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    • 5. 发明授权
    • Manufacturing methods and construction for integrated circuit packages
    • 集成电路封装的制造方法和结构
    • US06362530B1
    • 2002-03-26
    • US09056074
    • 1998-04-06
    • Shaw Wei LeeHem P. Takiar
    • Shaw Wei LeeHem P. Takiar
    • H01L2348
    • H01L23/49816H01L23/057H01L23/3675H01L2224/16H01L2224/16225H01L2224/32225H01L2224/32245H01L2224/73204H01L2224/73253H01L2924/00014H01L2924/15153H01L2924/1517H01L2924/15311H01L2924/1532H01L2924/16152H01L2924/16195H01L2924/16251H01L2924/3025H01L2924/00H01L2224/0401
    • A method of forming an integrated circuit package includes providing a flip chip integrating circuit die having a first plurality of contacts for electrically connecting the die to other elements. A second plurality of contacts for electrically connecting the integrated circuit package to external elements is also provided. A substrate for supporting the flip chip die and the second plurality of contacts is initially prepared. The substrate includes a connecting arrangement for electrically connecting the first plurality of contacts on the die to the second plurality of contacts. The method includes the step positioning the flip chip integrated circuit die and the second plurality of contacts on the substrate. With the flip chip die and the second plurality of contacts in position, both the first plurality of contacts on the flip chip die and the second plurality of contacts are simultaneously attached to the substrate thereby electrically connecting the die and the second plurality of contacts to the substrate. In one embodiment, a metal cap is attached to the integrated circuit package to cover and protect the die. In this embodiment, the metal cap may be used to provide a direct thermal path from the die to the external element to which the integrated circuit package is to the connected. An additional heat sink may also be attached to the package.
    • 形成集成电路封装的方法包括提供具有第一多个触点的倒装芯片集成电路管芯,用于将管芯电连接到其它元件。 还提供了用于将集成电路封装电连接到外部元件的第二多个触点。 最初准备了用于支撑倒装芯片模具和第二多个触点的基板。 基板包括用于将模具上的第一多个触点电连接到第二多个触点的连接装置。 该方法包括将倒装芯片集成电路管芯和第二多个触点定位在衬底上的步骤。 通过倒装晶片管芯和第二组触头就位,倒装晶片管芯上的第一个多个触点和第二个多个触头都同时附着在基板上,从而将管芯和第二个多个触头电连接到 基质。 在一个实施例中,金属盖连接到集成电路封装以覆盖和保护管芯。 在该实施例中,金属盖可用于提供从模具到集成电路封装件所连接的外部元件的直接热路径。 附加的散热器也可以附接到包装上。
    • 8. 发明授权
    • Apparatus and method for packaging image sensing semiconductor chips
    • 用于封装图像感测半导体芯片的装置和方法
    • US07205095B1
    • 2007-04-17
    • US10666921
    • 2003-09-17
    • Ashok PrabhuShaw Wei Lee
    • Ashok PrabhuShaw Wei Lee
    • G03C5/00H01L31/0203
    • H01L31/0203H01L27/14618H01L27/14632H01L27/14687H01L2924/0002H01L2924/00
    • An method and apparatus for fabricating a die having imaging circuitry and fabricating a lid having a transparent region and support regions having a predetermined height. The lid is fabricated by applying a photo-sensitive adhesive layer with a thickness substantially equal to the predetermined height to a transparent plate and patterning the photo-sensitive adhesive layer to form the transparent region and the support regions. Once fabrication of the lid is complete, it is mounted directly onto the die so that the transparent region generally covers the imaging circuitry. The resulting apparatus includes a lid mounted directly onto the die with the transparent region generally positioned above the imaging circuitry. A gap, having a height dimension substantially equal to the predetermined height of the support regions of the lid, is spaced between the transparent region of the lid and the imaging circuitry on the die.
    • 一种用于制造具有成像电路并具有透明区域的盖子和具有预定高度的支撑区域的模具的方法和装置。 通过将具有基本上等于预定高度的厚度的光敏粘合剂层施加到透明板并图案化光敏粘合剂层以形成透明区域和支撑区域来制造盖。 一旦盖的制造完成,就将其直接安装在模具上,使得透明区域通常覆盖成像电路。 所得到的装置包括直接安装在模具上的盖,透明区域通常位于成像电路的上方。 具有基本上等于盖的支撑区域的预定高度的高度尺寸的间隙在盖的透明区域和模具上的成像电路之间间隔开。
    • 9. 发明授权
    • Known good die test apparatus and method
    • 已知的好的模具试验装置和方法
    • US5686842A
    • 1997-11-11
    • US521619
    • 1995-08-31
    • Shaw Wei Lee
    • Shaw Wei Lee
    • G01R1/073
    • G01R1/07357
    • An apparatus and method for testing an integrated circuit chip prior to mounting on a package including a non-conductive tape upon which are formed a plurality of contacts arranged in a pattern matching the arrangement of bonding pads of an integrated circuit, and a z-axis conductor placed over the conductive tape. The target chip is placed on the z-axis conductor and test signals are transmitted between the contacts on the tape and the bonding pads of the integrated circuit through conductors embedded in the z-axis conductor. In one embodiment, a glass or ceramic plate including openings, arranged in the same pattern as the bonding pads, is placed between the integrated circuit and the z-axis conductor to prevent damage to the integrated circuit.
    • 一种用于在安装在包括非导电胶带的包装上的集成电路芯片测试的装置和方法,在该封装上形成多个以与集成电路的接合焊盘的布置匹配的图案布置的触点,以及z轴 导体放置在导电胶带上。 目标芯片放置在z轴导体上,测试信号通过嵌入在z轴导体中的导体在磁带上的触点和集成电路的焊盘之间传输。 在一个实施例中,包括以与接合焊盘相同的图案的开口的玻璃或陶瓷板被放置在集成电路和z轴导体之间,以防止对集成电路的损坏。