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1. 发明申请

US20070196530A1 Controller of injection molding machine 有权
标题翻译：注塑机控制器
公开(公告)号：US20070196530A1
公开(公告)日：2007-08-23
申请号：US11709213
申请日：2007-02-22
申请人： Wataru Shiraishi , Toshio Ishikuro , Satoshi Takatsugi , Tatsuhiro Uchiyama , Hiroshi Watanabe , Tatsuya Kawasaki , Junpei Maruyama
发明人： Wataru Shiraishi , Toshio Ishikuro , Satoshi Takatsugi , Tatsuhiro Uchiyama , Hiroshi Watanabe , Tatsuya Kawasaki , Junpei Maruyama
IPC分类号： B29C45/76 , B29C45/77
CPC分类号： B29C45/50 , B29C45/54 , B29C45/76 , B29C2045/5096 , B29C2945/76856
摘要： A controller for an injection molding machine capable of reducing an extension of a cycle time in a screw retreat process after the end of measurement, obtaining a more accurate and uniform measured resin amount, and determining measurement conditions in a short period of time. After the measurement is finished, the screw is stopped from rotating and retreated at a first speed V1. The screw is reversely rotated at a predetermined speed Rv in a set zone. As this is done, the screw is retreated at a second speed V2 lower than the first speed V1. After the reverse rotation zone is terminated, the screw is stopped from rotating and retreated at a third speed V3 to a set retreat stop position. By doing this, the cycle time can be made shorter than in the case where the retreat and reverse rotation of the screw are performed separately. Since the retreating speed of the screw is low while the screw is being reversely rotated, a sudden pressure change can be suppressed, so that precise measurement can be made. Since conditions for the reverse rotation and retreat of the screw can be regulated independently, they can be adjusted to optimum conditions in a short period of time.
摘要翻译：一种用于注射成型机的控制器，其能够在测量结束后减少螺杆后退过程中的循环时间的延长，获得更精确和均匀的测量树脂量，并在短时间内确定测量条件。测量结束后，以第一速度V 1停止螺杆旋转和退回。螺钉以设定区域中的预定速度Rv反向旋转。这样做，螺杆以比第一速度V 1低的第二速度V 2退避。在反向旋转区域终止之后，螺丝停止旋转并以第三速度V 3退回到设定的退避停止位置。通过这样做，循环时间可以比在单独进行螺杆的后退和反向旋转的情况下更短。由于当螺杆反向旋转时螺杆的后退速度低，所以可以抑制突然的压力变化，从而能够进行精确的测量。由于可以独立地调节螺杆的反转和后退的条件，所以可以在短时间内将其调节到最佳状态。

2. 发明授权

US07452198B2 Controller of injection molding machine 有权
标题翻译：注塑机控制器
公开(公告)号：US07452198B2
公开(公告)日：2008-11-18
申请号：US11709213
申请日：2007-02-22
申请人： Wataru Shiraishi , Toshio Ishikuro , Satoshi Takatsugi , Tatsuhiro Uchiyama , Hiroshi Watanabe , Tatsuya Kawasaki , Junpei Maruyama
发明人： Wataru Shiraishi , Toshio Ishikuro , Satoshi Takatsugi , Tatsuhiro Uchiyama , Hiroshi Watanabe , Tatsuya Kawasaki , Junpei Maruyama
IPC分类号： B29C45/77
CPC分类号： B29C45/50 , B29C45/54 , B29C45/76 , B29C2045/5096 , B29C2945/76856
摘要： A controller for an injection molding machine capable of reducing an extension of a cycle time in a screw retreat process after the end of measurement, obtaining a more accurate and uniform measured resin amount, and determining measurement conditions in a short period of time. After the measurement is finished, the screw is stopped from rotating and retreated at a first speed V1. The screw is reversely rotated at a predetermined speed Rv in a set zone. As this is done, the screw is retreated at a second speed V2 lower than the first speed V1. After the reverse rotation zone is terminated, the screw is stopped from rotating and retreated at a third speed V3 to a set retreat stop position. By doing this, the cycle time can be made shorter than in the case where the retreat and reverse rotation of the screw are performed separately. Since the retreating speed of the screw is low while the screw is being reversely rotated, a sudden pressure change can be suppressed, so that precise measurement can be made. Since conditions for the reverse rotation and retreat of the screw can be regulated independently, they can be adjusted to optimum conditions in a short period of time.
摘要翻译：一种用于注射成型机的控制器，其能够在测量结束后减少螺杆后退过程中的循环时间的延长，获得更精确和均匀的测量树脂量，并在短时间内确定测量条件。测量结束后，以第一速度V 1停止螺杆旋转和退回。螺钉以设定区域中的预定速度Rv反向旋转。这样做，螺杆以比第一速度V 1低的第二速度V 2退避。在反向旋转区域终止之后，螺丝停止旋转并以第三速度V 3退回到设定的退避停止位置。通过这样做，循环时间可以比在单独进行螺杆的后退和反向旋转的情况下更短。由于当螺杆反向旋转时螺杆的后退速度低，所以可以抑制突然的压力变化，从而能够进行精确的测量。由于可以独立地调节螺杆的反转和后退的条件，所以可以在短时间内将其调节到最佳状态。

3. 发明授权

US07125232B2 Controller of injection molding machine 失效
标题翻译：注塑机控制器
公开(公告)号：US07125232B2
公开(公告)日：2006-10-24
申请号：US10697869
申请日：2003-10-31
申请人： Hiroshi Watanabe , Tatsuhiro Uchiyama , Wataru Shiraishi , Satoshi Takatsugi
发明人： Hiroshi Watanabe , Tatsuhiro Uchiyama , Wataru Shiraishi , Satoshi Takatsugi
IPC分类号： B29C45/77
CPC分类号： B29C45/76 , B29C45/77 , B29C2945/76006 , B29C2945/7602 , B29C2945/76066 , B29C2945/76083 , B29C2945/7612 , B29C2945/76187 , B29C2945/76498 , B29C2945/76551 , B29C2945/76568 , B29C2945/76605 , B29C2945/76665 , B29C2945/76765 , B29C2945/76846
摘要： A screw is rotated at a set speed and retreated by performing back pressure control for keeping a resin pressure at a set pressure. When the retreat position of the screw reaches a change point set nearby a set metering completion position, the back pressure control for keeping the resin pressure at a set resin pressure is stopped. A command for positioning the screw at a metering completion position is output to position the screw at the metering completion position. At the same time, when a screw position reaches the change point, the screw is reversed by a set value at a set speed.
摘要翻译：螺杆以设定的速度旋转并通过执行用于将树脂压力保持在设定压力的背压控制而退回。当螺杆的退避位置到达设定的计量完成位置附近的变化点时，将树脂压力保持在设定的树脂压力的背压控制停止。输出用于将螺钉定位在计量完成位置的命令，以将螺钉定位在计量完成位置。同时，当螺钉位置到达变化点时，螺杆以设定的速度反转设定值。

4. 发明授权

US06328551B1 Excessive load detecting device for an injection screw of an injection molding machine 有权
标题翻译：注射成型机的注射螺杆的过载检测装置
公开(公告)号：US06328551B1
公开(公告)日：2001-12-11
申请号：US09662335
申请日：2000-09-14
申请人： Satoshi Takatsugi , Hiroshi Watanabe , Wataru Shiraishi
发明人： Satoshi Takatsugi , Hiroshi Watanabe , Wataru Shiraishi
IPC分类号： B29C4577
CPC分类号： B29C45/84
摘要： An excessive load detection device for an injection molding machine capable of detecting an excessive load exerted on the injection screw when the screw is driven with resin remaining unmolten in the heating cylinder. An output torque of the servomotor for axially moving the screw is limited to a predetermined value by a torque limiter and the screw is driven to move forward in a direction of injection by a predetermined amount at a predetermined velocity. If reference time elapses before the axial motion of the set amount is completed or a position deviation exceeds a reference value, it is determined that the remaining resin has low fluidity to cause an excessive load on the screw and an alarm is issued. When the axial motion of the screw is completed without an alarm, the screw is moved backward and forward alternately predetermined times. A servomotor for rotating the screw is driven in the same manner to detect an excessive load on the screw. Since the excessive load on the screw is directly detected, the excessive load is securely detected.
摘要翻译：一种用于注射成型机的过度负载检测装置，其能够检测当在加热缸中树脂保持不熔的情况下驱动螺杆时施加在注射螺杆上的过大的负荷。用于轴向移动螺杆的伺服电动机的输出转矩通过扭矩限制器被限制在预定值，并且螺杆被驱动以在预定方向上以预定速度在注射方向上向前移动预定量。如果在设定量的轴向运动完成或位置偏差超过参考值之前经过参考时间，则确定剩余树脂具有低流动性，从而导致螺钉上的过大负载并发出报警。当螺杆的轴向运动在没有报警的情况下完成时，螺杆被交替地向前和向前移动预定时间。用于旋转螺钉的伺服电动机以相同的方式被驱动以检测螺杆上的过大负载。由于直接检测到螺钉上的过大负载，因此能够可靠地检测过载。

5. 发明授权

US11354476B2 Simulation method of an electron device 有权
公开(公告)号：US11354476B2
公开(公告)日：2022-06-07
申请号：US16682187
申请日：2019-11-13
申请人： Hiroshi Watanabe
发明人： Nobuyuki Sano , Hiroshi Watanabe , Chih-Wei Yao
IPC分类号： G06F17/10 , G06F30/367 , G06F111/08
摘要： There is a significant precaution when performing random dopant fluctuation by using the drift-diffusion model that is the basis of the conventional device simulation. Because the continuation by a long wavelength approximation was done to derive said drift-diffusion model. That is how to recover the location dependence of discrete impurity ions in the long wavelength approximation. For example, in the case that there is an impurity ion near to the interface to an insulating film, the charge density of an impurity ion, which was made continuous in the conventional method, is unable to catch the charge density change due to polarization at the interface. Because this polarization is dependent of the location of a discrete impurity ion near to the interface.
A method for simply implementing the effect of polarization to the device simulation is provided by appending an image charge inside the insulating film to linearize the charge of discrete impurity ion which locates near to the interface to satisfy the consistency to the drift-diffusion model while keeping the location dependency of the discrete ion.

6. 发明授权

US10785022B2 Network without abuse of a private key 有权
公开(公告)号：US10785022B2
公开(公告)日：2020-09-22
申请号：US15700280
申请日：2017-09-11
申请人： Hiroshi Watanabe
发明人： Hiroshi Watanabe , Te-Chang Tseng , Yukihiro Nagai , Riichiro Shirota
IPC分类号： H04L9/08 , G06Q20/38 , G06F7/58 , H04L9/32 , G06Q20/36 , G06F21/60 , G06F21/73 , G06F21/44
摘要： A network includes a logical network and a physical network. The logical network includes a plurality of logical nodes. Each logical node is connected to a respective identification core. Each identification core includes at least one semiconductor chip having a physical randomness. Each semiconductor chip generates one of a plurality of pairs of private keys and public keys based on the physical randomness thereof according to an input received by the one of the at least one semiconductor chip under a public key cryptography. One of the public keys is regarded as a logical address of one of the logical nodes, which is connected to one of the identification cores. The physical network includes a plurality of physical nodes. Each identification core is one of components in each physical node. The logical network is uniquely linked to the physical network by the pairs of private keys and public keys.

7. 发明授权

US10693636B2 Authenticated network 有权
公开(公告)号：US10693636B2
公开(公告)日：2020-06-23
申请号：US15871178
申请日：2018-01-15
申请人： Guigen Xia , Hiroshi Watanabe
发明人： Hiroshi Watanabe , Atsuhiro Kinoshita
IPC分类号： H04L9/08 , H04L29/08 , H04L9/32 , G06F21/60 , G06F21/73 , H04L29/06
摘要： An authenticated network having a plurality of nodes is disclosed. Each node includes a transaction unit and an identification core. The identification core includes a key generator. The key generators of the identification cores generate a plurality of unique pairs of secret and public keys. The public key serves as a logical address of the transaction unit. Another authenticated network having a plurality of nodes is also disclosed, in which the identification core further includes a private key. The key generators of the identification cores generate a plurality of public keys from the private keys of the identification cores. Each public key serves as a logical address of the transaction unit of a corresponding node. One of the public keys and one of the private keys form a unique pair. Thus, the transaction unit manages the information communication among the plurality of nodes. The identification core manages an authentication of the nodes.

8. 发明授权

US10226959B2 Substrate processing apparatus 有权
公开(公告)号：US10226959B2
公开(公告)日：2019-03-12
申请号：US13811877
申请日：2011-07-21
申请人： Hiromi Kiyose , Satoru Hiraki , Hiroshi Watanabe
发明人： Hiromi Kiyose , Satoru Hiraki , Hiroshi Watanabe
IPC分类号： B44C1/22 , H01L21/67 , H01L21/311
摘要： A substrate processing device, which processes by immersing the substrate in the processing liquid comprising a mixture of a chemical and a diluting liquid, is provided with: a processing tank (1) that retains the processing liquid; heating means (2, 3) that heat the processing liquid; a temperature detection means (4) that detects the temperature of the processing liquid; a temperature control means (5) that operates the aforementioned heating means (2, 3) in a manner so that the detected temperature approaches a set temperature; a replenishing means (6) that replenishes the diluting liquid in the processing liquid; a concentration detection means (7) that detects the concentration of the processing liquid by measuring the light absorption characteristics of the processing liquid; and a concentration control means (8) that operates the aforementioned replenishing means (6) in a manner so that the detected concentration approaches a set concentration.

9. 发明申请

US20170221581A1 Semiconductor Apparatus and Identification Method of a Semiconductor Chip 审中-公开
公开(公告)号：US20170221581A1
公开(公告)日：2017-08-03
申请号：US15416160
申请日：2017-01-26
申请人： Hiroshi Watanabe
发明人： Yukihiro Nagai , Hiroshi Watanabe , Riichiro Shirota
IPC分类号： G11C29/34 , G11C29/02 , G11C29/00 , G06F21/57 , G11C29/18
摘要： A semiconductor apparatus including a semiconductor chip is disclosed. The semiconductor chip includes a modular region and a test circuit. The modular region includes a plurality of modular areas each including a memory cell array with redundant bit lines and a peripheral memory area storing at least redundant addresses. The test circuit retrieves the redundant addresses intrinsic to the semiconductor chip. The distribution of the redundant addresses are randomly formed related to a part or a whole of the modular area of the modular region. The test circuit outputs a random number generated from physical properties intrinsic to the semiconductor chip according to a specification code received from a physical-chip-identification measuring device.

10. 发明授权

US09506854B2 Method and device for measuring scattering-absorption body 有权
标题翻译：测量散射吸收体的方法和装置
公开(公告)号：US09506854B2
公开(公告)日：2016-11-29
申请号：US13695362
申请日：2011-03-29
申请人： Etsuko Yamaki , Yutaka Yamashita , Motoki Oda , Hiroaki Suzuki , Toshihiko Suzuki , Hiroshi Watanabe , Shunsaku Koga
发明人： Etsuko Yamaki , Yutaka Yamashita , Motoki Oda , Hiroaki Suzuki , Toshihiko Suzuki , Hiroshi Watanabe , Shunsaku Koga
IPC分类号： G01N21/17 , G01N21/49 , A61B5/1455 , G01N21/359 , A61B5/145
CPC分类号： G01N21/17 , A61B5/14546 , A61B5/1455 , A61B2562/0242 , G01N21/359 , G01N21/49
摘要： Light irradiates one light incident position on the surface of a scattering-absorption body. The light that propagates through the interior of the scattering-absorption body is detected at one light detecting position on the surface of the scattering-absorption body. On the basis of a light detection signal, a temporal profile of the light intensity of the detected light is acquired, and on the basis of the temporal profile, an mean optical path length of the light in the interior of the scattering-absorption body and information relating to the amount of substance to be measured in a region to be measured are calculated. The information relating to the amount of substance to be measured is corrected on the basis of the mean optical path length, such that the longer the mean optical path length, the greater the amount of substance to be measured is.
摘要翻译：光照射散射吸收体表面上的一个光入射位置。在散射吸收体的表面的一个光检测位置处检测通过散射吸收体的内部传播的光。基于光检测信号，获取检测光的光强度的时间分布，并且基于时间分布，散射吸收体内部的光的平均光路长度和计算与要测量的区域中的待测物质量有关的信息。基于平均光程长度校正与被测量物质量有关的信息，使得平均光程长度越长，待测物质量越多。

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