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1. 外观设计

USD507532S1 Plug 失效
标题翻译：插头
公开(公告)号：USD507532S1
公开(公告)日：2005-07-19
申请号：US29204214
申请日：2004-04-27
申请人： Terutomo Kajiwara , Takayuki Katayama , Nobuki Itou
设计人： Terutomo Kajiwara , Takayuki Katayama , Nobuki Itou

2. 发明授权

US08576533B2 Discharge gap device and power supply device 有权
标题翻译：放电间隙装置和电源装置
公开(公告)号：US08576533B2
公开(公告)日：2013-11-05
申请号：US12495846
申请日：2009-07-01
申请人： Takayuki Katayama
发明人： Takayuki Katayama
IPC分类号： H02H3/22
CPC分类号： H01T4/08 , H05K1/026
摘要： A discharge gap device includes a first discharge pattern connected to a first wiring pattern and a second discharge pattern connected to a second wiring pattern which is electrically insulated from the first wiring pattern and the first discharge pattern, the second discharge pattern projecting from the second wiring pattern. The first and second discharge patterns are opposed to each other, and a gap between the first discharge pattern and the second discharge pattern is set to a predetermined interval, so that the discharge gap device discharges a lightning surge or static electricity from the gap. The first discharge pattern includes a first side face which confronts the second discharge pattern, the second discharge pattern includes a second side face which confronts the first side face, and the first side face and the second side face are arranged in parallel.
摘要翻译：放电间隙装置包括连接到第一布线图案的第一放电图案和连接到与第一布线图案和第一放电图案电绝缘的第二布线图案的第二放电图案，第二放电图案从第二布线突出模式。第一和第二放电图案彼此相对，并且第一放电图案和第二放电图案之间的间隙被设定为预定间隔，使得放电间隙装置从间隙放出雷电浪涌或静电。第一放电图案包括面对第二放电图案的第一侧面，第二放电图案包括面对第一侧面的第二侧面，并且第一侧面和第二侧面平行布置。

3. 发明申请

US20110309769A1 POWER CONTROL DEVICE FOR LED LIGHTING AND LIGHTING SYSTEM 审中-公开
标题翻译： LED照明和照明系统的电源控制装置
公开(公告)号：US20110309769A1
公开(公告)日：2011-12-22
申请号：US13012093
申请日：2011-01-24
申请人： Taisuke Kuroki , Takayuki Katayama , Masaaki Komagata , Noboru Sugie , Takeshi Suzuki
发明人： Taisuke Kuroki , Takayuki Katayama , Masaaki Komagata , Noboru Sugie , Takeshi Suzuki
IPC分类号： H05B37/02
CPC分类号： H05B37/0272
摘要： A lighting system including a power control device for controlling illuminance of a lighting fixture by outputting current to drive the lighting fixture and controlling the current, a plurality of lighting fixtures each driven to be lit by the power control device, and a switch device incorporating an energy self-supplying unit converting an operating force of a switch button into electric energy. The power control device includes a first circuit section having a receiver for receiving a wireless signal having a predetermined frequency and a control signal generating circuit for generating a control signal according to the number of times of reception of the wireless signal and operated by a first power system and a second circuit section operated by a second power system and outputting current according to the control signal from the first circuit section, and the second power system is not operated when not outputting current.
摘要翻译：一种照明系统，包括：功率控制装置，用于通过输出电流来驱动照明器具和控制电流来控制照明器具的照度;多个照明装置，每个照明装置被驱动以由功率控制装置点亮;以及开关装置，能量自供给单元将开关按钮的操作力转换为电能。功率控制装置包括：第一电路部分，具有接收器，用于接收具有预定频率的无线信号;以及控制信号发生电路，用于根据无线信号的接收次数生成控制信号并由第一功率系统和由第二电力系统操作的第二电路部分，并且根据来自第一电路部分的控制信号输出电流，并且在不输出电流时第二电力系统不工作。

4. 发明申请

US20070096761A1 Semiconductor apparatus testing arrangement and semiconductor apparatus testing method 有权
标题翻译：半导体装置测试装置和半导体装置测试方法
公开(公告)号：US20070096761A1
公开(公告)日：2007-05-03
申请号：US11339826
申请日：2006-01-26
申请人： Shigeyuki Maruyama , Yoshikazu Arisaka , Kazuhiro Tashiro , Takayuki Katayama , Tetsu Ozawa , Yuushin Kimura
发明人： Shigeyuki Maruyama , Yoshikazu Arisaka , Kazuhiro Tashiro , Takayuki Katayama , Tetsu Ozawa , Yuushin Kimura
IPC分类号： G01R31/26
CPC分类号： G01R1/0433
摘要： A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.
摘要翻译：一种用于测试在半导体衬底上制造的多个半导体器件的半导体器件测试装置，具有布置有多个测试单元的衬底，每个单元包括与半导体器件的电极端子相对应的探针和连接的导体部件用探针。

5. 发明授权

US06519163B1 Power supply unit 失效
标题翻译：供电单元
公开(公告)号：US06519163B1
公开(公告)日：2003-02-11
申请号：US09608099
申请日：2000-06-30
申请人： Takayuki Yoshimoto , Yasunobu Fushihara , Seiji Kawano , Takayuki Katayama
发明人： Takayuki Yoshimoto , Yasunobu Fushihara , Seiji Kawano , Takayuki Katayama
IPC分类号： H02M3335
CPC分类号： H02M3/33523 , H02M2001/0006 , H02M2001/0032 , Y02B70/16
摘要： A power supply unit includes a transformer converting an input voltage into a predetermined output voltage, a transistor controlling a current flowing through a primary winding of the transformer, an output voltage detecting circuit detecting an output voltage of the power supply unit and outputting a detection signal corresponding to-a level of the output voltage, a control circuit controlling the output voltage by switching on and off the transistor in accordance with the detection signal, and an operation control circuit controlling an operation of the control circuit in accordance with the output voltage
摘要翻译：电源单元包括将输入电压转换为预定的输出电压的变压器，控制流过变压器的初级绕组的电流的晶体管，检测电源单元的输出电压并输出检测信号的输出电压检测电路对应于输出电压的电平;控制电路，通过根据检测信号接通和关断晶体管来控制输出电压;以及操作控制电路，根据输出电压控制控制电路的操作

6. 发明授权

US06407572B1 System and method for testing and evaluating a device 有权
标题翻译：用于测试和评估设备的系统和方法
公开(公告)号：US06407572B1
公开(公告)日：2002-06-18
申请号：US09654525
申请日：2000-09-01
申请人： Masahiro Kanase , Takayuki Katayama , Naoyoshi Kikuchi
发明人： Masahiro Kanase , Takayuki Katayama , Naoyoshi Kikuchi
IPC分类号： G01R3126
CPC分类号： G01R31/31901 , G01R31/31707
摘要： A system for testing and evaluating a device, such as a LSI device, by searching for a factor of defect of the device is disclosed, in which terminals are classified into a plurality of terminal types based on information related to various testing conditions, and data concerning the margin of the testing conditions is obtained by altering the testing conditions for every terminal type. Further, a factor of defect of a specific terminal type is searched for in accordance with the data concerning the margin of the testing conditions, and a defective terminal is detected from the specific terminal type. A method for testing and evaluating the device is also disclosed, which is executed by operating the system described above.
摘要翻译：公开了通过搜索设备的缺陷因素来测试和评估诸如LSI设备的设备的系统，其中基于与各种测试条件相关的信息将终端分类为多种终端类型，并且数据通过改变每种终端类型的测试条件来获得测试条件的边际。此外，根据关于测试条件的余量的数据来搜索特定终端类型的缺陷因素，并且从特定终端类型检测到有缺陷的终端。还公开了一种用于测试和评估该设备的方法，其通过操作上述系统来执行。

7. 发明申请

US20100008008A1 DISCHARGE GAP DEVICE AND POWER SUPPLY DEVICE 有权
标题翻译：放电间隙装置和电源装置
公开(公告)号：US20100008008A1
公开(公告)日：2010-01-14
申请号：US12495846
申请日：2009-07-01
申请人： Takayuki Katayama
发明人： Takayuki Katayama
IPC分类号： H02H3/22 , H05F3/00
CPC分类号： H01T4/08 , H05K1/026
摘要： A discharge gap device includes a first discharge pattern connected to a first wiring pattern and a second discharge pattern connected to a second wiring pattern which is electrically insulated from the first wiring pattern and the first discharge pattern, the second discharge pattern projecting from the second wiring pattern. The first and second discharge patterns are opposed to each other, and a gap between the first discharge pattern and the second discharge pattern is set to a predetermined interval, so that the discharge gap device discharges a lightning surge or static electricity from the gap. The first discharge pattern includes a first side face which confronts the second discharge pattern, the second discharge pattern includes a second side face which confronts the first side face, and the first side face and the second side face are arranged in parallel.
摘要翻译：放电间隙装置包括连接到第一布线图案的第一放电图案和连接到与第一布线图案和第一放电图案电绝缘的第二布线图案的第二放电图案，第二放电图案从第二布线突出模式。第一和第二放电图案彼此相对，并且第一放电图案和第二放电图案之间的间隙被设定为预定间隔，使得放电间隙装置从间隙放出雷电浪涌或静电。第一放电图案包括面对第二放电图案的第一侧面，第二放电图案包括面对第一侧面的第二侧面，并且第一侧面和第二侧面平行布置。

8. 发明授权

US07355421B2 Semiconductor apparatus testing arrangement and semiconductor apparatus testing method 有权
标题翻译：半导体装置测试装置和半导体装置测试方法
公开(公告)号：US07355421B2
公开(公告)日：2008-04-08
申请号：US11339826
申请日：2006-01-26
申请人： Shigeyuki Maruyama , Yoshikazu Arisaka , Kazuhiro Tashiro , Takayuki Katayama , Tetsu Ozawa , Yuushin Kimura
发明人： Shigeyuki Maruyama , Yoshikazu Arisaka , Kazuhiro Tashiro , Takayuki Katayama , Tetsu Ozawa , Yuushin Kimura
IPC分类号： G01R31/02 , G01R31/26 , G06K5/04
CPC分类号： G01R1/0433
摘要： A semiconductor apparatus testing arrangement for testing a plurality of semiconductor devices produced on a semiconductor substrate, has a substrate on which a plurality of testing units are arranged, each unit comprising a probe needles corresponding to electrode terminals of the semiconductor device and electric conductor parts connected with the probe needles.
摘要翻译：一种用于测试在半导体衬底上制造的多个半导体器件的半导体器件测试装置，具有布置有多个测试单元的衬底，每个单元包括与半导体器件的电极端子相对应的探针和连接的导体部件用探针。

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