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1. 发明申请

US20060124850A1 Scanning interference electron microscope 失效
标题翻译：扫描干涉电子显微镜
公开(公告)号：US20060124850A1
公开(公告)日：2006-06-15
申请号：US11294470
申请日：2005-12-06
申请人： Takao Matsumoto , Masanari Koguchi
发明人： Takao Matsumoto , Masanari Koguchi
IPC分类号： G21K7/00
CPC分类号： H01J37/28 , G03H5/00 , H01J37/023 , H01J37/244 , H01J2237/1502 , H01J2237/1514 , H01J2237/225 , H01J2237/228 , H01J2237/2447 , H01J2237/24495 , H01J2237/24564 , H01J2237/2487 , H01J2237/2614 , H01J2237/2802 , H01J2237/2803
摘要： The conventional detection technique has the following problems in detecting interference fringes: (1) Setting and adjustment are complex and difficult to conduct; (2) A phase image and an amplitude image cannot be displayed simultaneously; and (3) Detection efficiency of electron beams is low. The invention provides a scanning interference electron microscope which is improved in detection efficiency of electron beam interference fringes, and enables the user to observe electric and magnetic information easily in a micro domain of a specimen as a scan image of a high S/N ratio under optimum conditions.
摘要翻译：常规检测技术在检测干涉条纹方面存在以下问题：（1）设置和调整复杂，难以进行; （2）相位图像和振幅图像不能同时显示; （3）电子束的检测效率低。本发明提供了扫描干涉电子显微镜，其提高了电子束干涉条纹的检测效率，并且使得用户能够在样本的微区域中容易地观察电磁信息作为高S / N比的扫描图像最佳条件。

2. 发明授权

US07518111B1 Magnetic electron microscope 有权
标题翻译：磁电子显微镜
公开(公告)号：US07518111B1
公开(公告)日：2009-04-14
申请号：US11543787
申请日：2006-10-06
申请人： Takao Matsumoto , Masanari Koguchi
发明人： Takao Matsumoto , Masanari Koguchi
IPC分类号： H01J37/27 , G01N23/04
CPC分类号： G01N23/04 , G03H5/00 , H01J37/26 , H01J2237/1514 , H01J2237/221 , H01J2237/2614
摘要： Below 50-nm-diameter extremely narrow electrically-conductive fiber is used instead of the electron beam biprism used in the conventional interference electron microscope method. A phenomenon is utilized where a focus-shifted shadow of this fiber is shifted from a straight line by a distance which is proportional to a differentiation of phase change amount of an electron beam due to a sample with respect to a direction perpendicular to the fiber. The phase change amount is quantified by calibrating this shift amount through its comparison with a shift amount caused by another sample in terms of which the corresponding phase change amount has been quantitatively evaluated in advance. The differentiation amount of the quantified phase change in the electron beam due to the sample is visualized, or eventually, is integrated thereby being transformed into absolute phase change amount to be visualized.
摘要翻译：使用低于50nm直径的非常窄的导电纤维来代替在常规干涉电子显微镜方法中使用的电子束双棱镜。使用这种现象，其中该光纤的聚焦移动阴影从直线移位一定距离，该距离与由于样品相对于垂直于光纤的方向的样品的电子束的相变量的微分成正比。通过与通过与预先对相应的相变量进行定量评价的另一个样品引起的移位量进行比较来校准该偏移量来量化相位变化量。由于样品而导致的电子束的量化相变的微分量被可视化，或最终被积分，从而被转换为绝对相变量以被可视化。

3. 发明授权

US07417227B2 Scanning interference electron microscope 失效
标题翻译：扫描干涉电子显微镜
公开(公告)号：US07417227B2
公开(公告)日：2008-08-26
申请号：US11294470
申请日：2005-12-06
申请人： Takao Matsumoto , Masanari Koguchi
发明人： Takao Matsumoto , Masanari Koguchi
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： H01J37/28 , G03H5/00 , H01J37/023 , H01J37/244 , H01J2237/1502 , H01J2237/1514 , H01J2237/225 , H01J2237/228 , H01J2237/2447 , H01J2237/24495 , H01J2237/24564 , H01J2237/2487 , H01J2237/2614 , H01J2237/2802 , H01J2237/2803
摘要： The conventional detection technique has the following problems in detecting interference fringes: (1) Setting and adjustment are complex and difficult to conduct; (2) A phase image and an amplitude image cannot be displayed simultaneously; and (3) Detection efficiency of electron beams is low. The invention provides a scanning interference electron microscope which is improved in detection efficiency of electron beam interference fringes, and enables the user to observe electric and magnetic information easily in a micro domain of a specimen as a scan image of a high S/N ratio under optimum conditions.
摘要翻译：常规检测技术在检测干涉条纹方面存在以下问题：（1）设置和调整复杂，难以进行; （2）相位图像和振幅图像不能同时显示; （3）电子束的检测效率低。本发明提供了扫描干涉电子显微镜，其提高了电子束干涉条纹的检测效率，并且使得用户能够在样本的微区域中容易地观察电磁信息作为高S / N比的扫描图像最佳条件。

4. 发明申请

US20080283748A1 Electron microscope 审中-公开
标题翻译：电子显微镜
公开(公告)号：US20080283748A1
公开(公告)日：2008-11-20
申请号：US12003374
申请日：2007-12-21
申请人： Takao Matsumoto , Ruriko Tsuneta , Masanari Koguchi
发明人： Takao Matsumoto , Ruriko Tsuneta , Masanari Koguchi
IPC分类号： G21K7/00
CPC分类号： H01J37/26 , H01J37/20 , H01J2237/2001 , H01J2237/202 , H01J2237/2482 , H01J2237/2802
摘要： An electron microscope for simultaneously adjusting the tilt, rotation and temperature of the specimen, and rapidly heating a desired localized section of the specimen. Specimen holders support the specimen on one side, and contain a space on the other side. A laser beam mechanism for heating the vicinity of the specimen irradiates a focused laser beam onto the specimen from this space. The output from a light position sensor installed in the specimen holders is utilized to adjust the irradiation position of the focused laser beam by controlling a fine motion mechanism for inputting light into the vicinity of the specimen stand.
摘要翻译：电子显微镜，用于同时调整样品的倾斜，旋转和温度，并快速加热样品的所需局部截面。样品支架一侧支撑样品，另一面包含一个空间。用于加热试样附近的激光束机构将聚焦的激光束从该空间照射到试样上。通过控制用于将光输入到试样台附近的微细运动机构，安装在试样架上的光位置传感器的输出用于调整聚焦激光束的照射位置。

5. 发明申请

US20090078869A1 MAGNETIC ELECTRON MICROSCOPE 有权
标题翻译：磁电子显微镜
公开(公告)号：US20090078869A1
公开(公告)日：2009-03-26
申请号：US11543787
申请日：2006-10-06
申请人： Takao Matsumoto , Masanari Koguchi
发明人： Takao Matsumoto , Masanari Koguchi
IPC分类号： G01N23/00 , G01N13/10
CPC分类号： G01N23/04 , G03H5/00 , H01J37/26 , H01J2237/1514 , H01J2237/221 , H01J2237/2614
摘要： Below 50-nm-diameter extremely narrow electrically-conductive fiber is used instead of the electron beam biprism used in the conventional interference electron microscope method. A phenomenon is utilized where a focus-shifted shadow of this fiber is shifted from a straight line by a distance which is proportional to a differentiation of phase change amount of an electron beam due to a sample with respect to a direction perpendicular to the fiber. The phase change amount is quantified by calibrating this shift amount through its comparison with a shift amount caused by another sample in terms of which the corresponding phase change amount has been quantitatively evaluated in advance. The differentiation amount of the quantified phase change in the electron beam due to the sample is visualized, or eventually, is integrated thereby being transformed into absolute phase change amount to be visualized.
摘要翻译：使用低于50nm直径的非常窄的导电纤维来代替在常规干涉电子显微镜方法中使用的电子束双棱镜。使用这种现象，其中该光纤的聚焦移动阴影从直线移位一定距离，该距离与由于样品相对于垂直于光纤的方向的样品的电子束的相变量的微分成正比。通过与通过与预先对相应的相变量进行定量评价的另一个样品引起的移位量进行比较来校准该偏移量来量化相位变化量。由于样品而导致的电子束的量化相变的微分量被可视化，或最终被积分，从而被转换为绝对相变量以被可视化。

6. 发明授权

US07958980B2 Protection device for cylinder 有权
标题翻译：气缸保护装置
公开(公告)号：US07958980B2
公开(公告)日：2011-06-14
申请号：US11571342
申请日：2005-06-23
申请人： Hideki Seino , Takao Matsumoto
发明人： Hideki Seino , Takao Matsumoto
IPC分类号： F16F9/38
CPC分类号： F15B15/14 , E02F9/2271 , E02F9/24 , F15B15/20 , Y10T74/2196
摘要： A conventional solid protection device disposed on an exposed side of a cylinder for actuating a working device had a possibility of being permanently deformed by contacting an obstacle so as to be prevented from sliding properly corresponding to the telescopic movement of the hydraulic cylinder. An object of the invention is to provide a hardly deformable protection device. To protect an exposed side of a cylinder for a working device, a protection device includes a guard member and a slide guide into which guard member is telescopically fitted. Slide guide is attached to a cylinder tube, and a tip of guard member is attached to a tip of piston rod. Guard member is a flat plate made of spring steel. A width of guard member is larger than a diameter of the piston rod. Notches are provided on lateral opposite sides of a basic side end of guard member. Sliders are fitted to respective notches. The top of guard member is bent into a roll-shape so as to serve as a pivotal portion.
摘要翻译：设置在用于致动工作装置的气缸的暴露侧的常规固体保护装置具有通过接触障碍物而永久变形的可能性，以便防止与液压缸的伸缩运动相适应地滑动。本发明的目的是提供一种难以变形的保护装置。为了保护用于工作装置的气缸的暴露侧，保护装置包括保护构件和滑动引导件，防护构件可伸缩地安装在该导向件中。滑动引导件连接到气缸管，并且保护构件的末端附接到活塞杆的尖端。保护构件是由弹簧钢制成的平板。防护件的宽度大于活塞杆的直径。在保护构件的基本侧端的侧向相对侧设置切口。滑块适合各自的凹口。保护构件的顶部弯曲成辊状，以作为枢转部分。

7. 发明授权

US07755046B2 Transmission electron microscope 有权
标题翻译：透射电子显微镜
公开(公告)号：US07755046B2
公开(公告)日：2010-07-13
申请号：US12010702
申请日：2008-01-29
申请人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
发明人： Teruo Kohashi , Takashi Ohshima , Takao Matsumoto , Hirokazu Nishida
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： H01J37/266 , H01J37/265 , H01J2237/06383 , H01J2237/1514 , H01J2237/24557 , H01J2237/2588 , H01J2237/2614
摘要： Chirality distribution in the molecular structure of protein or the like and magnetic domain structure are analyzed with high resolution less than 10 nm. A transmission electron microscope equipped with a spin-polarized electron source is used for holography observation. The phase of transmission spin-polarized electrons changes due to the existence of chirality structure or magnetization in a sample, which is observed as an interference pattern phase shift in holography measurement.
摘要翻译：蛋白质等分子结构中的手性分布和磁畴结构以高分辨率小于10nm进行分析。配备有自旋极化电子源的透射电子显微镜用于全息观察。透射自旋极化电子的相位由于样品中手性结构或磁化的存在而改变，在全息测量中被观察为干涉图案相移。

8. 发明申请

US20080061484A1 Protective Device for Cylinder 有权
标题翻译：气缸保护装置
公开(公告)号：US20080061484A1
公开(公告)日：2008-03-13
申请号：US11571342
申请日：2005-06-23
申请人： Hideki Seino , Takao Matsumoto
发明人： Hideki Seino , Takao Matsumoto
IPC分类号： B60R19/02
CPC分类号： F15B15/14 , E02F9/2271 , E02F9/24 , F15B15/20 , Y10T74/2196
摘要： A conventional solid protection device disposed on an exposed side of a cylinder for actuating a working device had a possibility of being permanently deformed by contacting an obstacle so as to be prevented from sliding properly corresponding to the telescopic movement of the hydraulic cylinder. An object of the invention is to provide a hardly deformable protection device. To protect an exposed side of a cylinder for a working device, a protection device 30 includes a guard member 32 and a slide guide 31 into which guard member 32 is telescopically fitted. Slide guide 31 is attached to a cylinder tube 9a, and a tip of guard member 32 is attached to a tip of piston rod 9b. Guard member 32 is a flat plate made of spring steel. A width of guard member 32 is larger than a diameter of the piston rod. Notches 32a are provided on lateral opposite sides of a basic side end of guard member 32. Sliders 33 are fitted to respective notches 32a. The top of guard member 32 is bent into a roll-shape so as to serve as a pivotal portion.
摘要翻译：设置在用于致动工作装置的气缸的暴露侧的常规固体保护装置具有通过接触障碍物而永久变形的可能性，以便防止与液压缸的伸缩运动相适应地滑动。本发明的目的是提供一种难以变形的保护装置。为了保护用于工作装置的气缸的暴露侧，保护装置30包括保护构件32和滑动引导件31，防护构件32可伸缩地安装在该导向件31中。滑动引导件31连接到气缸管11a，并且防护构件32的末端附接到活塞杆9b的末端。保护构件32是由弹簧钢制成的平板。防护构件32的宽度大于活塞杆的直径。凹口32a设置在防护构件32的基本侧端的横向相对侧上。滑动件33安装到相应的凹口32a上。防护构件32的顶部弯曲成辊状，以作为枢转部分。

9. 发明申请

US20070175332A1 Gas purifying device 审中-公开
标题翻译：气体净化装置
公开(公告)号：US20070175332A1
公开(公告)日：2007-08-02
申请号：US11587354
申请日：2005-04-26
申请人： Masao Ohno , Yoshio Sahara , Katsuhiro Tetsuya , Takao Matsumoto
发明人： Masao Ohno , Yoshio Sahara , Katsuhiro Tetsuya , Takao Matsumoto
IPC分类号： B01D47/00
CPC分类号： F24F3/16 , B01D53/14 , F24F3/1417
摘要： A gas purifying device has a re-circulating section configured to re-circulate liquid discharged from an element positioned on a downstream side of an airflow to reflow to a liquid circulation system path of an element positioned on an upstream side of the air flow. The liquid dissolves and removes low-concentration contaminants by gas-liquid contact. The liquid is discharged from the element on the downstream side and is made to reflow to the element on the upstream side through the re-circulating section. Contaminants are dissolved and removed by gas-liquid contact between the liquid and non-purified air containing high-concentration contaminants.
摘要翻译：气体净化装置具有再循环部，其被配置为使从位于气流的下游侧的元件排出的液体再循环到位于空气流的上游侧的元件的液体循环系统路径。液体通过气液接触溶解并除去低浓度污染物。液体从下游侧的元件排出，并通过再循环部回流到上游侧的元件。污染物通过液体和含有高浓度污染物的非纯净空气之间的气 - 液接触而被溶解和除去。

10. 发明授权

US06353703B1 Video and audio coding method, coding apparatus, and coding program recording medium 失效
公开(公告)号：US06353703B1
公开(公告)日：2002-03-05
申请号：US08951067
申请日：1997-10-15
申请人： Hidenori Tatsumi , Koichi Horiuchi , Takao Matsumoto , Aki Yoneda , Eiji Kawahara , Yoshitaka Arase
发明人： Hidenori Tatsumi , Koichi Horiuchi , Takao Matsumoto , Aki Yoneda , Eiji Kawahara , Yoshitaka Arase
IPC分类号： H04N5928
CPC分类号： H04B1/665 , H04N19/61
摘要： A method of coding video comprises the steps of: coding one or a plurality of still picture information of pro-video information consisting of the plurality of still picture information in which video is digitized according to coding parameters; and deciding one or more coding parameters based on one or more of resolution of the pro-video information, frame rate required for reproducing coded data resulting from coding, processing performance indicating processing capability of the coding apparatus which performs the video coding step, and one or a plurality of coding parameters which affects amount of processing of coding in the video coding step.

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