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1. 发明授权

US06635839B1 Semiconductor analysis arrangement and method therefor 有权
标题翻译：半导体分析安排及其方法
公开(公告)号：US06635839B1
公开(公告)日：2003-10-21
申请号：US09838672
申请日：2001-04-19
申请人： Glen P. Gilfeather , Srikar V. Chunduri , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
发明人： Glen P. Gilfeather , Srikar V. Chunduri , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
IPC分类号： B07C500
CPC分类号： G01N21/9501 , G01R31/311
摘要： Semiconductor die analysis is enhanced using a system that is adapted to perturb a die in a test chamber and to detect a response from the die to the perturbation. According to an example embodiment of the present invention, a semiconductor die analysis system includes a test chamber and a docking arrangement adapted to dock with the test chamber. A die is held in the docking arrangement and is presented inside of the test chamber when the docking arrangement is docked with the chamber. Two or more perturbation devices are used to perturb the die, and controller is adapted to control the perturbation. A data acquisition arrangement receives data from the die in response to the perturbation, and the data is used for analyzing the die.
摘要翻译：使用适于扰动测试室中的管芯并检测从管芯到扰动的响应的系统来增强半导体管芯分析。根据本发明的示例性实施例，半导体管芯分析系统包括测试室和适于与测试室对接的对接装置。模具保持在对接装置中，并且当对接装置与腔室对接时，将模具放置在测试室的内部。使用两个或更多个扰动装置扰乱管芯，并且控制器适于控制扰动。数据采集装置响应于扰动从管芯接收数据，并且数据用于分析管芯。

2. 发明授权

US06844928B1 Fiber optic semiconductor analysis arrangement and method therefor 失效
标题翻译：光纤半导体分析布置及其方法
公开(公告)号：US06844928B1
公开(公告)日：2005-01-18
申请号：US09838717
申请日：2001-04-19
申请人： Glen P. Gilfeather , Srikar V. Chunduri , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
发明人： Glen P. Gilfeather , Srikar V. Chunduri , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
IPC分类号： G01N21/95 , G01N21/00
CPC分类号： G01N21/9501
摘要： The operability of light-based semiconductor die analysis is enhanced using a method and arrangement that directs light between a light source and a die. In one example embodiment of the present invention, a light source is directed to a die in a semiconductor analysis arrangement using a fiber optic cable. The analysis arrangement is adapted to use light received via the fiber optic cable to analyze the die. The analysis includes one or more light-based applications, such as stimulating a selected portion of the die with the light and detecting a response therefrom. In this manner, light can be directed to a die in a variety of analysis implementations, such as for analyzing a die in a test chamber.
摘要翻译：使用在光源和管芯之间引导光的方法和装置来增强基于光的半导体管芯分析的可操作性。在本发明的一个示例实施例中，使用光纤电缆将光源引导到半导体分析装置中的管芯。分析装置适于使用经由光纤电缆接收的光来分析模具。该分析包括一种或多种基于光的应用，例如用光刺激所述裸片的选定部分并检测其中的响应。以这种方式，可以在各种分析实现中将光导向模具，例如用于在测试室中分析模具。

3. 发明授权

US06700659B1 Semiconductor analysis arrangement and method therefor 失效
标题翻译：半导体分析安排及其方法
公开(公告)号：US06700659B1
公开(公告)日：2004-03-02
申请号：US09838671
申请日：2001-04-19
申请人： Srikar V. Chunduri , Glen P. Gilfeather , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
发明人： Srikar V. Chunduri , Glen P. Gilfeather , Brennan V. Davis , David H. Eppes , Victoria Bruce , Michael Bruce , Rosalinda M. Ring , Daniel Stone
IPC分类号： G01N2188
CPC分类号： G01R31/311 , G01N21/9501
摘要： The operability of light-based semiconductor die analysis is enhanced using a method and arrangement that can detect light leakage between a light source and a die. In one example embodiment of the present invention, a light source is directed to a semiconductor analysis arrangement using, for example, a fiber optic cable. The analysis arrangement is adapted to use light from the light source for analyzing the die. A light detection arrangement detects a condition of light leakage from the system and generates a signal representing the condition of light leakage. The generated signal can then be used to control the semiconductor analysis arrangement, such as by deactivating the light source in response to a detected leak, or by allowing the light source to function in response to not detecting a leak.
摘要翻译：使用可以检测光源和管芯之间的光泄漏的方法和装置来增强基于光的半导体管芯分析的可操作性。在本发明的一个示例性实施例中，使用例如光纤电缆将光源引导到半导体分析装置。分析装置适于使用来自光源的光来分析模具。光检测装置检测来自系统的光泄漏的状况，并产生表示漏光状况的信号。所产生的信号然后可以用于控制半导体分析装置，例如通过响应于检测到的泄漏而停用光源，或者通过允许光源响应于不检测泄漏而起作用。

4. 发明申请

US20130035971A1 Computing Systems And Methods For Statistically Characterizing An Organization 审中-公开
标题翻译：用于统计特征组织的计算系统和方法
公开(公告)号：US20130035971A1
公开(公告)日：2013-02-07
申请号：US13196736
申请日：2011-08-02
申请人： Michael Bruce
发明人： Michael Bruce
IPC分类号： G06Q10/00
CPC分类号： G06Q10/105
摘要： The present invention is directed to computing systems and methods for gathering, analyzing, and presenting information to statistically characterize an organization. In one aspect of the invention, a computing system includes computer readable medium(s) having characteristics regarding organizations, data showing how the characteristics relate to a first organization and showing how the characteristics relate to other organizations, and software for analyzing the data to determine distinctive characteristics of the first organization. The computing system includes processor(s) executing the software, which when executed causes the system to identify a first characteristic that, statistically more than any of the other characteristics, relates to the first organization more than it relates to other organizations. Various other aspects and embodiments of the invention are disclosed.
摘要翻译：本发明涉及用于收集，分析和呈现信息以统计特征化组织的计算系统和方法。在本发明的一个方面，计算系统包括具有关于组织的特征的计算机可读介质，显示特征如何与第一组织相关的数据，以及显示特征如何与其他组织相关的数据，以及用于分析数据以确定第一个组织的独特特征。计算系统包括执行软件的处理器，当执行时，系统识别第一特性，其统计上比任何其他特征与第一个组织相关，而不是与其他组织相关。公开了本发明的各种其它方面和实施例。

5. 发明授权

US06897664B1 Laser beam induced phenomena detection 有权
标题翻译：激光束诱发现象检测
公开(公告)号：US06897664B1
公开(公告)日：2005-05-24
申请号：US10261390
申请日：2002-09-30
申请人： Michael Bruce , Gregory A. Dabney , Palaniappan Muthupalaniappan , Jiann Min Chin , Richard Jacob Wilcox , Glen Gilfeather , Brennan Davis , Jacob Phang , Choon Meng Chua , Lian Ser Koh , Hoo-Yin Ng , Soon Huat Tan
发明人： Michael Bruce , Gregory A. Dabney , Palaniappan Muthupalaniappan , Jiann Min Chin , Richard Jacob Wilcox , Glen Gilfeather , Brennan Davis , Jacob Phang , Choon Meng Chua , Lian Ser Koh , Hoo-Yin Ng , Soon Huat Tan
IPC分类号： G01R31/305 , G01R31/311
CPC分类号： G01R31/311
摘要： Apparatus for and methods of inspection using laser beam induced alteration are provided. In one aspect, an apparatus is provided that includes a laser scanning microscope for directing a laser beam at a circuit structure and a source for biasing and thereby establishing a power condition in the circuit structure. A detection circuit is provided for detecting a change in the power condition in response to illumination of the circuit structure by the laser beam and generating a first output signal based on the detected change. A signal processor is provided for processing the first output signal and generating a second output signal based thereon. A control system is operable to scan the laser beam according to a pattern that has a plurality of pixel locations, whereby the laser beam may be moved to a given pixel location and allowed to dwell there for a selected time before being moved to another pixel location.
摘要翻译：提供了使用激光束诱发改变的装置和检查方法。在一个方面，提供了一种装置，其包括用于将电路结构的激光束引导的激光扫描显微镜和用于偏置的源，从而在电路结构中建立功率状态。提供一种检测电路，用于响应于激光束对电路结构的照明而检测功率状态的变化，并且基于检测到的变化产生第一输出信号。提供信号处理器用于处理第一输出信号并基于此产生第二输出信号。控制系统可操作以根据具有多个像素位置的图案来扫描激光束，由此激光束可以移动到给定的像素位置，并允许其在移动到另一像素位置之前在选定的时间停留。

6. 发明授权

US10012692B2 Precision probe positioning for at-speed integrated circuit testing using through silicon in-circuit logic analysis 有权
公开(公告)号：US10012692B2
公开(公告)日：2018-07-03
申请号：US14299696
申请日：2014-06-09
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/311 , G01R31/3177
CPC分类号： G01R31/311 , G01R31/3177
摘要： A method, system, and computer program product for precision probe positioning and testing of an integrated circuit. Methods, systems, and a computer program product implement techniques for determining a particular area of interest for precision probe positioning and testing where the particular area of interest comprises an area less than an entire area of the integrated circuit. Once the particular area of interest for testing has been determined, then a laser probe is steered or otherwise directed to illuminate a plurality of pixels within the area of interest so as to generate reflected signals corresponding to the illuminated pixels. Techniques are provided for measuring the reflected signals to determine information about the IC within the area of interest. CAD data or user data can be used to determine XY addressable pixel locations within the area of interest.

7. 发明申请

US20170299653A9 PRECISION PROBE POSITIONING FOR AT-SPEED INTEGRATED CIRCUIT TESTING USING THROUGH SILICON IN-CIRCUIT LOGIC ANALYSIS 审中-公开
公开(公告)号：US20170299653A9
公开(公告)日：2017-10-19
申请号：US14299696
申请日：2014-06-09
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/311 , G01R31/3177
CPC分类号： G01R31/311 , G01R31/3177
摘要： A method, system, and computer program product for precision probe positioning and testing of an integrated circuit. Methods, systems, and a computer program product implement techniques for determining a particular area of interest for precision probe positioning and testing where the particular area of interest comprises an area less than an entire area of the integrated circuit. Once the particular area of interest for testing has been determined, then a laser probe is steered or otherwise directed to illuminate a plurality of pixels within the area of interest so as to generate reflected signals corresponding to the illuminated pixels. Techniques are provided for measuring the reflected signals to determine information about the IC within the area of interest. CAD data or user data can be used to determine XY addressable pixel locations within the area of interest.

8. 发明授权

US09714978B2 At-speed integrated circuit testing using through silicon in-circuit logic analysis 有权
公开(公告)号：US09714978B2
公开(公告)日：2017-07-25
申请号：US13862244
申请日：2013-04-12
申请人： Larry Ross , Michael Bruce
发明人： Larry Ross , Michael Bruce
IPC分类号： G01R31/3177 , G01R31/28 , G01R31/311
CPC分类号： G01R31/2882 , G01R31/311
摘要： A method, system, and computer program product for integrated circuit wafer and die testing. The method commences by selecting areas of interest accessible from a backside of an integrated circuit where the areas of interest correspond to electronic devices (e.g., gates or transistors or vias or pads). Then, using a small-beam light source such as a laser, illuminating the areas of interest and collecting the reflected signal returned from illuminated areas of interest. A processor analyses the reflected signal to determine logic states and timing information of the electronic devices and compares the determined logic states and timing information to a pre-determined logic pattern to identify one or more errors as observed from the actual electronic devices. Specific points within an area of interest are determined from CAD layout data, and the pre-determined logic patterns can be retrieved from CAD simulation data.

9. 发明授权

US09047585B2 Method and system for informed decision making to locate a workforce 有权
标题翻译：确定劳动力的知情决策方法和制度
公开(公告)号：US09047585B2
公开(公告)日：2015-06-02
申请号：US13068522
申请日：2011-05-13
申请人： Michael Bruce , Curtis Lynch
发明人： Michael Bruce , Curtis Lynch
IPC分类号： G06F7/00 , G06F17/30 , G06Q10/10 , G06Q10/06
CPC分类号： G06Q10/10 , G06Q10/063 , G06Q10/0631 , G06Q10/105
摘要： The present invention concerns a computer-implemented method and system that aides in reducing the amount of regret experienced when deciding between and amongst geographic areas having a suitable workforce. More specifically, the present invention includes a user selecting critical factors relating to worker demographics that define geographic areas. Data is returned to the user's computer as a virtual table and is a mixture of critical or informational factors qualifying all areas returning data. Each area is ranked according to the value of lowest returned index number, which gives the user a quick assessment of problematic critical factors for each area. Area utilities are created and give the user the ability to simultaneously compare all remaining areas to one another so that they may select at least one area amongst many with the smallest chance for a bad surprise. This reduces the regret of a user having to select one area over another having a suitable workforce for their business needs.
摘要翻译：本发明涉及一种计算机实现的方法和系统，其在减少在具有适当劳动力的地理区域之间和之间进行决定时所经历的遗憾的数量。更具体地，本发明包括用户选择与定义地理区域的工人人口统计特征有关的关键因素。数据作为虚拟表返回给用户的计算机，并且是关键或信息因素的混合，限定所有返回数据的区域。每个区域根据最低返回指数的值进行排序，为用户快速评估每个区域的关键因素。创建区域实用程序，并使用户能够同时将所有剩余区域彼此进行比较，以便他们可以选择至少一个区域，其中最小的机会是一个坏的惊喜。这减少了用户必须根据其业务需要选择具有合适的劳动力的另一个区域的遗憾。

10. 发明授权

US08763225B2 Separator tool with indexing head 有权
标题翻译：带分度头的分离器工具
公开(公告)号：US08763225B2
公开(公告)日：2014-07-01
申请号：US12915700
申请日：2010-10-29
申请人： Michael Bruce , Awad Aly Gharib
发明人： Michael Bruce , Awad Aly Gharib
IPC分类号： B25B11/00
CPC分类号： B25B27/02
摘要： A separator tool including a handle formed a hub at a first end, the hub defining a through bore that is transverse to a longitudinal center axis of the handle, a tool head formed with an integral yoke including opposed first and second legs, the tool head being pivotably coupled to the first end of the handle, an indexing stud slidably disposed within the through bores of the hub and first and second legs of the yoke, and the indexing stud being slidable within the through bores between a first position in which the tool head is secured in a fixed position relative to the handle, and a second position in which the tool head is pivotable relative to the handle.
摘要翻译：一种分离器工具，包括在第一端处形成轮毂的手柄，所述轮毂限定横向于所述手柄的纵向中心轴线的通孔;工具头，其形成有包括相对的第一和第二腿部的整体轭，所述工具头可枢转地联接到手柄的第一端，分度柱可滑动地设置在轮毂的通孔内，轭架的第一和第二腿部，并且分度柱可在通孔之间在第一位置之间滑动，在第一位置，头部相对于把手固定在固定位置，第二位置，工具头相对于手柄可枢转。

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