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    • 3. 再颁专利
    • Drum type washing machine
    • 鼓式洗衣机
    • USRE44795E1
    • 2014-03-11
    • US13116096
    • 2011-05-26
    • Na Eun KimJin Woong KimYoung Hwan ParkJae Won Chang
    • Na Eun KimJin Woong KimYoung Hwan ParkJae Won Chang
    • D06F37/22
    • D06F37/22
    • A drum type washing machine is provided, in which vibration is efficiently attenuated, by a maximum capacity within a size-fixed cabinet is provided, and by which a user does not bend over or sit down to load laundry into the washing machine. The drum type washing machine includes a cabinet forming an exterior of the drum type washing machine, a tub fixed within the cabinet, the tub having a laundry loading entrance at an outer circumference of the tub, a drum rotatably provided within the tub, the drum having an opening on a lateral side of the drum to communicate with the laundry loading entrance of the tub, a motor assembly provided next to one side of the drum to rotate the drum, and a suspension assembly provided to support a weight of the drum and attenuate vibration of the drum.
    • 提供了一种滚筒式洗衣机,其中振动被有效地衰减,提供了在尺寸固定的机柜内的最大容量,并且用户不会弯曲或坐下来将衣物装载到洗衣机中。 滚筒式洗衣机包括形成滚筒式洗衣机外部的机柜,固定在机柜内的桶,在桶的外周具有衣物装载入口的桶,可旋转地设置在桶内的滚筒,滚筒 在滚筒的横向侧上具有与桶的衣物装载入口连通的开口,设置在滚筒的一侧旁边以使滚筒旋转的马达组件和设置成支撑滚筒重量的悬挂组件, 衰减鼓的振动。
    • 6. 发明申请
    • Nitride semiconductor device and manufacturing method thereof
    • 氮化物半导体器件及其制造方法
    • US20120267686A1
    • 2012-10-25
    • US13137291
    • 2011-08-03
    • Woo Chul JeonKi Yeol ParkYoung Hwan Park
    • Woo Chul JeonKi Yeol ParkYoung Hwan Park
    • H01L29/778H01L21/338
    • H01L29/66431H01L29/2003H01L29/404H01L29/42316H01L29/66462H01L29/7787
    • Provided is a nitride semiconductor device including: a nitride semiconductor layer over a substrate wherein the nitride semiconductor has a two-dimensional electron gas (2DEG) channel inside; a drain electrode in ohmic contact with the nitride semiconductor layer; a source electrode spaced apart from the drain electrode, in Schottky contact with the nitride semiconductor layer, and having an ohmic pattern in ohmic contact with the nitride semiconductor layer inside; a dielectric layer formed on the nitride semiconductor layer between the drain electrode and the source electrode and on at least a portion of the source electrode; and a gate electrode disposed on the dielectric layer to be spaced apart from the drain electrode, wherein a portion of the gate electrode is formed over a drain-side edge portion of the source electrode with the dielectric layer interposed therebetween, and a manufacturing method thereof.
    • 提供一种氮化物半导体器件,其包括:氮化物半导体层,其在氮化物半导体内部具有二维电子气体(2DEG)通道的衬底上; 与氮化物半导体层欧姆接触的漏电极; 源极与漏极间隔开,与氮化物半导体层肖特基接触,并且具有与内部的氮化物半导体层欧姆接触的欧姆图案; 形成在所述氮化物半导体层上的所述漏电极和所述源电极之间以及所述源电极的至少一部分上的电介质层; 以及设置在所述电介质层上以与所述漏极间隔开的栅电极,其中所述栅电极的一部分形成在所述源电极的漏极侧边缘部分之间,并且介电层插入其间;以及其制造方法 。
    • 7. 发明申请
    • NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    • 氮化物半导体器件及其制造方法
    • US20120267639A1
    • 2012-10-25
    • US13448678
    • 2012-04-17
    • Woo Chul JEONKi Yeol ParkYoung Hwan Park
    • Woo Chul JEONKi Yeol ParkYoung Hwan Park
    • H01L29/778H01L21/336H01L29/205
    • H01L29/402H01L29/0607H01L29/2003H01L29/42376H01L29/66462H01L29/7787
    • Disclosed herein are a nitride semiconductor device and a method for manufacturing the same. According to an exemplary embodiment, there is provided a nitride semiconductor device, including: a nitride semiconductor layer having a 2DEG channel; a drain electrode ohmic-contacted with the nitride semiconductor layer; a source electrode Schottky-contacted with the nitride semiconductor layer, including a plurality of patterned protrusion portions protruded to the drain electrode direction, and including an ohmic pattern ohmic-contacted with the nitride semiconductor layer therein; a dielectric layer disposed on the nitride semiconductor layer between the drain electrode and the source electrode and over at least a portion of the source electrode including the patterned protrusion portions; and a gate electrode disposed on the dielectric, wherein a portion of the gate electrode is disposed on the dielectric layer over the patterned protrusion portions and a drain direction edge portion of the source electrode.
    • 本文公开了一种氮化物半导体器件及其制造方法。 根据示例性实施例,提供了一种氮化物半导体器件,包括:具有2DEG通道的氮化物半导体层; 与氮化物半导体层欧姆接触的漏电极; 与氮化物半导体层肖特基接触的源电极,包括突出到漏电极方向的多个图案化突起部分,并且包括与其中的氮化物半导体层欧姆接触的欧姆图案; 设置在所述氮化物半导体层之间的介电层,位于所述漏电极和所述源电极之间,以及至少部分所述源极包括所述图案化突起部分; 以及设置在所述电介质上的栅电极,其中所述栅电极的一部分设置在所述图案化的突出部分上的所述电介质层和所述源电极的漏极方向边缘部分上。
    • 8. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • 半导体器件及其制造方法
    • US20110233623A1
    • 2011-09-29
    • US12965649
    • 2010-12-10
    • Ki Yeol PARKWoo Chul JeonYoung Hwan ParkJung Hee Lee
    • Ki Yeol PARKWoo Chul JeonYoung Hwan ParkJung Hee Lee
    • H01L29/778H01L21/336
    • H01L29/7786H01L29/0649H01L29/2003H01L29/365H01L29/4236H01L29/66462H01L29/78681
    • There is provided a semiconductor device and a method of manufacturing the same. The semiconductor device includes a base substrate; a semiconductor layer having a receiving groove, a protrusion part, a first carrier injection layer, at least two insulating patterns, and a second carrier injection layer provided on the base substrate, the insulating patterns being disposed to traverse the first carrier injection layer and the second carrier injection layer being spaced apart from the first carrier injection layer and disposed on a lower portion of the protrusion part; a source electrode and a drain electrode disposed to be spaced apart from each other on the semiconductor layer; and a gate electrode insulated from the source electrode and the drain electrode and having a recess part recessed into the receiving groove, wherein a lowest portion of the receiving groove contacts an uppermost layer of the first carrier injection layer or is disposed above the uppermost layer thereof, and an insulating pattern, disposed at an innermost portion of the semiconductor layer among the insulating patterns, traverses the first carrier injection layer and is disposed at the outside of both sides of the receiving groove in a thickness direction thereof.
    • 提供了一种半导体器件及其制造方法。 半导体器件包括:基底; 具有接收槽的半导体层,突起部分,第一载流子注入层,至少两个绝缘图案和设置在基底基板上的第二载流子注入层,绝缘图案设置成穿过第一载流子注入层和 第二载体注入层与第一载体注入层间隔开并设置在突出部分的下部; 源电极和漏电极,设置成在半导体层上彼此间隔开; 以及与源电极和漏电极绝缘的栅电极,并且具有凹入到所述接收槽中的凹部,其中所述接收槽的最下部接触所述第一载流子注入层的最上层,或者设置在所述第一载流子注入层的最上层 并且绝缘图案设置在绝缘图案中的半导体层的最内部,穿过第一载流子注入层,并且沿着其厚度方向设置在容纳槽的两侧的外侧。
    • 9. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    • 半导体器件及其制造方法
    • US20110233613A1
    • 2011-09-29
    • US12965640
    • 2010-12-10
    • Woo Chul JEONKi Yeol ParkYoung Hwan ParkJung Hee Lee
    • Woo Chul JEONKi Yeol ParkYoung Hwan ParkJung Hee Lee
    • H01L29/778H01L21/335
    • H01L29/7786H01L29/2003H01L29/66462
    • There are provided a semiconductor device and a method for manufacturing the same. The semiconductor device according to the present invention includes a base substrate; a semiconductor layer that includes a receiving groove and a protrusion part formed on the base substrate, a first carrier injection layer and at least two insulating layers formed to traverse the first carrier injection layer formed in the semiconductor layer, and a second carrier injection layer spaced apart from the first carrier injection layer formed on the protrusion part; a source electrode and a drain electrode that are disposed to be spaced apart from each other on the semiconductor layer; and a gate electrode that is insulated from the source electrode and the drain electrode and has a recess part recessed into the receiving groove, wherein the lowest end portion of the receiving groove contacts the uppermost layer of the first carrier injection layer and the insulating pattern disposed at the innermost side of the semiconductor layer among the insulating patterns traverses the entire layer forming the first carrier injection layer and is disposed at the outer side of both side end portions in the thickness direction of the receiving groove.
    • 提供了一种半导体器件及其制造方法。 根据本发明的半导体器件包括:基底; 半导体层,其包括形成在所述基底基板上的接收槽和突出部,第一载流子注入层和形成为穿过形成在所述半导体层中的所述第一载流子注入层形成的至少两个绝缘层,以及间隔开的第二载流子注入层 除了形成在突出部上的第一载流子注入层之外; 源电极和漏电极,其设置成在半导体层上彼此间隔开; 以及与源电极和漏电极绝缘并且具有凹入到接收槽中的凹部的栅电极,其中接收槽的最低端部接触第一载流子注入层的最上层,并且布置的绝缘图案 在绝缘图案中的半导体层的最内侧穿过形成第一载流子注入层的整个层,并且设置在接收槽的厚度方向上的两个侧端部的外侧。