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    • 1. 发明授权
    • High speed parallel procesing digita path for SAR ADC
    • SAR ADC的高速并行处理数字通路
    • US07839319B2
    • 2010-11-23
    • US12254678
    • 2008-10-20
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • H03M1/34
    • H03M1/462H03M1/0673H03M1/468H03M1/687
    • The analog-to-digital for converter (ADC) for converting an analog value into a digital equivalent using a parallel digital data path is disclosed. In one example embodiment, the ADC includes a switched capacitor DAC having an input to receive an analog value via analog sample and hold circuit. A comparator is coupled to the switched capacitor DAC. A successive approximation register (SAR) is coupled to the comparator. A plurality of logic blocks is coupled to the SAR. A plurality of thermometric encoders is coupled to the associated plurality of logic blocks. A plurality of MUXs is coupled to the associated plurality of thermometric encoders and the comparator, wherein the plurality of MUXs having associated outputs that is coupled to the input of the switched capacitor DAC.
    • 公开了用于使用并行数字数据路径将模拟值转换成数字等效的用于转换器(ADC)的模拟数字转换器。 在一个示例实施例中,ADC包括具有经由模拟采样和保持电路接收模拟值的输入的开关电容器DAC。 比较器耦合到开关电容器DAC。 逐次逼近寄存器(SAR)耦合到比较器。 多个逻辑块耦合到SAR。 多个温度测量编码器耦合到相关联的多个逻辑块。 多个MUX耦合到相关联的多个温度测量编码器和比较器,其中多个MUX具有耦合到开关电容器DAC的输入的相关输出。
    • 2. 发明申请
    • High Speed Parallel Procesing Digita Path for SAR ADC
    • SAR ADC的高速并行处理数字通路
    • US20090102694A1
    • 2009-04-23
    • US12254678
    • 2008-10-20
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • H03M1/34
    • H03M1/462H03M1/0673H03M1/468H03M1/687
    • The analog-to-digital for converter (ADC) for converting an analog value into a digital equivalent using a parallel digital data path is disclosed. In one example embodiment, the ADC includes a switched capacitor DAC having an input to receive an analog value via analog sample and hold circuit. A comparator is coupled to the switched capacitor DAC. A successive approximation register (SAR) is coupled to the comparator. A plurality of logic blocks is coupled to the SAR. A plurality of thermometric encoders is coupled to the associated plurality of logic blocks. A plurality of MUXs is coupled to the associated plurality of thermometric encoders and the comparator, wherein the plurality of MUXs having associated outputs that is coupled to the input of the switched capacitor DAC.
    • 公开了用于使用并行数字数据路径将模拟值转换成数字等效的用于转换器(ADC)的模拟数字转换器。 在一个示例实施例中,ADC包括具有经由模拟采样和保持电路接收模拟值的输入的开关电容器DAC。 比较器耦合到开关电容器DAC。 逐次逼近寄存器(SAR)耦合到比较器。 多个逻辑块耦合到SAR。 多个温度测量编码器耦合到相关联的多个逻辑块。 多个MUX耦合到相关联的多个温度测量编码器和比较器,其中多个MUX具有耦合到开关电容器DAC的输入的相关输出。
    • 3. 发明授权
    • Parallel digital processing for reducing delay in SAR ADC logic
    • 用于减少SAR ADC逻辑延迟的并行数字处理
    • US07439898B1
    • 2008-10-21
    • US11755761
    • 2007-05-31
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • Srikanth NittalaJeremy GorboldMahesh Madhavan
    • H03M1/34
    • H03M1/462H03M1/0673H03M1/468H03M1/687
    • The analog-to-digital for converter (ADC) for converting an analog value into a digital equivalent using a parallel digital data path is disclosed. In one example embodiment, the ADC includes a switched capacitor DAC having an input to receive an analog value via analog sample and hold circuit. A comparator is coupled to the switched capacitor DAC. A successive approximation register (SAR) is coupled to the comparator. A plurality of logic blocks is coupled to the SAR. A plurality of thermometric encoders is coupled to the associated plurality of logic blocks. A plurality of MUXs is coupled to the associated plurality of thermometric encoders and the comparator, wherein the plurality of MUXs having associated outputs that is coupled to the input of the switched capacitor DAC.
    • 公开了用于使用并行数字数据路径将模拟值转换成数字等效的用于转换器(ADC)的模拟数字转换器。 在一个示例实施例中,ADC包括具有经由模拟采样和保持电路接收模拟值的输入的开关电容器DAC。 比较器耦合到开关电容器DAC。 逐次逼近寄存器(SAR)耦合到比较器。 多个逻辑块耦合到SAR。 多个温度测量编码器耦合到相关联的多个逻辑块。 多个MUX耦合到相关联的多个温度测量编码器和比较器,其中多个MUX具有耦合到开关电容器DAC的输入的相关输出。
    • 4. 发明授权
    • Test circuits and methods for redundant electronic systems
    • 冗余电子系统的测试电路和方法
    • US08624764B2
    • 2014-01-07
    • US13371297
    • 2012-02-10
    • Jeremy Gorbold
    • Jeremy Gorbold
    • H03M1/10
    • H03M1/1071G01R31/3167G05B9/03H03M1/0678H03M1/12
    • A redundant analog-to-digital conversion system can include at least one input multiplexer, first and second redundant analog-to-digital converters, a comparison circuit and an output multiplexer. The at least one input multiplexer can receive a plurality of analog input signals and output at lest one multiplexed analog input signal. The first and second redundant analog-to-digital converters can convert the at least one multiplexed analog input signal to respectively generate first and second digital output signals, the first digital output having a greater digital resolution than the second digital output. The comparison circuit can produce a comparison output signal as a function of a comparison of a plurality of most significant corresponding bit pairs of the first and second digital output signals. The output multiplexer can produce a multiplexed output including information from the comparison output signal and one of the digital output signals.
    • 冗余模数转换系统可以包括至少一个输入多路复用器,第一和第二冗余模数转换器,比较电路和输出多路复用器。 所述至少一个输入多路复用器可以接收多个模拟输入信号,并输出至少一个复用的模拟输入信号。 第一和第二冗余模数转换器可以将至少一个复用的模拟输入信号转换成分别产生第一和第二数字输出信号,第一数字输出具有比第二数字输出更大的数字分辨率。 比较电路可以产生比较输出信号作为第一和第二数字输出信号的多个最高有效对应位对的比较的函数。 输出多路复用器可以产生包括来自比较输出信号和数字输出信号之一的信息的复用输出。