专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20070272005A1 Probe position control system and method 有权
标题翻译：探头位置控制系统及方法
公开(公告)号：US20070272005A1
公开(公告)日：2007-11-29
申请号：US11802624
申请日：2007-05-24
申请人： Masayuki Abe , Masahiro Ota , Yoshiaki Sugimoto , Kenichi Morita , Noriaki Oyabu , Seizo Morita , Oscar Custance
发明人： Masayuki Abe , Masahiro Ota , Yoshiaki Sugimoto , Kenichi Morita , Noriaki Oyabu , Seizo Morita , Oscar Custance
IPC分类号： G12B21/20 , G01N13/10
CPC分类号： G01Q30/06 , G01Q70/04
摘要： The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the relative position of the probe and the sample due to heat or other factors during the observation or manipulation. To obtain an image of the sample surface at the atomic level or perform a certain manipulation on an atom on the sample surface, the present invention can be applied to a probe position control method for controlling the relative position of the probe and the sample while measuring an interaction between the objective atom on the sample surface and the tip of the probe. In the present method, the relative position of the probe and the sample are changed while the probe is oscillated relative to the sample in two directions parallel to the sample surface at frequencies of f1 and f2 (S1a). Meanwhile, a point (or characteristic point) where the frequencies f1 and f2 disappear from the measured value of the interaction working in the direction perpendicular to the sample surface is detected (S1b). Then, the relative movement of the probe and the sample is controlled so that the measurement value thereby detected is maintained (i.e. the characteristic point is tracked; S1c), and the speed of the aforementioned relative movement is determined (S1d). Subsequently, the relative position control is corrected using the detected speed (S2).
摘要翻译：本发明提供了一种用于消除热漂移和其它方差的影响的技术，并且通过使用该技术来校正探针的相对位置的上述变化来提高扫描探针显微镜或原子操纵器的观察或操纵精度，以及在观察或操纵期间由于热或其他因素导致的样品。为了获得原子级别的样品表面的图像或对样品表面上的原子进行一定的操作，本发明可以应用于用于在测量时控制探针和样品的相对位置的探针位置控制方法样品表面上的目标原子与探针尖端之间的相互作用。在本方法中，探针和样品的相对位置在f 1和f 2的频率下相对于样品在平行于样品表面的两个方向上振荡的同时发生变化， 2（S 1a）。同时，检测频率f 1和f 2 2的点（或特征点）从垂直于样品表面的方向上工作的相互作用的测量值消失（S 1b）。然后，控制探头和样品的相对移动，使得由此检测到的测量值被维持（即跟踪特征点; S1c），并且确定上述相对移动的速度（S1d）。随后，使用检测速度来校正相对位置控制（S 2）。

2. 发明授权

US07703314B2 Probe position control system and method 有权
标题翻译：探头位置控制系统及方法
公开(公告)号：US07703314B2
公开(公告)日：2010-04-27
申请号：US11802624
申请日：2007-05-24
申请人： Masayuki Abe , Masahiro Ota , Yoshiaki Sugimoto , Kenichi Morita , Noriaki Oyabu , Seizo Morita , Oscar Custance
发明人： Masayuki Abe , Masahiro Ota , Yoshiaki Sugimoto , Kenichi Morita , Noriaki Oyabu , Seizo Morita , Oscar Custance
IPC分类号： G01B5/28
CPC分类号： G01Q30/06 , G01Q70/04
摘要： The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the relative position of the probe and the sample due to heat or other factors during the observation or manipulation. To obtain an image of the sample surface at the atomic level or perform a certain manipulation on an atom on the sample surface, the present invention can be applied to a probe position control method for controlling the relative position of the probe and the sample while measuring an interaction between the objective atom on the sample surface and the tip of the probe. In the present method, the relative position of the probe and the sample are changed while the probe is oscillated relative to the sample in two directions parallel to the sample surface at frequencies of f1 and f2 (S1a). Meanwhile, a point (or characteristic point) where the frequencies f1 and f2 disappear from the measured value of the interaction working in the direction perpendicular to the sample surface is detected (S1b). Then, the relative movement of the probe and the sample is controlled so that the measurement value thereby detected is maintained (i.e. the characteristic point is tracked; S1c), and the speed of the aforementioned relative movement is determined (S1d). Subsequently, the relative position control is corrected using the detected speed (S2).
摘要翻译：本发明提供了一种用于消除热漂移和其它方差的影响的技术，并且通过使用该技术来校正探针的相对位置的上述变化来提高扫描探针显微镜或原子操纵器的观察或操纵精度，以及在观察或操纵期间由于热或其他因素导致的样品。为了获得原子级别的样品表面的图像或对样品表面上的原子进行一定的操作，本发明可以应用于用于在测量时控制探针和样品的相对位置的探针位置控制方法样品表面上的目标原子与探针尖端之间的相互作用。在本方法中，探针和样品的相对位置在f1和f2频率（S1a）处探针相对于样品在平行于样品表面的两个方向上振荡时改变。同时，检测频率f1和f2从与样品表面垂直的方向上工作的相互作用的测量值消失的点（或特征点）（S1b）。然后，控制探头和样本的相对运动，使得维持测量值（即跟踪特征点; S1c），并确定上述相对运动的速度（S1d）。随后，使用检测的速度来校正相对位置控制（S2）。

3. 发明授权

US07975316B2 Atomic force microscope and interaction force measurement method using atomic force microscope 有权
标题翻译：原子力显微镜和相互作用力测量方法使用原子力显微镜
公开(公告)号：US07975316B2
公开(公告)日：2011-07-05
申请号：US12523661
申请日：2008-01-07
申请人： Masahiro Ota , Noriaki Oyabu , Masayuki Abe , Oscar Custance , Yoshiaki Sugimoto , Seizo Morita
发明人： Masahiro Ota , Noriaki Oyabu , Masayuki Abe , Oscar Custance , Yoshiaki Sugimoto , Seizo Morita
IPC分类号： G01B5/28
CPC分类号： G01Q60/32 , G01Q30/04 , Y10S977/863
摘要： A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction force. Given this factor, a Δf curve on an atomic defect and a Δf curve on a target atom on the sample surface are each measured for only a relatively short range scale (S1 and S2), and a difference Δf curve of those two curves is obtained (S3). Since the difference Δf curve is derived only from a short-range interaction force, a known conversion operation is applied to this curve obtain an F curve which illustrates the relationship between the force and the distance Z, and then the short-range interaction force on the target atom is obtained from the F curve (S4). Since the range scale in measuring the Δf curve can be narrowed, the measurement time can be shortened, and since the conversion from the Δf curve into F curve is required only once, the computational time can also be shortened. Consequently, in obtaining the short-range interaction force which acts between the atom on the sample surface and the probe, the time required for the Δf curve's measurement and the computational time are shortened, which leads to accuracy improvement and throughput enhancement.
摘要翻译：通过FM-AFM获得的频移和Dgr f可以通过从远程相互作用力得到的＆Dgr; fLR和从短程相互作用力得到的＆Dgr; fSR的简单线性耦合来表示。考虑到这个因素，样品表面上的原子缺陷和目标原子上的＆Dgr; f曲线每个都只测量相对较短的范围尺度（S1和S2），并且差分Dgr f曲线得到这两条曲线（S3）。由于差值Dgr f曲线仅来自短距离相互作用力，因此将已知的转换操作应用于该曲线，获得F曲线，该F曲线说明了力与距离Z之间的关系，然后是短距离相互作用从F曲线获得目标原子上的力（S4）。由于可以缩小＆Dgr。f曲线的测量范围，所以可以缩短测量时间，由于从＆Dgr。f曲线到F曲线的转换只需要一次，所以计算时间也可以缩短。因此，在获得样品表面上的原子和探针之间作用的短程相互作用力时，缩短了＆Dgr。f曲线测量所需的时间和计算时间，从而提高了精度和提高了生产率。

4. 发明申请

US20100071099A1 ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD USING ATOMIC FORCE MICROSCOPE 有权
标题翻译：使用原子力显微镜的原子力显微镜和相互作用力测量方法
公开(公告)号：US20100071099A1
公开(公告)日：2010-03-18
申请号：US12523661
申请日：2008-01-07
申请人： Masahiro Ota , Noriaki Oyabu , Masayuki Abe , Oscar Custance , Yoshiaki Sugimoto , Seizo Morita
发明人： Masahiro Ota , Noriaki Oyabu , Masayuki Abe , Oscar Custance , Yoshiaki Sugimoto , Seizo Morita
IPC分类号： G01Q60/24
CPC分类号： G01Q60/32 , G01Q30/04 , Y10S977/863
摘要： A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction force. Given this factor, a Δf curve on an atomic defect and a Δf curve on a target atom on the sample surface are each measured for only a relatively short range scale (S1 and S2), and a difference Δf curve of those two curves is obtained (S3). Since the difference Δf curve is derived only from a short-range interaction force, a known conversion operation is applied to this curve obtain an F curve which illustrates the relationship between the force and the distance Z, and then the short-range interaction force on the target atom is obtained from the F curve (S4). Since the range scale in measuring the Δf curve can be narrowed, the measurement time can be shortened, and since the conversion from the Δf curve into F curve is required only once, the computational time can also be shortened. Consequently, in obtaining the short-range interaction force which acts between the atom on the sample surface and the probe, the time required for the Δf curve's measurement and the computational time are shortened, which leads to accuracy improvement and throughput enhancement.
摘要翻译：通过FM-AFM获得的频移和Dgr f可以通过从远程相互作用力得到的＆Dgr; fLR和从短程相互作用力得到的＆Dgr; fSR的简单线性耦合来表示。考虑到这个因素，样品表面上的原子缺陷和目标原子上的＆Dgr; f曲线每个都只测量相对较短的范围尺度（S1和S2），并且差分Dgr f曲线得到这两条曲线（S3）。由于差值Dgr f曲线仅来自短距离相互作用力，因此将已知的转换操作应用于该曲线，获得F曲线，该F曲线说明了力与距离Z之间的关系，然后是短距离相互作用从F曲线获得目标原子上的力（S4）。由于可以缩小＆Dgr。f曲线的测量范围，所以可以缩短测量时间，由于从＆Dgr。f曲线到F曲线的转换只需要一次，所以计算时间也可以缩短。因此，在获得样品表面上的原子和探针之间作用的短程相互作用力时，缩短了＆Dgr。f曲线测量所需的时间和计算时间，从而提高了精度和提高了生产率。

5. 发明授权

US08037739B2 Method for analyzing sample in liquid 有权
标题翻译：分析液体样品的方法
公开(公告)号：US08037739B2
公开(公告)日：2011-10-18
申请号：US12197108
申请日：2008-08-22
申请人： Masahiro Ota , Noriaki Oyabu , Hiroaki Adachi , Masayuki Abe , Seizo Morita , Yusuke Mori , Takatomo Sasaki
发明人： Masahiro Ota , Noriaki Oyabu , Hiroaki Adachi , Masayuki Abe , Seizo Morita , Yusuke Mori , Takatomo Sasaki
IPC分类号： G01N11/00
CPC分类号： G01Q30/14 , G01N1/36 , G02B21/33 , G02B21/34
摘要： A method for analyzing a sample in a liquid is provided, which is suitable for easily and reliably preventing a liquid for analysis from being evaporated. When the sample in the liquid is observed by using a scanning probe microscope (SPM), a sealing liquid (17) immiscible with a liquid for analysis (16) is filled around the liquid for analysis (16), in which a sample (13) and a probe (15) are immersed, so as to form a sealing state, in which the liquid for analysis (16) is isolated from an external gas. The SPM enables the probe (15) disposed on a front end of a cantilever (14) to approach a surface of the sample (13) immersed in the liquid, scans the surface of the sample, and detects an interaction between the sample (13) and the probe (15), thereby generating an image.
摘要翻译：提供一种用于分析液体中的样品的方法，其适于容易且可靠地防止用于分析的液体蒸发。当使用扫描探针显微镜（SPM）观察液体中的样品时，将用于分析的液体（16）不混溶的密封液体（17）填充在用于分析的液体（16）周围，其中样品（13 ）和探针（15），以便形成用于分析用液体（16）与外部气体隔离的密封状态。 SPM使得布置在悬臂（14）的前端上的探针（15）接近浸入液体中的样品（13）的表面，扫描样品的表面，并检测样品（13）之间的相互作用）和探头（15），从而产生图像。

6. 发明授权

US08992704B2 Aluminum plated steel sheet for rapid heating hot-stamping, production method of the same and rapid heating hot-stamping method by using this steel sheet 有权
标题翻译：用于快速加热热烫的镀铝钢板，使用该钢板的相同和快速加热热压法的制造方法
公开(公告)号：US08992704B2
公开(公告)日：2015-03-31
申请号：US12737398
申请日：2009-07-13
申请人： Jun Maki , Masayuki Abe , Kazuhisa Kusumi , Yasushi Tsukano
发明人： Jun Maki , Masayuki Abe , Kazuhisa Kusumi , Yasushi Tsukano
IPC分类号： C23C2/12 , C21D8/02 , C22C38/00 , C22C38/02 , C22C38/04 , C22C38/06 , C22C38/28 , C22C38/32 , C23C2/28 , C23C26/00 , C21D1/673
CPC分类号： C23C2/28 , C21D1/673 , C21D8/0205 , C21D8/0278 , C22C38/001 , C22C38/02 , C22C38/04 , C22C38/06 , C22C38/28 , C22C38/32 , C23C2/12 , C23C26/00
摘要： The present invention solves the problem of melting of Al in heating before hot-stamping, which had been a problem in the past in applying hot-stamping to Al-plated steel sheet, and provides Al-plated steel sheet for hot-stamping and a method of hot-stamping using that Al-plated steel sheet to solve the problem of delayed fracture due to residual hydrogen, and, furthermore, a method of a rapid heating hot-stamping using that Al-plated steel sheet.The Al-plated steel sheet of the present invention is produced by annealing the Al-plated steel sheet as coiled in a box-anneal furnace for the time and at the temperature indicated in FIG. 5, and alloying of a plated Al and a steel sheet.Further, a method of rapid heating hot-stamping in the present invention is characterized by cutting out a stamping blank of an Al-plated steel sheet, and heating that blank in heating before hot-stamping by an average temperature with a rising rate of 40° C./sec or more and a time of exposure to an environment of 700° C. or more of 20 seconds or less, and then hot-stamping it.
摘要翻译：本发明解决了在热冲压之前的加热中熔化Al的问题，这在过去对镀铝钢板进行热冲压时是一个问题，并提供用于热冲压的镀铝钢板使用该镀覆钢板的热冲压方法来解决由于残留氢而导致的延迟断裂的问题，此外，使用该镀铝钢板进行快速加热热冲压的方法。本发明的镀覆钢板是通过将钢板退火炉内的镀铝钢板退火一段时间并在图1所示的温度下进行的。 5，以及电镀铝和钢板的合金化。此外，本发明的快速加热热冲压法的特征在于，切割镀铝钢板的冲压坯料，并且在热冲压之前加热坯料以平均温度以40的上升速率加热 ℃或更高，暴露于700℃以上20秒以下的环境的时间，然后热烫。

7. 发明授权

US08945719B2 Steel plate for cold forging and process for producing same 有权
标题翻译：冷锻钢板及其制造方法
公开(公告)号：US08945719B2
公开(公告)日：2015-02-03
申请号：US13522578
申请日：2011-01-25
申请人： Masayuki Abe , Kengo Takeda , Shuji Yamamoto , Yasushi Tsukano , Shinichi Yamaguchi
发明人： Masayuki Abe , Kengo Takeda , Shuji Yamamoto , Yasushi Tsukano , Shinichi Yamaguchi
IPC分类号： B32B7/02 , C22C38/04 , C22C38/06 , C22C38/18 , C22C38/16 , C22C38/12 , C22C38/08 , C22C38/02 , C21D8/02 , C21D11/00 , C22C38/14 , C22C38/00 , C22C38/24 , C22C38/26 , C22C38/28 , C22C38/32 , C21D1/68 , C21D7/02 , C21D7/04 , C21D9/48
CPC分类号： C22C38/02 , C21D1/68 , C21D7/02 , C21D7/04 , C21D8/0263 , C21D9/48 , C21D2211/005 , C21D2211/009 , C21D2221/00 , C22C38/001 , C22C38/002 , C22C38/005 , C22C38/04 , C22C38/06 , C22C38/24 , C22C38/26 , C22C38/28 , C22C38/32 , Y10T428/12 , Y10T428/24967
摘要： This steel plate for cold forging includes a hot-rolled steel plate, wherein the hot-rolled steel plate includes: in terms of percent by mass, C: 0.13% to 0.20%; Si: 0.01% to 0.8%; Mn: 0.1% to 2.5%; P: 0.003% to 0.030%; S: 0.0001% to 0.008%; Al: 0.01% to 0.07%; N: 0.0001% to 0.02%; and O: 0.0001% to 0.0030%, with a remainder being Fe and inevitable impurities, an A value represented by the following formula (1) is in a range of 0.0080 or less, a thickness of the hot-rolled steel plate is in a range of 2 mm to 25 mm, and an area percentage of pearlite bands having lengths of 1 mm or more in a region of 4/10t to 6/10t when a plate thickness is indicated by t in a cross section of a plate thickness that is parallel to a rolling direction of the hot-rolled steel plate is in a range of not more than a K value represented by the following formula (2), A value=O%+S%+0.033Al% (1) K value=25.5×C%+4.5×Mn%−6 (2).
摘要翻译：该冷锻钢板包括热轧钢板，其中，所述热轧钢板包含：按质量％计，C：0.13〜0.20％。 Si：0.01〜0.8％ Mn：0.1〜2.5％ P：0.003％〜0.030％ S：0.0001％〜0.008％; Al：0.01〜0.07％ N：0.0001％〜0.02％; 和O：0.0001％〜0.0030％，余量为Fe和不可避免的杂质，由下式（1）表示的A值在0.0080以下的范围内，热轧钢板的厚度为范围为2mm至25mm，当板厚度以t表示的板厚度的横截面中，在4 / 10t至6 / 10t的区域中具有1mm或更大长度的珠光体带的面积百分比，平行于热轧钢板的轧制方向处于不大于由下式（2）表示的K值的范围内，A值= O％+ S％+ 0.033Al％（1）K值 = 25.5×C％+ 4.5×Mn％-6（2）。

8. 发明授权

US08220666B2 Apparatus for extracting the contents from a refill pouch 有权
标题翻译：用于从填充袋提取内容物的装置
公开(公告)号：US08220666B2
公开(公告)日：2012-07-17
申请号：US12231262
申请日：2008-08-28
申请人： Masayuki Abe
发明人： Masayuki Abe
IPC分类号： B67D7/06
CPC分类号： B65D75/56 , A47K5/1204 , B05B11/00412 , B05B11/3015 , B05B11/3032 , B05B11/3045
摘要： An apparatus for extracting the contents from a refill pouch comprises a holding member for holding the pouch with its extraction port facing downward, and a pump attached to the extraction port of the pouch. The pump has a pump body defining a housing space having an inlet opening and an outlet opening, an inlet-side valve which communicates with the extraction port to open and close the inlet opening so that the contents can be introduced into the housing space from the pouch, and an outlet-side valve to open and close the outlet opening so that the contents in the housing space can be discharged through a nozzle that communicates with the outlet-side valve. The pump wall portion is constituted by a resiliently compressible, restorable and flexible material so that the contents in the housing space can be extracted through the nozzle by manually squeezing the pump wall portion thereby pressurizing the housing space.
摘要翻译：用于从再填充袋提取内容物的装置包括：保持构件，其用于将其提取口朝下的方式保持，并且附接到袋的提取口的泵。泵具有限定具有入口开口和出口开口的容纳空间的泵体，入口侧阀与抽出口连通以打开和关闭入口开口，使得内容物可以从容纳空间引入到容纳空间中袋和出口侧阀，以打开和关闭出口开口，使得容纳空间中的内容物可以通过与出口侧阀连通的喷嘴排出。泵壁部分由弹性可压缩，可恢复和柔性的材料构成，使得通过手动挤压泵壁部分从而使壳体空间加压，能够通过喷嘴抽出容纳空间中的内容物。

9. 发明申请

US20120139889A1 IMAGE PROJECTION APPARATUS 有权
标题翻译：图像投影设备
公开(公告)号：US20120139889A1
公开(公告)日：2012-06-07
申请号：US13308924
申请日：2011-12-01
申请人： Masayuki Abe
发明人： Masayuki Abe
IPC分类号： G09G5/00 , G09G3/36
CPC分类号： G09G3/3611 , G09G3/001 , G09G3/3696 , G09G2310/06 , G09G2320/0209 , G09G2320/0242 , G09G2320/0673 , H04N9/312
摘要： An image projection apparatus is disclosed which projects an image having a good color by reducing the influence of a lateral electric field in a liquid crystal display element (LCD). The apparatus includes three LCDs, each including two opposite electrodes. As the voltage applied to a liquid crystal layer is increased, retardation provided for light in each color band is increased. A controller controls an electrode application voltage in the first LCD such that, in a white display state, a liquid crystal application voltage (LCAV) in the first LCD is lower than the LCAVs in the second and third LCDs, and such that, in a black display state, the LCAV in the first LCD is higher than the LCAVs in the second and third LCDs and has a value from 1% to 30% of the LCAV in the first LCD in the white display state.
摘要翻译：公开了一种通过减少液晶显示元件（LCD）中的横向电场的影响来投射具有良好颜色的图像的图像投影装置。该装置包括三个LCD，每个LCD包括两个相对的电极。随着施加到液晶层的电压增加，每个色带中的光的延迟增加。控制器控制第一LCD中的电极施加电压，使得在白色显示状态下，第一LCD中的液晶施加电压（LCAV）低于第二和第三LCD中的LCAV，并且在黑显示状态时，第一LCD中的LCAV高于第二和第三LCD中的LCAV，并且在白显示状态下的第一LCD中的LCAV的值为1％至30％。

10. 发明申请

US20110242454A1 REFLECTIVE LIQUID CRYSTAL DISPLAY APPARATUS 有权
标题翻译：反射液晶显示装置
公开(公告)号：US20110242454A1
公开(公告)日：2011-10-06
申请号：US13160400
申请日：2011-06-14
申请人： Masayuki Abe
发明人： Masayuki Abe
IPC分类号： G02F1/1335
CPC分类号： H04N9/315 , G02B27/283 , G02F2001/13355 , G02F2001/133638 , G02F2203/02 , H04N5/7441
摘要： At least one exemplary embodiment is directed to a reflective liquid crystal display apparatus which includes a polarization beam splitter having a polarization split film used as both a polarizer and an analyzer; a reflective liquid crystal display device; a quarter wave plate; and a projection optical system; where the absolute value of phase difference of diffracted light generated by the reflective liquid crystal display device in a black display state is reduced by the phase difference of the quarter wave plate, and thus the amount of stray light of the diffracted light guided from the polarizing beam splitter to the projection optical system decreases.
摘要翻译：至少一个示例性实施例涉及一种反射型液晶显示装置，其包括具有用作偏振器和分析器两者的偏振分束膜的偏振分束器; 反射型液晶显示装置; 四分之一波片; 和投影光学系统; 其中由黑色显示状态的反射型液晶显示装置产生的衍射光的相位差的绝对值通过四分之一波片的相位差而减小，并且因此从偏振光引导的衍射光的杂散光量投影光学系统的分束器减小。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式