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    • 1. 发明授权
    • Image coding apparatus
    • 图像编码装置
    • US06298168B1
    • 2001-10-02
    • US09260089
    • 1999-03-02
    • Junji NishigakiShoji ImaizumiKenichi Morita
    • Junji NishigakiShoji ImaizumiKenichi Morita
    • G06K936
    • G06T9/00
    • In an image coding apparatus for encoding and decoding multi-level image data with block truncation coding, multi-level image data is divided into second blocks (e.g., 6*6 pixels) which is larger in size than a first block (e.g., 4*4 pixels) to be coded. Average value and gradation level amplitude are calculated on a second block, and encoding and decoding are performed on a first block by using the average value and gradation level amplitude. When a pixel not adjacent to the first block is included in an end of the image or the like in a second block, data of the actual pixels are used for the pixels having no data. Thus, deterioration of the image quality can be reduced.
    • 在利用块截断编码对多级图像数据进行编码和解码的图像编码装置中,将多级图像数据分割为比第一块大的尺寸(例如,6×6像素)的第二块(例如,6×6像素) * 4像素)进行编码。 在第二块上计算平均值和灰度级幅度,并且通过使用平均值和灰度级幅度在第一块上执行编码和解码。 当与第一块不相邻的像素被包括在第二块中的图像等的末尾时,实际像素的数据被用于没有数据的像素。 因此,可以降低图像质量的劣化。
    • 9. 发明申请
    • Probe position control system and method
    • 探头位置控制系统及方法
    • US20070272005A1
    • 2007-11-29
    • US11802624
    • 2007-05-24
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • G12B21/20G01N13/10
    • G01Q30/06G01Q70/04
    • The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the relative position of the probe and the sample due to heat or other factors during the observation or manipulation. To obtain an image of the sample surface at the atomic level or perform a certain manipulation on an atom on the sample surface, the present invention can be applied to a probe position control method for controlling the relative position of the probe and the sample while measuring an interaction between the objective atom on the sample surface and the tip of the probe. In the present method, the relative position of the probe and the sample are changed while the probe is oscillated relative to the sample in two directions parallel to the sample surface at frequencies of f1 and f2 (S1a). Meanwhile, a point (or characteristic point) where the frequencies f1 and f2 disappear from the measured value of the interaction working in the direction perpendicular to the sample surface is detected (S1b). Then, the relative movement of the probe and the sample is controlled so that the measurement value thereby detected is maintained (i.e. the characteristic point is tracked; S1c), and the speed of the aforementioned relative movement is determined (S1d). Subsequently, the relative position control is corrected using the detected speed (S2).
    • 本发明提供了一种用于消除热漂移和其它方差的影响的技术,并且通过使用该技术来校正探针的相对位置的上述变化来提高扫描探针显微镜或原子操纵器的观察或操纵精度,以及 在观察或操纵期间由于热或其他因素导致的样品。 为了获得原子级别的样品表面的图像或对样品表面上的原子进行一定的操作,本发明可以应用于用于在测量时控制探针和样品的相对位置的探针位置控制方法 样品表面上的目标原子与探针尖端之间的相互作用。 在本方法中,探针和样品的相对位置在f 1和f 2的频率下相对于样品在平行于样品表面的两个方向上振荡的同时发生变化, 2(S 1a)。 同时,检测频率f 1和f 2 2的点(或特征点)从垂直于样品表面的方向上工作的相互作用的测量值消失 (S 1b)。 然后,控制探头和样品的相对移动,使得由此检测到的测量值被维持(即跟踪特征点; S1c),并且确定上述相对移动的速度(S1d) 。 随后,使用检测速度来校正相对位置控制(S 2)。