专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07129821B2 Communication systems and methods using microelectronics power distribution network 失效
标题翻译：通信系统和方法采用微电子配电网络
公开(公告)号：US07129821B2
公开(公告)日：2006-10-31
申请号：US10711082
申请日：2004-08-20
申请人： Serafino Bueti , Adam J. Courchesne , Kai D. Feng , Kenneth J. Goodnow , Gregory J. Mann , Scott T. Vento
发明人： Serafino Bueti , Adam J. Courchesne , Kai D. Feng , Kenneth J. Goodnow , Gregory J. Mann , Scott T. Vento
IPC分类号： G05B11/01
CPC分类号： H04B3/54 , H04B2203/5416
摘要： A communication system, which includes a microelectronics chip including a power distribution network; a transmitter operatively configured to generate a communication signal and provide the communication signal to the power distribution network; and a receiver operatively configured to receive the communication signal from the power distribution network. A method is also provided for transmitting a communication signal via a power distribution network of a microelectronics chip.
摘要翻译：一种通信系统，其包括具有配电网络的微电子芯片; 发射机，可操作地配置为产生通信信号并将所述通信信号提供给所述配电网络; 以及可操作地配置为从所述配电网接收所述通信信号的接收器。还提供了一种通过微电子芯片的配电网传送通信信号的方法。

2. 发明授权

US07275011B2 Method and apparatus for monitoring integrated circuit temperature through deterministic path delays 失效
标题翻译：通过确定性路径延迟监测集成电路温度的方法和装置
公开(公告)号：US07275011B2
公开(公告)日：2007-09-25
申请号：US11160601
申请日：2005-06-30
申请人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
发明人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
IPC分类号： G01K7/01
CPC分类号： G01K3/14 , G01K3/10
摘要： An apparatus for monitoring the temperature of an integrated circuit device includes a conductive wiring pattern formed on the integrated circuit device, extending into areas of the device to be monitored. A deterministic signal source is configured to generate a deterministic signal along the conductive wiring pattern, with one or more return paths tapped from selected locations along the pattern. A temperature change determination circuit is coupled to the one or more return paths and to a reference signal taken from the deterministic signal source. The circuit is configured to determine a delay between the reference signal and a delay signal traveling through at least a portion of the wiring pattern and a corresponding one of the return paths.
摘要翻译：用于监测集成电路器件的温度的装置包括形成在集成电路器件上的导电布线图形，延伸到待监视器件的区域中。确定性信号源被配置为沿着导电布线图形生成确定性信号，其中从沿着图案的选定位置抽头的一个或多个返回路径。温度变化确定电路耦合到一个或多个返回路径以及从确定性信号源获取的参考信号。该电路被配置为确定参考信号和穿过布线图案的至少一部分和相应的一个返回路径的延迟信号之间的延迟。

3. 发明申请

US20080215945A1 System and method for system-on-chip interconnect verification 有权
标题翻译：系统级芯片互连验证的系统和方法
公开(公告)号：US20080215945A1
公开(公告)日：2008-09-04
申请号：US11819748
申请日：2007-06-28
申请人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
发明人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
IPC分类号： G01R31/3177 , G06F13/00 , G06F11/25
CPC分类号： G06F11/261 , G01R31/31717 , G01R31/318513 , G06F11/2236 , G06F17/5022
摘要： A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.
摘要翻译：一种用于验证片上系统互连的系统和方法包括：第一线性反馈移位寄存器，其耦合到第一片上系统分量的输出接口;第二线性反馈移位寄存器，其在第二片上系统组件以及耦合到第二线性反馈移位寄存器和第二片上系统的输入接口的比较器。另一种验证方法包括使用第一线性反馈移位寄存器和第二线性反馈移位寄存器使用相同的第一初始状态来产生伪随机数序列，并且将第一线性反馈移位寄存器的输出与第二线性反馈移位寄存器的输出进行比较线性反馈移位寄存器和报告错误比较。

4. 发明授权

US07308668B2 Apparatus and method for implementing an integrated circuit IP core library architecture 有权
标题翻译：用于实现集成电路IP核心库架构的装置和方法
公开(公告)号：US07308668B2
公开(公告)日：2007-12-11
申请号：US11160609
申请日：2005-06-30
申请人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Stanley B. Stanski
发明人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Stanley B. Stanski
IPC分类号： G06F17/50 , G06F9/45
CPC分类号： G06F17/5045
摘要： An integrated circuit (IC) architecture includes a library of intellectual property (IP) cores configured to provide a plurality of individual circuit functions. The IP cores arranged in a manner compatible with a customized, functional selection of individual ones of the IP cores, wherein individually selected cores are accessible through a communication structure included within the library.
摘要翻译：集成电路（IC）架构包括被配置为提供多个单独电路功能的知识产权（IP）核心库。所述IP核以与所述IP核中的各个IP核的定制功能选择相兼容的方式布置，其中通过包括在所述库内的通信结构来访问单独选择的核。

5. 发明授权

US07313738B2 System and method for system-on-chip interconnect verification 失效
标题翻译：系统级芯片互连验证的系统和方法
公开(公告)号：US07313738B2
公开(公告)日：2007-12-25
申请号：US10906388
申请日：2005-02-17
申请人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
发明人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
IPC分类号： G01R31/28
CPC分类号： G06F11/261 , G01R31/31717 , G01R31/318513 , G06F11/2236 , G06F17/5022
摘要： A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.
摘要翻译：一种用于验证片上系统互连的系统和方法包括：第一线性反馈移位寄存器，其耦合到第一片上系统分量的输出接口;第二线性反馈移位寄存器，其在第二片上系统组件以及耦合到第二线性反馈移位寄存器和第二片上系统的输入接口的比较器。另一种验证方法包括使用第一线性反馈移位寄存器和第二线性反馈移位寄存器使用相同的第一初始状态来产生伪随机数序列，并且将第一线性反馈移位寄存器的输出与第二线性反馈移位寄存器的输出进行比较线性反馈移位寄存器和报告错误比较。

6. 发明授权

US07865789B2 System and method for system-on-chip interconnect verification 有权
标题翻译：系统级芯片互连验证的系统和方法
公开(公告)号：US07865789B2
公开(公告)日：2011-01-04
申请号：US11819748
申请日：2007-06-28
申请人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
发明人： Serafino Bueti , Adam Courchesne , Kenneth J. Goodnow , Gregory J. Mann , Jason M. Norman , Stanley B. Stanski , Scott T. Vento
IPC分类号： G01R31/28
CPC分类号： G06F11/261 , G01R31/31717 , G01R31/318513 , G06F11/2236 , G06F17/5022
摘要： A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.
摘要翻译：一种用于验证片上系统互连的系统和方法包括：第一线性反馈移位寄存器，其耦合到第一片上系统分量的输出接口;第二线性反馈移位寄存器，其在第二片上系统组件以及耦合到第二线性反馈移位寄存器和第二片上系统的输入接口的比较器。另一种验证方法包括使用第一线性反馈移位寄存器和第二线性反馈移位寄存器使用相同的第一初始状态来产生伪随机数序列，并且将第一线性反馈移位寄存器的输出与第二线性反馈移位寄存器的输出进行比较线性反馈移位寄存器和报告错误比较。

7. 发明申请

US20090094566A1 DESIGN STRUCTURE FOR CHIP IDENTIFICATION SYSTEM 审中-公开
标题翻译：芯片识别系统设计结构
公开(公告)号：US20090094566A1
公开(公告)日：2009-04-09
申请号：US12105883
申请日：2008-04-18
申请人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Todd E. Leonard , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
发明人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Todd E. Leonard , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
IPC分类号： G06F17/50
CPC分类号： G06K19/067
摘要： Disclosed is a design structure for an on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors. In each embodiment the resulting pattern of shorts and opens, can be used as an on-chip identifier or private key.
摘要翻译：公开了用于片上识别电路的设计结构。在一个实施例中，在一个或多个金属化层内形成导体对（例如，金属焊盘，通孔，线）。每对中的导体之间的距离是预先确定的，因此，在已知的跨越芯片线的变化中，存在短路的随机机会（即，大约50/50的几率）。在另一个实施例中，不同的掩模形成第一导体（例如，由变化的距离分隔并具有不同宽度的金属线）和第二导体（例如，通过变化的距离分开并具有相等宽度的金属通孔）。第一和第二导体在芯片之间交替。由于第一导体的分离距离和宽度不同，第二导体的不同间隔距离和随机掩模对准变化，每个第一导体可以短至多达两个第二导体。在每个实施例中，所得到的短路和开路模式可用作片上标识符或私钥。

8. 发明授权

US08291357B2 On-chip identification circuit incorporating pairs of conductors, each having an essentially random chance of being shorted together as a result of process variations 有权
标题翻译：集成了导体对的片上识别电路，每个导体具有由于工艺变化而基本上随机的短路的机会
公开(公告)号：US08291357B2
公开(公告)日：2012-10-16
申请号：US11869179
申请日：2007-10-09
申请人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Todd E. Leonard , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
发明人： Serafino Bueti , Adam J. Courchesne , Kenneth J. Goodnow , Todd E. Leonard , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
IPC分类号： G06F9/45
CPC分类号： H01L23/544 , H01L23/5286 , H01L2223/5444 , H01L2924/0002 , H01L2924/14 , H01L2924/19043 , H01L2924/00
摘要： Disclosed are embodiments of on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors. In each embodiment the resulting pattern of shorts and opens, can be used as an on-chip identifier or private key.
摘要翻译：公开了片上识别电路的实施例。在一个实施例中，在一个或多个金属化层内形成导体对（例如，金属焊盘，通孔，线）。每对中的导体之间的距离是预先确定的，因此，在已知的跨越芯片线的变化中，存在短路的随机机会（即，大约50/50的几率）。在另一个实施例中，不同的掩模形成第一导体（例如，由变化的距离分隔并具有不同宽度的金属线）和第二导体（例如，通过变化的距离分开并具有相等宽度的金属通孔）。第一和第二导体在芯片之间交替。由于第一导体的分离距离和宽度不同，第二导体的不同间隔距离和随机掩模对准变化，每个第一导体可以短至多达两个第二导体。在每个实施例中，所得到的短路和开路模式可用作片上标识符或私钥。

9. 发明申请

US20090044054A1 DYNAMIC CRITICAL PATH DETECTOR FOR DIGITAL LOGIC CIRCUIT PATHS 有权
标题翻译： DIGITAL LOGIC CIRCUIT PATHS的动态关键路径探测器
公开(公告)号：US20090044054A1
公开(公告)日：2009-02-12
申请号：US11834110
申请日：2007-08-06
申请人： Serafino Bueti , Kenneth J. Goodnow , Todd E. Leonard , Gregory J. Mann , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
发明人： Serafino Bueti , Kenneth J. Goodnow , Todd E. Leonard , Gregory J. Mann , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
IPC分类号： G01R31/28
CPC分类号： G06F17/5031 , G01R31/3187 , G06F11/1608 , G06F11/1695 , G06F2217/84
摘要： Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path.
摘要翻译：用于校正集成电路中的定时故障的方法和用于监视集成电路的装置。该方法包括将第一和第二闩锁放置在关键路径附近。第一锁存器具有包括关键路径上的数据值的输入。该方法还包括从数据值产生延迟的数据值，将延迟的数据值锁存在第二锁存器中，将数据值与延迟的数据值进行比较，以确定关键路径是否包括定时失败状态，以及执行预定的校正衡量关键路径。

10. 发明授权

US07941772B2 Dynamic critical path detector for digital logic circuit paths 有权
标题翻译：用于数字逻辑电路路径的动态关键路径检测器
公开(公告)号：US07941772B2
公开(公告)日：2011-05-10
申请号：US11834110
申请日：2007-08-06
申请人： Serafino Bueti , Kenneth J. Goodnow , Todd E. Leonard , Gregory J. Mann , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
发明人： Serafino Bueti , Kenneth J. Goodnow , Todd E. Leonard , Gregory J. Mann , Peter A. Sandon , Peter A. Twombly , Charles S. Woodruff
IPC分类号： G06F17/50
CPC分类号： G06F17/5031 , G01R31/3187 , G06F11/1608 , G06F11/1695 , G06F2217/84
摘要： Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path.
摘要翻译：用于校正集成电路中的定时故障的方法和用于监视集成电路的装置。该方法包括将第一和第二闩锁放置在关键路径附近。第一锁存器具有包括关键路径上的数据值的输入。该方法还包括从数据值产生延迟的数据值，将延迟的数据值锁存在第二锁存器中，将数据值与延迟的数据值进行比较，以确定关键路径是否包括定时失败状况，以及执行预定的校正衡量关键路径。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式