会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明授权
    • Equipment for treating waste gas containing tar mist
    • 用于处理含有焦油雾的废气的设备
    • US4010013A
    • 1977-03-01
    • US582413
    • 1975-05-28
    • Takao Murayama
    • Takao Murayama
    • B01D46/02B01D46/04
    • B01D46/02B01D46/0075B01D46/48B01D2273/12
    • Equipment for treating waste gas containing tar mist is constituted by bag houses having bag filters therein and in which a filter cleaning apparatus for each filter is installed, respectively, a conducting duct for waste gas containing tar mist connected to each bag house and equipped with a shut-off valve, respectively, a discharging duct for treated waste gas and a supply tube for supplying protective coating material which is caused to form a precoated layer on the surface of the bag filter. The efficiency of the waste gas treatment is improved by the action of the precoated layer in inhibiting the direct contact of tar mist with the bag filter.
    • 用于处理含有焦油雾的废气的设备由其中具有袋式过滤器的袋式房屋构成,并且其中分别安装有用于每个过滤器的过滤器清洁装置,用于包含连接到每个袋室的含有焦油雾的废气的导管, 切断阀,分别用于处理废气的排放管道和用于供应在袋式过滤器的表面上形成预涂层的保护涂层材料的供应管。 通过预涂层在抑制焦油雾与袋式过滤器的直接接触的作用下,提高了废气处理的效率。
    • 10. 发明授权
    • Device testing apparatus and test method
    • 装置试验装置及试验方法
    • US06313654B1
    • 2001-11-06
    • US09339062
    • 1999-06-23
    • Yuichi NansaiTakao MurayamaKatsumi Kojima
    • Yuichi NansaiTakao MurayamaKatsumi Kojima
    • G01R3126
    • G01R31/2868G01R31/01G01R31/287G01R31/2874
    • An IC chip testing apparatus comprising a chamber 6 having inside it a test stage 8 for testing an IC chip 22, cooling units 60, 62 able to cool the inside of the chamber 6 to a temperature less than ordinary temperature, heating units 60, 62 able to heat the inside of the chamber 6 to return it to ordinary temperature, temperature sensors 72, 74 for detecting the temperature inside the chamber 6, and a temperature controller 70 for controlling the outputs of the cooling units and/or heating units 60, 62 in accordance with the outputs from the temperature sensors. The apparatus not only makes the temperature control stop but also automatically performs ordinary temperature reset processing when an alarm signal of a temperature abnormality inside the chamber is detected. Further, the apparatus automatically performs ordinary temperature reset processing when the time of continuous operation of the device testing apparatus is more than a predetermined time. In accordance with the apparatus, condensation can be effectively prevented from occurring inside the chamber even when a temperature alarm is emitted or the testing apparatus is operated continuously for a long period of time.
    • 一种IC芯片测试装置,包括在其内部具有用于测试IC芯片22的测试台8,能够将室6内部冷却至低于常温的温度的冷却单元60,62的室6,加热单元60,62 能够加热室6的内部以将其返回到常温,用于检测室6内的温度的温度传感器72,74以及用于控制冷却单元和/或加热单元60的输出的温度控制器70, 62根据温度传感器的输出。 当检测到室内的温度异常的报警信号时,该装置不仅使温度控制停止,而且还自动进行常温复位处理。 此外,当设备测试装置的连续操作时间大于预定时间时,该装置自动执行常温复位处理。 根据该装置,即使在发出温度报警或测试装置长时间连续运转的情况下,也能够有效地防止在室内发生冷凝。