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    • 1. 发明授权
    • X-ray examination apparatus
    • X光检查仪
    • US06611578B2
    • 2003-08-26
    • US10028119
    • 2001-12-21
    • Rudolph Maria SnoerenJohannes Catharina Antonius Op De BeekMatthijs Adriaansz
    • Rudolph Maria SnoerenJohannes Catharina Antonius Op De BeekMatthijs Adriaansz
    • G21K300
    • G21K1/10
    • The present invention provides an X-ray examination apparatus, comprising an X-ray source, an X-ray detector, a filter arranged between said source and said detector, said filter comprising an array of filter elements having X-ray absorbtivities that can be adjusted by means of control voltages, a control circuit for supplying said control voltages to said filter elements, and an object support arranged between said filter and said detector, said station being adapted to support an object to be exposed to X-ray radiation emanating from said source, the transmitted X-ray radiation being detected by said detector, said control circuit being adapted to supply said control voltages in single-sequence fashion to groups of adjacent filter elements.
    • 本发明提供了一种X射线检查装置,包括X射线源,X射线检测器,布置在所述源和所述检测器之间的滤波器,所述滤波器包括具有可被调整的X射线吸收能力的滤波器元件阵列 通过控制电压提供用于将所述控制电压提供给所述滤波器元件的控制电路,以及布置在所述滤波器和所述检测器之间的对象支撑件,所述站适于支撑待暴露于从所述源发出的X射线辐射的物体 由所述检测器检测到所发射的X射线辐射,所述控制电路适于将所述控制电压以单次方式提供给相邻过滤元件的组。
    • 4. 发明授权
    • Tomosynthesis in a limited angular range
    • 有限角度范围内的合成
    • US06813334B2
    • 2004-11-02
    • US10082865
    • 2001-10-19
    • Reiner KoppeErhard Paul Arthur KlotzJohannes Catharina Antonius Op De Beek
    • Reiner KoppeErhard Paul Arthur KlotzJohannes Catharina Antonius Op De Beek
    • G01N2300
    • A61B6/4441A61B6/025A61B6/4464
    • A method and system of forming an X-ray layer image of an object being examined by an X-ray device having an X-ray source and an X-ray detector is described. At least one of the X-ray source and the X-ray detector can be displaced in an angular range around the object in order that X-ray projection images are acquired from different directions. When forming only a single X-ray layer image, or a plurality of X-ray layer images of parallel layers of the object, the time required for the acquisition of the X-ray projection images is notably reduced by forming the X-ray layer image directly from the X-ray projection images, where the resulting X-ray layer image is situated in a plane which extends essentially perpendicularly to the bisector of the angular range of displacement. The angular range of displacement can be less then 180°. The system and method is notably applicable to a C-arm X-ray device, in which the angular range can be chosen at will.
    • 描述了由具有X射线源和X射线检测器的X射线装置检查的物体的X射线层图像的形成方法和系统。 X射线源和X射线检测器中的至少一个可以在物体周围的角度范围内移位,以便从不同的方向获取X射线投影图像。 当仅形成单个X射线层图像或者对象的平行层的多个X射线层图像时,通过形成X射线层而显着地减少了X射线投影图像的采集所需的时间 图像直接从X射线投影图像,其中所得的X射线层图像位于基本上垂直于角度范围的平分线延伸的平面中。 位移的角度范围可以小于180°。 该系统和方法特别适用于C臂X射线装置,其中可以随意选择角度范围。
    • 8. 发明授权
    • X-ray examination apparatus
    • X光检查仪
    • US06704388B2
    • 2004-03-09
    • US10022125
    • 2001-10-30
    • Johannes Catharina Antonius Op De BeekMatheus Wilhelmus Kerkhof
    • Johannes Catharina Antonius Op De BeekMatheus Wilhelmus Kerkhof
    • G21K112
    • A61B6/583A61B6/4441
    • An X-ray examination apparatus includes an X-ray source (1) for emitting an X-ray beam (8) having a central X-ray extending along a central beam line (4). There is also provided an X-ray detector (2) for picking up X-ray images. The X-ray source (1) and the X-ray detector (2) are rotatable together around an axis of rotation (3). The X-ray examination apparatus is provided with a calibration system (6, 7). Calibration images of the calibration phantom (6) are formed from different, preferably opposed directions of the X-ray beam (8). The zero orientation of the X-ray source (1) with the X-ray detector (2) is derived from differences in positions of the same aspect of the calibration phantom in the respective calibration images. The central beam line (4) extends perpendicularly to the axis of rotation (3) in the zero orientation.
    • X射线检查装置包括用于发射具有沿着中心束线(4)延伸的中心X射线的X射线束(8)的X射线源(1)。 还提供了用于拾取X射线图像的X射线检测器(2)。 X射线源(1)和X射线检测器(2)可围绕旋转轴线(3)一起旋转。 X射线检查装置设有校准系统(6,7)。 校准体模(6)的校准图像由X射线束(8)的不同的,优选相对的方向形成。 X射线源(1)与X射线检测器(2)的零取向来源于各校准图像中校准体模的相同方面的位置差异。 中心束线(4)以零取向垂直于旋转轴线(3)延伸。