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    • 5. 发明申请
    • MATRIX FILM DEPOSITION SYSTEM
    • 矩阵膜沉积系统
    • US20160167065A1
    • 2016-06-16
    • US14798691
    • 2015-07-14
    • Shimadzu Corporation
    • Kazuteru Takahashi
    • B05B5/08H01J49/16B05B5/03B05B5/00B05B5/16
    • B05B5/087B05B5/005B05B5/03B05B5/0535B05B5/16B05B5/1608B05C5/02B05C5/0208B05D1/04H01J49/0418H01J49/164
    • A system capable of depositing a matrix film containing a low amount of impurities (e.g. neutral particles) is provided. The system includes: a first plate electrode 120 having an attachment surface on which a sample plate P is to be attached; a second plate electrode 130 arranged so as to face the attachment surface; a nozzle 110 for spraying a liquid containing a matrix substance into the space between the two electrodes 120 and 130 by an electrospray method, the nozzle 110 arranged so that none of the electrodes 120 and 130 lies on the central axis A of a spray flow of the liquid; and an electric field creator 140 for creating, between the two electrodes 120 and 130, an electric field for forcing electrically charged droplets contained in the spray flow of the liquid containing the matrix substance to move toward the attachment surface.
    • 提供一种能够沉积含有少量杂质(例如中性粒子)的基质膜的系统。 该系统包括:第一板状电极120,其具有附着表面,样品板P将要安装在该附着表面上; 布置成面向所述附接表面的第二平板电极130; 用于通过电喷雾方法将含有基质物质的液体喷射到两个电极120和130之间的空间中的喷嘴110,喷嘴110布置成使得电极120和130中没有一个位于中心轴线A上, 液体; 以及电场产生器140,用于在两个电极120和130之间产生用于迫使包含在含有基质物质的液体的喷射流中的带电荷的液滴朝向附着表面移动的电场。
    • 6. 发明授权
    • Ionization apparatus
    • US09679755B2
    • 2017-06-13
    • US15049366
    • 2016-02-22
    • SHIMADZU CORPORATION
    • Yusuke TateishiKazuteru TakahashiHideki Sato
    • H01J49/10H01J49/14
    • H01J49/147H01J27/024H01J27/205H01J49/067H01J49/145
    • In an ion source 3 in which a repeller electrode 32 for forming a repelling electric field that repels ions toward an ion emission port 311 is provided inside of an ionization chamber 31, ion focusing electrodes 36 and 37 are respectively arranged between an electron introduction port 312 and a filament 34 and between an electron discharge port 313 and a counter filament 35. An electric field formed by applying a predetermined voltage to each of the ion focusing electrodes 36 and 37 intrudes into the ionization chamber 31 through the electron introduction port 312 and the electron discharge port 313, and becomes a focusing electric field that pushes the ions in an ion optical axis C direction. Ions at positions off a central part of the ionization chamber 31 receive the combined force of the force of the repelling electric field and the force of the focusing electric field, and move toward the ion emission port 311 while approaching the ion optical axis C. Accordingly, the amount of ions sent out from the ion emission port increases. Further, even if a charge-up phenomenon occurs, the ion trajectories less easily change, and the stability of the sensitivity can be enhanced.