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    • 4. 发明授权
    • Germanium photodetector
    • 锗光电探测器
    • US08614116B2
    • 2013-12-24
    • US13556597
    • 2012-07-24
    • Solomon AssefaJeehwan KimJin-Hong ParkYurii A. Vlasov
    • Solomon AssefaJeehwan KimJin-Hong ParkYurii A. Vlasov
    • H01L21/00
    • H01L31/1808H01L31/1085Y02E10/50
    • A method for forming a photodetector device includes forming an insulator layer on a substrate, forming a germanium (Ge) layer on the insulator layer and a portion of the substrate, forming a second insulator layer on the Ge layer, patterning the Ge layer, forming a capping insulator layer on the second insulator layer and a portion of the first insulator layer, heating the device to crystallize the Ge layer resulting in an single crystalline Ge layer, implanting n-type ions in the single crystalline Ge layer, heating the device to activate n-type ions in the single crystalline Ge layer, and forming electrodes electrically connected to the single crystalline n-type Ge layer.
    • 一种形成光检测器件的方法包括:在基片上形成绝缘体层,在绝缘体层和一部分基底上形成锗(Ge)层,在Ge层上形成第二绝缘层,构图Ge层,形成 在所述第二绝缘体层上的封盖绝缘体层和所述第一绝缘体层的一部分,加热所述器件以使所述Ge层结晶,得到单晶Ge层,在所述单晶Ge层中注入n型离子,将所述器件加热至 在单晶Ge层中激活n型离子,以及形成电连接到单晶n型Ge层的电极。
    • 5. 发明授权
    • Reduced S/D contact resistance of III-V MOSFET using low temperature metal-induced crystallization of n+ Ge
    • 使用n + Ge的低温金属诱导结晶降低了III-V MOSFET的S / D接触电阻
    • US08536043B2
    • 2013-09-17
    • US13017127
    • 2011-01-31
    • Jeehwan KimJin-Hong ParkDevendra SadanaKuen-Ting Shiu
    • Jeehwan KimJin-Hong ParkDevendra SadanaKuen-Ting Shiu
    • H01L21/28
    • H01L29/20H01L21/26513H01L21/28575H01L29/0847H01L29/267H01L29/41783H01L29/452H01L29/66522H01L29/66628H01L29/78
    • Embodiments of this invention provide a method to fabricate an electrical contact. The method includes providing a substrate of a compound Group III-V semiconductor material having at least one electrically conducting doped region adjacent to a surface of the substrate. The method further includes fabricating the electrical contact to the at least one electrically conducting doped region by depositing a single crystal layer of germanium over the surface of the substrate so as to at least partially overlie the at least one electrically conducting doped region, converting the single crystal layer of germanium into a layer of amorphous germanium by implanting a dopant, forming a metal layer over exposed surfaces of the amorphous germanium layer, and performing a metal-induced crystallization (MIC) process on the amorphous germanium layer having the overlying metal layer to convert the amorphous germanium layer to a crystalline germanium layer and to activate the implanted dopant. The electrical contact can be a source or a drain contact of a transistor.
    • 本发明的实施例提供一种制造电接触的方法。 该方法包括提供化合物III-V族半导体材料的衬底,其具有与衬底的表面相邻的至少一个导电掺杂区域。 该方法还包括通过在衬底的表面上沉积锗的单晶层以至少部分地覆盖在至少一个导电掺杂区域上来将至少一个导电掺杂区域的电接触制造到该至少一个导电掺杂区域, 通过注入掺杂剂,在非晶锗层的暴露表面上形成金属层,并对具有上覆金属层的非晶锗层进行金属诱导结晶(MIC)工艺,将锗的晶体层分解成无定形锗层, 将无定形锗层转化为结晶锗层并激活注入的掺杂剂。 电接触可以是晶体管的源极或漏极接触。