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    • 1. 发明授权
    • Memory cell configuration and corresponding fabrication method
    • 存储单元配置及相应的制造方法
    • US06258658B1
    • 2001-07-10
    • US09250362
    • 1999-02-12
    • Thomas BöhmVolker WeinrichManfred HainArmin KohlhaseYoichi OtaniAndreas RuschTill Schlösser
    • Thomas BöhmVolker WeinrichManfred HainArmin KohlhaseYoichi OtaniAndreas RuschTill Schlösser
    • H01L218242
    • H01L27/10823H01L27/10808
    • The memory cell configuration has a multiplicity of preferably ferroelectric memory cells in a semiconductor substrate. Mutually parallel bit line trenches run in the longitudinal direction in the main surface of the semiconductor substrate. Bit lines are disposed in the bottoms of the trenches. Source/drain regions are formed in the crowns of the trenches. Channel regions are provided in the walls of the trenches. The channel region on a wall in each case is configured such that a drivable selection transistor of the relevant memory cell is formed there, while the channel region on the other wall is configured such that the transistor located there is closed. Insulated word lines for driving the selection transistors run in the transverse direction along the main surface of the semiconductor substrate through the bit line trenches. Insulation trenches for insulating the source/drain regions in the longitudinal direction of neighboring memory cells run in the transverse direction in the main surface of the semiconductor substrate. A respective, preferably ferroelectric, capacitor is connected to the source/drain region of the respective memory cell and is arranged above the word lines.
    • 存储单元配置在半导体衬底中具有多个优选铁电存储单元。 相互并行的位线沟槽在半导体衬底的主表面中沿纵向延伸。 位线设置在沟槽的底部。 源极/漏极区域形成在沟槽的冠部中。 通道区域设置在沟槽的壁中。 在每种情况下,壁上的沟道区域被构造成使得相关存储单元的可驱动选择晶体管形成在其中,而另一壁上的沟道区域被配置为使得位于那里的晶体管闭合。 用于驱动选择晶体管的绝缘字线通过位线沟槽沿着半导体衬底的主表面在横向方向上延伸。 用于绝缘沟槽,用于使相邻存储单元的纵向上的源极/漏极区域绝缘,在半导体衬底的主表面中沿横向延伸。 相应的优选铁电电容器连接到相应存储单元的源极/漏极区域并且被布置在字线之上。
    • 3. 发明授权
    • Method for producing a semiconductor memory element
    • 半导体存储元件的制造方法
    • US06716643B1
    • 2004-04-06
    • US10048192
    • 2002-06-03
    • Manfred EngelhardtVolker Weinrich
    • Manfred EngelhardtVolker Weinrich
    • H01G706
    • H01L27/10852H01L21/31144H01L28/55
    • A method for fabricating a contact hole for a semiconductor memory element. The memory element includes a silicon substrate, an intermediate dielectric layer on the substrate, and an upper layer on the intermediate dielectric layer. The method includes forming a perforated mask on the upper layer, the mask including a material that exhibits temperature stability. The upper layer and a depression are etched into the intermediate dielectric layer as far as a residual thickness using the perforated mask. A layer including O3/TEOS-SiO2 is deposited onto a structure thus obtained. The layer including O3/TEOS-SiO2 is removed from a bottom of the depression by etching. The depression is lowered by etching to produce the contact hole as far as an interface with the silicon substrate, the silicon substrate being uncovered, and the layer including O3/TEOS-SiO2 serving as a lateral seal of the upper layer during the lowering of the depression.
    • 一种用于制造用于半导体存储元件的接触孔的方法。 存储元件包括硅衬底,衬底上的中间电介质层和中间电介质层上的上层。 该方法包括在上层上形成穿孔掩模,该掩模包括表现出温度稳定性的材料。 使用穿孔掩模将上层和凹陷蚀刻到中间介电层中至达残留厚度。 将包含O 3 / TEOS-SiO 2的层沉积到由此获得的结构上。 通过蚀刻从凹陷的底部除去包含O 3 / TEOS-SiO 2的层。 通过蚀刻降低凹陷以产生接触孔,直到与硅衬底的界面,硅衬底未被覆盖,并且包含O 3 / TEOS-SiO 2的层在下降期间作为上层的侧向密封 萧条。