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    • 2. 发明申请
    • CHAMBER REPLACING METHOD
    • 室更换方法
    • US20110232058A1
    • 2011-09-29
    • US13152369
    • 2011-06-03
    • Junichi FUJIMOTOHakaru MizoguchiTatsuo Enami
    • Junichi FUJIMOTOHakaru MizoguchiTatsuo Enami
    • B23P6/00
    • H01S3/2308H01S3/0014H01S3/03H01S3/10092H01S3/225Y10T29/49718Y10T29/49721Y10T29/4973Y10T29/49826
    • When a chamber of an oscillator and one or more amplifiers is to be replaced at the timing when a predetermined period elapses, one of the chambers of the oscillator and the amplifiers having a low allowable deterioration limit is detached and this chamber is attached in place of one of the chambers of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. Thus, the chamber which has been used in one of the oscillator and amplifiers having a low allowable deterioration limit and has not reached the limit of deterioration is reused in one of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. This enables efficient use of oscillator and amplifier chambers in a multistage amplification laser apparatus, minimizing the labor and parts consumed for replacement thereof.
    • 当在预定时间段的时间内要更换振荡器和一个或多个放大器的腔室时,分离振荡器的腔室和具有低容许劣化极限的放大器之一,并且该腔室被附接以代替 振荡器的一个腔室以及具有低容许劣化极限的放大器之外的放大器。 因此,在具有低容许劣化极限且尚未达到劣化极限的振荡器和放大器之一中使用的腔室在具有低容许劣化极限的振荡器和放大器之外的其中之一中被重新使用。 这使得能够在多级放大激光装置中有效地使用振荡器和放大器腔室,从而最小化用于更换它们的人工和消耗的部件。
    • 3. 发明授权
    • Once through fan for excimer laser apparatus
    • 一次通过风扇进行准分子激光设备
    • US06337872B1
    • 2002-01-08
    • US09422857
    • 1999-10-25
    • Hisashi NaraKiyoharu NakaoHakaru MizoguchiToshihiro NishisakaTatsuo Enami
    • Hisashi NaraKiyoharu NakaoHakaru MizoguchiToshihiro NishisakaTatsuo Enami
    • H01S322
    • H01S3/036H01S3/225
    • The invention provides an once through fan for an excimer laser apparatus having a reduced vibration and being capable of increasing a rotational speed. In order to obtain this, in an once through fan (1) for an excimer laser apparatus provided with a blade portion (6) having a plurality of blades, a rotary shaft (4) for rotating the blade portion and a magnetic bearing (7) rotatably supporting the rotary shaft in a non-contact manner so as to circulate a laser gas sealed within a chamber (2) in accordance with a rotation of the blade portion, a rotor (21) of a motor (23) installed within the chamber (2) and rotating the rotary shaft (4) is mounted on an outer peripheral portion of the rotary shaft, and at least one magnetic bearing (7, 7) for supporting the rotary shaft is arranged in each of both sides in an axial direction of the rotor.
    • 本发明提供了一种具有减小的振动并能够增加转速的准分子激光装置的一次通过风扇。 为了获得这一点,在设置有具有多个叶片的叶片部分(6)的准分子激光装置的一次通过风扇(1)中,用于使叶片部分旋转的旋转轴(4)和磁性轴承(7) )以不接触的方式可旋转地支撑旋转轴,以便根据叶片部分的旋转使密封在腔室(2)内的激光气体循环;马达(23)的转子(21)安装在 室(2)并旋转旋转轴(4)安装在旋转轴的外周部分上,并且至少一个用于支撑旋转轴的磁轴承(7,7)以轴向方向布置在两侧 转子方向。
    • 4. 发明授权
    • Chamber replacing method
    • 室更换方法
    • US07984539B2
    • 2011-07-26
    • US11984292
    • 2007-11-15
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • B29C73/00
    • H01S3/2308H01S3/0014H01S3/03H01S3/10092H01S3/225Y10T29/49718Y10T29/49721Y10T29/4973Y10T29/49826
    • When a chamber of an oscillator and one or more amplifiers is to be replaced at the timing when a predetermined period elapses, one of the chambers of the oscillator and the amplifiers having a low allowable deterioration limit is detached and this chamber is attached in place of one of the chambers of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. Thus, the chamber which has been used in one of the oscillator and amplifiers having a low allowable deterioration limit and has not reached the limit of deterioration is reused in one of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. This enables efficient use of oscillator and amplifier chambers in a multistage amplification laser apparatus, minimizing the labor and parts consumed for replacement thereof.
    • 当在预定时间段的时间内要更换振荡器和一个或多个放大器的腔室时,分离振荡器的腔室和具有低容许劣化极限的放大器之一,并且该腔室被附接以代替 振荡器的一个腔室以及具有低容许劣化极限的放大器之外的放大器。 因此,在具有低容许劣化极限且尚未达到劣化极限的振荡器和放大器之一中使用的腔室在具有低容许劣化极限的振荡器和放大器之外的其中之一中被重新使用。 这使得能够在多级放大激光装置中有效地使用振荡器和放大器腔室,从而最小化用于更换它们的人工和消耗的部件。
    • 5. 发明授权
    • Chamber replacing method
    • 室更换方法
    • US08813329B2
    • 2014-08-26
    • US13152369
    • 2011-06-03
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • B29C73/00
    • H01S3/2308H01S3/0014H01S3/03H01S3/10092H01S3/225Y10T29/49718Y10T29/49721Y10T29/4973Y10T29/49826
    • When a chamber of an oscillator and one or more amplifiers is to be replaced at the timing when a predetermined period elapses, one of the chambers of the oscillator and the amplifiers having a low allowable deterioration limit is detached and this chamber is attached in place of one of the chambers of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. Thus, the chamber which has been used in one of the oscillator and amplifiers having a low allowable deterioration limit and has not reached the limit of deterioration is reused in one of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. This enables efficient use of oscillator and amplifier chambers in a multistage amplification laser apparatus, minimizing the labor and parts consumed for replacement thereof.
    • 当在预定时间段的时间内要更换振荡器和一个或多个放大器的腔室时,分离振荡器的腔室和具有低容许劣化极限的放大器之一,并且该腔室被附接以代替 振荡器的一个腔室以及具有低容许劣化极限的放大器之外的放大器。 因此,在具有低容许劣化极限且尚未达到劣化极限的振荡器和放大器之一中使用的腔室在具有低容许劣化极限的振荡器和放大器之外的其中之一中被重新使用。 这使得能够在多级放大激光装置中有效地使用振荡器和放大器腔室,从而最小化用于更换它们的人工和消耗的部件。
    • 6. 发明申请
    • Chamber replacing method
    • 室更换方法
    • US20080115342A1
    • 2008-05-22
    • US11984292
    • 2007-11-15
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • Junichi FujimotoHakaru MizoguchiTatsuo Enami
    • B21D39/00
    • H01S3/2308H01S3/0014H01S3/03H01S3/10092H01S3/225Y10T29/49718Y10T29/49721Y10T29/4973Y10T29/49826
    • When a chamber of an oscillator and one or more amplifiers is to be replaced at the timing when a predetermined period elapses, one of the chambers of the oscillator and the amplifiers having a low allowable deterioration limit is detached and this chamber is attached in place of one of the chambers of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. Thus, the chamber which has been used in one of the oscillator and amplifiers having a low allowable deterioration limit and has not reached the limit of deterioration is reused in one of the oscillator and the amplifiers other than the one having the low allowable deterioration limit. This enables efficient use of oscillator and amplifier chambers in a multistage amplification laser apparatus, minimizing the labor and parts consumed for replacement thereof.
    • 当在预定时间段的时间内要更换振荡器和一个或多个放大器的腔室时,分离振荡器的腔室和具有低容许劣化极限的放大器之一,并且该腔室被附接以代替 振荡器的一个腔室以及具有低容许劣化极限的放大器之外的放大器。 因此,在具有低容许劣化极限且尚未达到劣化极限的振荡器和放大器之一中使用的腔室在具有低容许劣化极限的振荡器和放大器之外的其中之一中被重新使用。 这使得能够在多级放大激光装置中有效地使用振荡器和放大器腔室,从而最小化用于更换它们的人工和消耗的部件。
    • 7. 发明授权
    • Vacuum ultraviolet laser wavelength measuring apparatus
    • 真空紫外线激光波长测量仪
    • US06636297B2
    • 2003-10-21
    • US09842230
    • 2001-04-26
    • Osamu WakabayashiTatsuo EnamiShinji Nagai
    • Osamu WakabayashiTatsuo EnamiShinji Nagai
    • G01J300
    • G01J9/00G01J1/4257
    • A vacuum ultraviolet laser wavelength measuring apparatus capable of accurately measuring wavelength characteristics of a laser beam. The wavelength measuring apparatus has spectral devices for generating an optical pattern corresponding to wavelength characteristics of an incident laser beam and measuring wavelength characteristics of a laser beam in a vacuum ultraviolet region oscillating from a vacuum ultraviolet laser on the basis of the optical pattern. The apparatus has a fluorescent screen for generating a fluorescent pattern having an intensity distribution corresponding to an intensity distribution of the incident optical pattern, a pattern detector for measuring the intensity distribution of the fluorescent pattern, and arithmetic unit for calculating the wavelength characteristics of the laser beam on the basis of the measured intensity distribution.
    • 一种能够精确地测量激光束的波长特性的真空紫外激光波长测量装置。 波长测量装置具有用于产生与入射激光束的波长特性相对应的光学图案的光谱装置,并且基于光学图案测量从真空紫外激光器振荡的真空紫外区域中的激光束的波长特性。 该装置具有用于产生具有对应于入射光学图案的强度分布的强度分布的荧光图案的荧光屏,用于测量荧光图案的强度分布的图案检测器和用于计算激光器的波长特性的算术单元 基于测量的强度分布。
    • 8. 发明授权
    • Wavelength detector
    • 波长检测器
    • US06243163B1
    • 2001-06-05
    • US09398191
    • 1999-09-17
    • Osamu WakabayashiTatsuo EnamiShinji NagaiToru SuzukiTakeshi OhtaHirokazu Kubo
    • Osamu WakabayashiTatsuo EnamiShinji NagaiToru SuzukiTakeshi OhtaHirokazu Kubo
    • G01J328
    • G01J9/00G01J3/28
    • The present invention can accurately detect a wavelength of a light to be detected, which is output from a source of light to be detected, without an error even if there is a change in the characteristic of a spectroscope due to an individual difference among the spectroscopes or a change in the measuring environment. The device according to the invention emits at least two reference lights (Ln, La) having different wavelengths (&lgr;n, &lgr;a) as the reference lights by reference light source. And, actual characteristic value (D) of spectroscope is calculated on the basis of detection positions (Sn, Sa) of the at least two reference lights (Ln, La) on a sensor and the known wavelengths (&lgr;n, &lgr;a) of the at least two reference lights (Ln, La) (D=(&lgr;a−&lgr;n)/(Sa−Sn)). And, on the basis of the detection positions (Sn, SO) of the reference light (Ln) and the light to be detected (LO) on the sensor (10), the calculated actual characteristic value (D) of the spectroscope and the known wavelength (&lgr;n) of the reference light (Ln), wavelength (&lgr;O) of the light to be detected (LO) is calculated (&lgr;O=&lgr;n+(SO−Sn)·D).
    • 即使由于各分光器之间的个体差异而导致的分光器的特性发生变化,本发明也能够准确地检测从被检测光源输出的被检测光的波长 或测量环境的变化。 根据本发明的装置通过参考光源发射具有不同波长(lambdn,λ))的至少两个参考光(Ln,La)作为参考光。 并且,基于传感器上的至少两个参考光(Ln,La)的检测位置(Sn,Sa)以及在传感器上的已知波长(lambdn,λ)来计算分光计的实际特征值(D) 至少两个参考光(Ln,La)(D =(λ-lambdn)/(Sa-Sn)))。 并且,基于传感器(10)上的基准光(Ln)和被检测光(LO)的检测位置(Sn,SO),计算出的分光器的实际特性值(D)和 计算参考光(Ln)的已知波长(lambdn),待检测光(LO)的波长(lambd0)(lambdO = lambdn +(SO-Sn).D)。