合物中加入含卤素化合物，随后煅烧形成。

8. 发明申请

US20140235940A1 S-shaped Visible Hard Intubation Core 审中-公开
标题翻译： S型可见硬插管芯
公开(公告)号：US20140235940A1
公开(公告)日：2014-08-21
申请号：US14347242
申请日：2012-09-13
申请人： Weidong Wang , Fushang Xue , Aihua Chen , Benquan Yang
发明人： Weidong Wang , Fushang Xue , Aihua Chen , Benquan Yang
IPC分类号： A61M16/04 , A61B1/267 , A61B1/06 , A61B1/00 , A61B1/05
CPC分类号： A61M16/0488 , A61B1/00048 , A61B1/00052 , A61B1/05 , A61B1/0676 , A61B1/0684 , A61B1/267 , A61B1/2673
摘要： A S-shaped visible hard intubating stylet comprises a LCD display, a handler and a hard stylet which are connected successively; the hard stylet has an outer end provided with a camera and a light emitter which are connecting to the LCD display, respectively; the hard stylet is formed to comprise, from one end to the other end, successively, a first linear section, an arc-shaped section, a circular arc-shaped section and a second linear section; a tangential direction of a tail end of the circular arc-shaped section that is adjacent to the arc-shaped section, and an axis direction of the handler, have an included angle which is ranging from no 20°; the circular arc-shaped section has a circular arc radius which is ranging from 45 mm to 75 mm; the circular arc-shaped section has a circular arc corresponding to a central angle which is ranging from 60° to 80°; the second linear section and the axis direction of the handler have an included angle which is ranging from 50° to 70°.
摘要翻译： S形可见硬插管探针包括连续连接的LCD显示器，处理器和硬探针; 硬探针具有分别连接到LCD显示器的相机和发光器的外端; 硬通孔被形成为从一端到另一端依次包括第一直线部分，弧形部分，圆弧形部分和第二直线部分; 与弧形部分相邻的圆弧形部分的尾端和处理器的轴线方向的切线方向具有不大于20°的夹角; 圆弧形部分的圆弧半径为45mm至75mm; 圆弧形部分具有对应于中心角度为60°至80°的圆弧; 处理器的第二线性部分和轴线方向具有范围从50°至70°的夹角。

9. 再颁专利

USRE42481E1 Semiconductor yield management system and method 有权
标题翻译：半导体产出管理系统及方法
公开(公告)号：USRE42481E1
公开(公告)日：2011-06-21
申请号：US10972115
申请日：2004-10-22
申请人： Weidong Wang , Jonathan B. Buckheit , David W. Budd
发明人： Weidong Wang , Jonathan B. Buckheit , David W. Budd
IPC分类号： G06F19/00
CPC分类号： H01L22/20
摘要： A system and method for yield management is disclosed wherein a data set containing one or more prediction variable values and one or more response values is input into the system. The system can pre-process the input data set to remove prediction variables with missing values and data sets with missing values. The pre-processed data can then be used to generate a model that may be a decision tree. The system can accept user input to modify the generated model. Once the model is complete, one or more statistical analysis tools can be used to analyze the data and generate a list of the key yield factors for the particular data set.
摘要翻译：公开了一种用于产量管理的系统和方法，其中将包含一个或多个预测变量值和一个或多个响应值的数据集输入到系统中。系统可以预处理输入数据集，以删除具有缺失值的缺省值和数据集的预测变量。然后可以使用预处理的数据来生成可以是决策树的模型。系统可以接受用户输入修改生成的模型。一旦模型完成，就可以使用一个或多个统计分析工具来分析数据并生成特定数据集的关键产出因子的列表。

10. 发明申请

US20100235690A1 BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS 有权
标题翻译：综合电路缺陷的BITMAP聚类分析
公开(公告)号：US20100235690A1
公开(公告)日：2010-09-16
申请号：US12728629
申请日：2010-03-22
申请人： Tom T. Ho , Jonathan B. Buckheit , Weidong Wang , Xin Sun
发明人： Tom T. Ho , Jonathan B. Buckheit , Weidong Wang , Xin Sun
IPC分类号： G06F11/00
CPC分类号： G11C29/56 , G01R31/318533 , G11C29/56008 , G11C2029/5604
摘要： A system and method for defect analysis are disclosed wherein a defect data set is input into the system. A radius value is selected by a user, which is the maximum number of bits that bit failures can be separated from one another to be considered a bit cluster. When a defect data set is received, the system and method start with a fail bit and search for neighboring fail bits. The specified radius is used to qualify the found fail bits to be part of the bit cluster or not. If a minimum count of fail bits is not met, the system and method will stop searching and move to the next fail bit. If a minimum count of fail bits is met, the search continues for the next fail bit until the maximum fail bit count specified by the user is reached. Aggregation is provided such that once bit clusters have been classified, the number of clusters that have the exact match or partial match to each other is counted. The user may set the partial match as a threshold count to establish a match.
摘要翻译：公开了一种用于缺陷分析的系统和方法，其中缺陷数据集被输入到系统中。半径值由用户选择，这是位故障可以彼此分离以被认为是位簇的最大位数。当接收到缺陷数据集时，系统和方法以故障位开始，并搜索相邻的故障位。指定的半径用于将找到的故障位限定为位集群的一部分。如果不满足最小失败位计数，系统和方法将停止搜索并移动到下一个故障位。如果满足最小失败位计数，则搜索继续下一个故障位，直到达到用户指定的最大故障位数。提供聚合，使得一旦对位簇进行分类，就会计算出具有完全匹配或彼此部分匹配的聚类的数量。用户可以将部分匹配设置为阈值计数以建立匹配。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式