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1. 发明授权

US08222912B2 Probe head structure for probe test cards 有权
标题翻译：探头测头卡头探头结构
公开(公告)号：US08222912B2
公开(公告)日：2012-07-17
申请号：US12403264
申请日：2009-03-12
申请人： Son N. Dang , Gerald W. Back , Rehan Kazmi
发明人： Son N. Dang , Gerald W. Back , Rehan Kazmi
IPC分类号： G01R1/067
CPC分类号： G01R1/0675 , G01R1/07357
摘要： A probe head assembly for testing a device under test includes a plurality of test probes and a probe head structure. The probe head structure includes a guide plate and a template and supports a plurality of test probes that each includes a tip portion with a tip end for making electrical contact with a device under test, a curved compliant body portion and a tail portion with a tail end for making electrical contact with the space transformer. Embodiments of the invention include offsetting the position of the tail portions of the test probes with respect to the tip portions of the test probes so that the tip portions of the test probes are biased within the apertures of the guide plate, using hard stop features to help maintain the position of the test probes with respect to the guide plate and probe ramp features to improve scrubbing behavior.
摘要翻译：用于测试待测器件的探头组件包括多个测试探头和探头头结构。探针头结构包括引导板和模板，并且支撑多个测试探针，每个测试探针包括具有尖端的尖端部分，该尖端部分具有与被测器件电接触的尖端，弯曲的柔顺体部分和具有尾部的尾部结束与空间变压器的电气接触。本发明的实施例包括相对于测试探针的末端部分抵消测试探针的尾部的位置，使得测试探针的末端部分被偏压在导板的孔内，使用硬停止特征有助于保持测试探针相对于导板和探针斜坡特征的位置，以改善擦洗行为。

2. 发明申请

US20100231249A1 Probe Head Structure For Probe Test Cards 有权
标题翻译：探头头结构探头测试卡
公开(公告)号：US20100231249A1
公开(公告)日：2010-09-16
申请号：US12403264
申请日：2009-03-12
申请人： Son N. Dang , Gerald W. Back , Rehan Kazmi
发明人： Son N. Dang , Gerald W. Back , Rehan Kazmi
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/0675 , G01R1/07357
摘要： A probe head assembly for testing a device under test includes a plurality of test probes and a probe head structure. The probe head structure includes a guide plate and a template and supports a plurality of test probes that each includes a tip portion with a tip end for making electrical contact with a device under test, a curved compliant body portion and a tail portion with a tail end for making electrical contact with the space transformer. Embodiments of the invention include offsetting the position of the tail portions of the test probes with respect to the tip portions of the test probes so that the tip portions of the test probes are biased within the apertures of the guide plate, using hard stop features to help maintain the position of the test probes with respect to the guide plate and probe ramp features to improve scrubbing behavior.
摘要翻译：用于测试待测器件的探头组件包括多个测试探头和探头头结构。探针头结构包括引导板和模板，并且支撑多个测试探针，每个测试探针包括具有尖端的尖端部分，该尖端部分具有与被测器件电接触的尖端，弯曲的柔顺体部分和具有尾部的尾部结束与空间变压器的电气接触。本发明的实施例包括使测试探针的尾部相对于测试探针的末端部分的位置偏移，使得测试探针的末端部分被偏压在引导板的孔内，使用硬停止特征有助于保持测试探针相对于导板和探针斜坡特征的位置，以改善擦洗行为。

3. 发明授权

US08430676B2 Modular space transformer for fine pitch vertical probing applications 有权
标题翻译：用于细间距垂直探测应用的模块化空间变压器
公开(公告)号：US08430676B2
公开(公告)日：2013-04-30
申请号：US12538639
申请日：2009-08-10
申请人： Son Dang , Rehan Kazmi , Gerald Back , Bahadir Tunaboylu
发明人： Son Dang , Rehan Kazmi , Gerald Back , Bahadir Tunaboylu
IPC分类号： H01R12/00
CPC分类号： G01R31/2889 , Y10T29/4902
摘要： In an embodiment, a modular space transformer for use in a probe card assembly includes a bottom plate, a guide plate, and a top plate. The guide plate is configured for mounting in a cut-out of the bottom plate. The guide plate has a first surface and a second surface and additionally has a first plurality of spaced electrical connections disposed in a plurality of apertures formed through the guide plate for providing electrical connections between a plurality of test probe contacts and a plurality of guide plate contacts. The top plate has a plurality of spaced electrical contacts disposed through the top plate with at least one of the plurality of guide plate contacts electrically connected to at least one of the plurality of spaced electrical contacts.
摘要翻译：在一个实施例中，用于探针卡组件的模块化空间变换器包括底板，导向板和顶板。引导板被配置为安装在底板的切口中。引导板具有第一表面和第二表面，并且另外具有第一多个间隔开的电连接，设置在通过引导板形成的多个孔中，用于提供多个测试探针触点和多个引导板触点之间的电连接。顶板具有穿过顶板设置的多个间隔开的电触点，多个引导板触点中的至少一个与多个间隔开的电触点中的至少一个电连接。

4. 发明申请

US20110032063A1 Modular Space Transformer For Fine Pitch Vertical Probing Applications 有权
标题翻译：用于精细间距垂直探测应用的模块化空间变压器
公开(公告)号：US20110032063A1
公开(公告)日：2011-02-10
申请号：US12538639
申请日：2009-08-10
申请人： Son Dang , Rehan Kazmi , Gerald Back , Bahadir Tunaboylu
发明人： Son Dang , Rehan Kazmi , Gerald Back , Bahadir Tunaboylu
IPC分类号： H01F27/29 , H01F41/00
CPC分类号： G01R31/2889 , Y10T29/4902
摘要： In an embodiment, a modular space transformer for use in a probe card assembly includes a bottom plate, a guide plate, and a top plate. The guide plate is configured for mounting in a cut-out of the bottom plate. The guide plate has a first surface and a second surface and additionally has a first plurality of spaced electrical connections disposed in a plurality of apertures formed through the guide plate for providing electrical connections between a plurality of test probe contacts and a plurality of guide plate contacts. The top plate has a plurality of spaced electrical contacts disposed through the top plate with at least one of the plurality of guide plate contacts electrically connected to at least one of the plurality of spaced electrical contacts.
摘要翻译：在一个实施例中，用于探针卡组件的模块化空间变换器包括底板，导向板和顶板。引导板被配置为安装在底板的切口中。引导板具有第一表面和第二表面，并且另外具有第一多个间隔开的电连接，设置在通过引导板形成的多个孔中，用于提供多个测试探针触点和多个引导板触点之间的电连接。顶板具有穿过顶板设置的多个间隔开的电触点，多个引导板触点中的至少一个与多个间隔开的电触点中的至少一个电连接。

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