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    • 6. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06683491B2
    • 2004-01-27
    • US10106107
    • 2002-03-27
    • Toru KogaShinya FujiokaKatsuhiro Mori
    • Toru KogaShinya FujiokaKatsuhiro Mori
    • G05F110
    • G11C11/4074G11C2207/2227
    • First and second voltage generators generate a first internal power supply voltage to be supplied to a first internal power supply line and a second internal power supply voltage to be supplied to a second internal power supply line, respectively. A short circuit shorts the first and second internal power supply lines when operations of both the first and second voltage generators are suspended. The first and second internal power supply lines become floating, and charges stored in the respective internal power supply lines drain out gradually. Here, since the charges are redistributed to both of the internal power supply lines, the first and second internal power supply voltages become equal in value as they drop off. Consequently, the first and second internal power supply voltages can be prevented from inversion, and internal circuits connected to both the first and second internal power supply lines can be precluded from malfunctioning.
    • 第一和第二电压发生器产生分别提供给第一内部电源线和第二内部电源电压的第一内部电源电压以供给第二内部电源线。 当第一和第二电压发生器的操作被暂停时,短路使第一和第二内部电源线短路。 第一和第二内部电源线变为浮动,并且各个内部电源线中存储的电荷逐渐排出。 这里,由于电荷被重新分配给两个内部电源线,所以第一和第二内部电源电压随着它们的下降而变得相等。 因此,可以防止第一和第二内部电源电压反转,并且可以防止连接到第一和第二内部电源线的内部电路发生故障。
    • 9. 发明授权
    • Memory device with faster write operation
    • 具有更快写入操作的存储器件
    • US6115284A
    • 2000-09-05
    • US317902
    • 1999-05-25
    • Masato MatsumiyaSatoshi EtoMasato TakitaToshikazu NakamuraAyako KitamotoKuninori KawabataHideki KanouMasatomo HasegawaToru KogaYuki Ishii
    • Masato MatsumiyaSatoshi EtoMasato TakitaToshikazu NakamuraAyako KitamotoKuninori KawabataHideki KanouMasatomo HasegawaToru KogaYuki Ishii
    • G11C11/409G11C7/00G11C7/12G11C11/407G11C11/4094G11C11/24
    • G11C11/4094G11C7/12
    • The present invention relates to a memory device including memory cells each formed of a cell transistor connected to bit and word line and a cell capacitor. The memory device includes a pre-charging circuit for pre-charging bit line to a first voltage, a sense amplifier for detecting voltages of bit lines and driving the bit lines to a second voltage for H level or a third voltage for L level, and a word line driving circuit for driving word lines to make the writing voltage for H level of the cell capacitor to a fourth voltage lower than the second voltage. The present invention is characterized in that the first voltage is lower than an intermediate value between the second and third voltages. According to the present invention, it becomes possible to prevent the voltage V.sub.ds of the cell transistor from being zero by setting the writing voltage (fourth voltage) for H level of the cell capacitor to be lower than the voltage for H level (second voltage) of the bit line, thus reducing a time of writing or re-writing data. Additionally, a pre-charge voltage (first voltage) of the bit lines is set to be lower than the half of the amplitude of the bit line. Thereby, it also becomes possible to prevent the very small voltage of the bit line from being smaller according to the lowered H level voltage in the memory cell.
    • 本发明涉及包括由连接到位和字线的单元晶体管形成的存储单元和单元电容器的存储器件。 存储装置包括用于将位线预充电到第一电压的预充电电路,用于检测位线的电压并将位线驱动为用于H电平的第二电压或L电平的第三电压的读出放大器,以及 用于驱动字线以使单元电容器的H电平的写入电压低于低于第二电压的第四电压的字线驱动电路。 本发明的特征在于,第一电压低于第二和第三电压之间的中间值。 根据本发明,通过将单元电容器的H电平的写入电压(第四电压)设定为低于H电平(第二电压)的电压,可以防止单元晶体管的电压Vds为零, 的位线,从而减少写入或重写数据的时间。 此外,位线的预充电电压(第一电压)被设置为低于位线的幅度的一半。 因此,根据存储单元中的低电平电平,也可以防止位线的非常小的电压变小。