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    • 2. 发明申请
    • Probe position control system and method
    • 探头位置控制系统及方法
    • US20070272005A1
    • 2007-11-29
    • US11802624
    • 2007-05-24
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • G12B21/20G01N13/10
    • G01Q30/06G01Q70/04
    • The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the relative position of the probe and the sample due to heat or other factors during the observation or manipulation. To obtain an image of the sample surface at the atomic level or perform a certain manipulation on an atom on the sample surface, the present invention can be applied to a probe position control method for controlling the relative position of the probe and the sample while measuring an interaction between the objective atom on the sample surface and the tip of the probe. In the present method, the relative position of the probe and the sample are changed while the probe is oscillated relative to the sample in two directions parallel to the sample surface at frequencies of f1 and f2 (S1a). Meanwhile, a point (or characteristic point) where the frequencies f1 and f2 disappear from the measured value of the interaction working in the direction perpendicular to the sample surface is detected (S1b). Then, the relative movement of the probe and the sample is controlled so that the measurement value thereby detected is maintained (i.e. the characteristic point is tracked; S1c), and the speed of the aforementioned relative movement is determined (S1d). Subsequently, the relative position control is corrected using the detected speed (S2).
    • 本发明提供了一种用于消除热漂移和其它方差的影响的技术,并且通过使用该技术来校正探针的相对位置的上述变化来提高扫描探针显微镜或原子操纵器的观察或操纵精度,以及 在观察或操纵期间由于热或其他因素导致的样品。 为了获得原子级别的样品表面的图像或对样品表面上的原子进行一定的操作,本发明可以应用于用于在测量时控制探针和样品的相对位置的探针位置控制方法 样品表面上的目标原子与探针尖端之间的相互作用。 在本方法中,探针和样品的相对位置在f 1和f 2的频率下相对于样品在平行于样品表面的两个方向上振荡的同时发生变化, 2(S 1a)。 同时,检测频率f 1和f 2 2的点(或特征点)从垂直于样品表面的方向上工作的相互作用的测量值消失 (S 1b)。 然后,控制探头和样品的相对移动,使得由此检测到的测量值被维持(即跟踪特征点; S1c),并且确定上述相对移动的速度(S1d) 。 随后,使用检测速度来校正相对位置控制(S 2)。
    • 4. 发明授权
    • Rocker-pin type friction gearing chain
    • 摇臂式摩擦传动链
    • US5242333A
    • 1993-09-07
    • US801448
    • 1991-12-02
    • Yoshiaki SugimotoHiroki IshidaToshihiro HosokawaNobuyuki Fujimoto
    • Yoshiaki SugimotoHiroki IshidaToshihiro HosokawaNobuyuki Fujimoto
    • F16G5/18
    • F16G5/18
    • A rocker-pin type continuously variable transmission chain having a plurality of link plates connected endlessly by rocker pins which project into pin insertion holes formed in the link plates. Each pin insertion hole defines thereon a side load transmitting surface which engages an opposed side load transmitting surface on the rocker pin. These load transmitting surfaces on the rocker pin and hole have opposed center surface portions which are maintained free of contact with one another. A pair of concave surface portions are smoothly joined directly to opposite ends of the center surface portion of the hole, and project outwardly in opposite directions therefrom. A similar pair of convex surface portions are formed on the rocker pin, and are joined to opposite ends of the center surface portion thereof and project outwardly therefrom. The concave and convex surface portions are defined generally as partial elliptic surfaces which are generated about and symmetrically disposed with respect to a major axis of an ellipse, which major axis extend centrally of the bore in the lengthwise or longitudinal direction of the link plate. The elliptically shaped concave and convex surfaces directly engagingly contact one another, and create a wedge-like configuration which prevents rotation of the rocker pin relative to the bore, and provides for uniform load transmission over the extensive surface areas defined by the contacting convex and concave surface portions.
    • 一种摇杆式无级变速传动链,其具有多个通过摇杆连接的连杆板,所述链板突出到形成在所述链板中的销插入孔中。 每个销插入孔在其上限定侧接负载传递表面,该侧负载传递表面与摇臂销上相对的侧负载传递表面接合。 摇臂销和孔上的这些载荷传递表面具有彼此不保持接触的相对的中心表面部分。 一对凹面部分被直接平滑地接合到孔的中心表面部分的相对端,并且从其向相反方向突出。 类似的一对凸面部分形成在摇杆上,并且连接到其中心表面部分的相对端并从其向外突出。 凹凸表面部分通常被定义为相对于椭圆的长轴围绕和对称设置的部分椭圆形表面,该长轴在连接板的长度方向或长度方向上居中延伸。 椭圆形的凹形和凸形表面直接接合地彼此接触,并且产生楔形构造,其防止摇杆相对于孔的旋转,并且在由接触的凸和凹部限定的广泛表面区域上提供均匀的载荷传递 表面部分。
    • 6. 发明授权
    • Frictional transmission chain
    • 摩擦传输链
    • US4643703A
    • 1987-02-17
    • US745666
    • 1985-06-17
    • Tadao YasudaToru KamioYoshiaki Sugimoto
    • Tadao YasudaToru KamioYoshiaki Sugimoto
    • F16G5/18F16G1/24
    • F16G5/18
    • Link plates are connected into a chain by means of forward and backward connecting pins in each chained link plate. Frictional blocks having slanting outer surfaces are mounted around the link plates and affixed thereto by the connecting pins projecting from the link plates into the frictional blocks. The blocks may have holding pins inserted above and below the connecting pins, whereby opposite parts of the frictional block are attached to one another, enclosing the projecting ends of the connecting pins. The opposite parts of the frictional blocks attached by the holding pins have slanting V-shaped outward-facing frictional transmittance faces, transverse to the chain run for riding in the circumferential V-groove of a pulley. The blocks also have slanting faces longitudinally along the chain run on the side of the chain to be oriented toward a pulley, and straight abutting faces on the side of the chain to be oriented away from the pulley. The frictional block pieces engage the connecting pin ends and have through holes for insertion of the holding pins.
    • 链板通过每个链接链板中的前后连接销连接到链条中。 具有倾斜外表面的摩擦块安装在链板周围,并通过从连接板突出到摩擦块中的连接销固定在其上。 这些块可以具有插入连接销的上方和下方的保持销,由此摩擦块的相对部分彼此附接,包围连接销的突出端。 由保持销附接的摩擦块的相对部分具有倾斜的V形向外的摩擦透射面,横向于在滑轮的周向V形槽中骑行的链条。 这些块体还沿链条纵向纵向地在链条的侧面上朝向皮带轮方向倾斜,并且在链条侧面上的直接邻接表面被远离皮带轮定向。 摩擦块件与连接销端接合,并具有用于插入保持销的通孔。
    • 8. 发明授权
    • Probe position control system and method
    • 探头位置控制系统及方法
    • US07703314B2
    • 2010-04-27
    • US11802624
    • 2007-05-24
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • Masayuki AbeMasahiro OtaYoshiaki SugimotoKenichi MoritaNoriaki OyabuSeizo MoritaOscar Custance
    • G01B5/28
    • G01Q30/06G01Q70/04
    • The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the relative position of the probe and the sample due to heat or other factors during the observation or manipulation. To obtain an image of the sample surface at the atomic level or perform a certain manipulation on an atom on the sample surface, the present invention can be applied to a probe position control method for controlling the relative position of the probe and the sample while measuring an interaction between the objective atom on the sample surface and the tip of the probe. In the present method, the relative position of the probe and the sample are changed while the probe is oscillated relative to the sample in two directions parallel to the sample surface at frequencies of f1 and f2 (S1a). Meanwhile, a point (or characteristic point) where the frequencies f1 and f2 disappear from the measured value of the interaction working in the direction perpendicular to the sample surface is detected (S1b). Then, the relative movement of the probe and the sample is controlled so that the measurement value thereby detected is maintained (i.e. the characteristic point is tracked; S1c), and the speed of the aforementioned relative movement is determined (S1d). Subsequently, the relative position control is corrected using the detected speed (S2).
    • 本发明提供了一种用于消除热漂移和其它方差的影响的技术,并且通过使用该技术来校正探针的相对位置的上述变化来提高扫描探针显微镜或原子操纵器的观察或操纵精度,以及 在观察或操纵期间由于热或其他因素导致的样品。 为了获得原子级别的样品表面的图像或对样品表面上的原子进行一定的操作,本发明可以应用于用于在测量时控制探针和样品的相对位置的探针位置控制方法 样品表面上的目标原子与探针尖端之间的相互作用。 在本方法中,探针和样品的相对位置在f1和f2频率(S1a)处探针相对于样品在平行于样品表面的两个方向上振荡时改变。 同时,检测频率f1和f2从与样品表面垂直的方向上工作的相互作用的测量值消失的点(或特征点)(S1b)。 然后,控制探头和样本的相对运动,使得维持测量值(即跟踪特征点; S1c),并确定上述相对运动的速度(S1d)。 随后,使用检测的速度来校正相对位置控制(S2)。
    • 9. 发明申请
    • ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD USING ATOMIC FORCE MICROSCOPE
    • 使用原子力显微镜的原子力显微镜和相互作用力测量方法
    • US20100071099A1
    • 2010-03-18
    • US12523661
    • 2008-01-07
    • Masahiro OtaNoriaki OyabuMasayuki AbeOscar CustanceYoshiaki SugimotoSeizo Morita
    • Masahiro OtaNoriaki OyabuMasayuki AbeOscar CustanceYoshiaki SugimotoSeizo Morita
    • G01Q60/24
    • G01Q60/32G01Q30/04Y10S977/863
    • A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction force. Given this factor, a Δf curve on an atomic defect and a Δf curve on a target atom on the sample surface are each measured for only a relatively short range scale (S1 and S2), and a difference Δf curve of those two curves is obtained (S3). Since the difference Δf curve is derived only from a short-range interaction force, a known conversion operation is applied to this curve obtain an F curve which illustrates the relationship between the force and the distance Z, and then the short-range interaction force on the target atom is obtained from the F curve (S4). Since the range scale in measuring the Δf curve can be narrowed, the measurement time can be shortened, and since the conversion from the Δf curve into F curve is required only once, the computational time can also be shortened. Consequently, in obtaining the short-range interaction force which acts between the atom on the sample surface and the probe, the time required for the Δf curve's measurement and the computational time are shortened, which leads to accuracy improvement and throughput enhancement.
    • 通过FM-AFM获得的频移和Dgr f可以通过从远程相互作用力得到的&Dgr; fLR和从短程相互作用力得到的&Dgr; fSR的简单线性耦合来表示。 考虑到这个因素,样品表面上的原子缺陷和目标原子上的&Dgr; f曲线每个都只测量相对较短的范围尺度(S1和S2),并且差分Dgr f曲线 得到这两条曲线(S3)。 由于差值Dgr f曲线仅来自短距离相互作用力,因此将已知的转换操作应用于该曲线,获得F曲线,该F曲线说明了力与距离Z之间的关系,然后是短距离相互作用 从F曲线获得目标原子上的力(S4)。 由于可以缩小&Dgr。f曲线的测量范围,所以可以缩短测量时间,由于从&Dgr。f曲线到F曲线的转换只需要一次,所以计算时间也可以缩短。 因此,在获得样品表面上的原子和探针之间作用的短程相互作用力时,缩短了&Dgr。f曲线测量所需的时间和计算时间,从而提高了精度和提高了生产率。
    • 10. 发明授权
    • Friction plate for CVT chain
    • CVT链条摩擦片
    • US4917658A
    • 1990-04-17
    • US375606
    • 1989-07-05
    • Yoshiaki SugimotoToshihiro HosokawaYutaka UchiumiShuji SasamotoNobuyuki Fujimoto
    • Yoshiaki SugimotoToshihiro HosokawaYutaka UchiumiShuji SasamotoNobuyuki Fujimoto
    • F16G5/18
    • F16G5/18
    • An improved friction drive chain especially for a continuously variable transmission has a plurality of friction plates, each of the friction plates being substantially I-shaped in lateral section. The friction plates are arranged adjacent one another and connected by connecting link elements received in recesses formed in both lateral sides of the friction plates between upper and lower beam members of said friction plates. The connecting link elements are laterally grooved to bear longitudinally against the friction plates. The outer surfaces of the lower beam members of the plates define friction drive surfaces for contact with driving and/or driven pulleys. The friction plates are heat treated to increase strength, for example by quenching and annealing. The friction drive surfaces are formed with hardened layers by surface hardening treatment such as by electron beam or laser.
    • 特别是用于无级变速器的改进的摩擦传动链具有多个摩擦板,每个摩擦片在横截面上基本上为I形。 摩擦板彼此相邻布置并且通过连接在所述摩擦板的上梁和下梁构件之间的形成在摩擦板的两侧的凹部中的连接元件连接。 连接连接元件是横向开槽的,以便纵向承受摩擦板。 板的下梁构件的外表面限定用于与驱动和/或从动滑轮接触的摩擦驱动表面。 摩擦板经过热处理以增加强度,例如通过淬火和退火。 摩擦传动表面通过诸如电子束或激光的表面硬化处理由硬化层形成。