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    • 2. 发明申请
    • Flash device
    • 闪存设备
    • US20050135078A1
    • 2005-06-23
    • US10999814
    • 2004-11-30
    • Takashi HamadaTakanaru KobayashiAkira IwamotoSatsuki Ishibashi
    • Takashi HamadaTakanaru KobayashiAkira IwamotoSatsuki Ishibashi
    • G03B15/03G03B15/02G03B15/05H05B41/30
    • G03B15/05G03B2215/0557
    • A flash device includes at least one light emitting unit. At least one light emitting unit is attachable to a plurality of connection portions. A shielding portion shields the connection portion to which the light emitting unit is not attached. A capacitor accumulates an electric charges. A charging circuit charges the capacitor. A control circuit includes a first judgment section to judge whether or not all the plurality of connection portions are shielded and a second judgment section to judge whether or not the light emitting unit is attached to at least one of the plurality of connection portions, and permits an electric charges accumulation operation into the capacitor in a case where the first judgment section judges that all the connection portions are shielded and the second judgment section judges that the light emitting unit is attached to at least one of the plurality of connection portions.
    • 闪光装置包括至少一个发光单元。 至少一个发光单元可附接到多个连接部分。 屏蔽部分屏蔽发光单元未连接到的连接部分。 电容器累积电荷。 充电电路对电容充电。 控制电路包括:第一判断部分,用于判断所有多个连接部分是否被屏蔽;以及第二判断部分,判断所述发光单元是否连接到所述多个连接部分中的至少一个,并允许 在第一判断部判定所有连接部分被屏蔽的情况下,电容器积累电容器,并且第二判断部分判断发光部件被连接到多个连接部分中的至少一个。
    • 7. 发明授权
    • Semiconductor device including a conductive film having a tapered shape
    • 包括具有锥形形状的导电膜的半导体装置
    • US08017951B2
    • 2011-09-13
    • US12424807
    • 2009-04-16
    • Takashi HamadaYasuyuki Arai
    • Takashi HamadaYasuyuki Arai
    • H01L27/12
    • H01L27/124G02F1/13454H01L27/1214H01L27/127H01L29/42384
    • TFT structures optimal for driving conditions of a pixel portion and driving circuits are obtained using a small number of photo masks. First through third semiconductor films are formed on a first insulating film. First shape first, second, and third electrodes are formed on the first through third semiconductor films. The first shape first, second, third electrodes are used as masks in first doping treatment to form first concentration impurity regions of one conductivity type in the first through third semiconductor films. Second shape first, second, and third electrodes are formed from the first shape first, second, and third electrodes. A second concentration impurity region of the one conductivity type which overlaps the second shape second electrode is formed in the second semiconductor film in second doping treatment. Also formed in the second doping treatment are third concentration impurity regions of the one conductivity type which are placed in the first and second semiconductor films. Fourth and Fifth concentration impurity regions having the other conductivity type that is opposite to the one conductivity type are formed in the third semiconductor film in third doping treatment.
    • 使用少量的光掩模获得对像素部分和驱动电路的驱动条件最佳的TFT结构。 第一至第三半导体膜形成在第一绝缘膜上。 第一形状的第一,第二和第三电极形成在第一至第三半导体膜上。 在第一掺杂处理中,第一形状的第一,第二,第三电极用作掩模,以在第一至第三半导体膜中形成一种导电类型的第一浓度杂质区。 第二形状的第一,第二和第三电极由第一形状的第一,第二和第三电极形成。 在第二掺杂处理中,在第二半导体膜中形成与第二形状的第二电极重叠的一种导电类型的第二浓度杂质区。 在第二掺杂处理中也形成为放置在第一和第二半导体膜中的一种导电类型的第三浓度杂质区。 在第三掺杂处理中,在第三半导体膜中形成具有与一种导电类型相反的另一导电类型的第四和第五浓度杂质区。