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    • 10. 发明授权
    • Method of preferentially etching a semiconductor substrate with respect
to epitaxial layers
    • 相对于外延层优先蚀刻半导体衬底的方法
    • US5756403A
    • 1998-05-26
    • US581233
    • 1995-12-29
    • Rudolf P. TijburgSharon J. FlamholtzKevin W. Haberern
    • Rudolf P. TijburgSharon J. FlamholtzKevin W. Haberern
    • C23F1/14H01L21/306H01L21/308H01L21/473H01L21/302
    • H01L21/30612H01L21/473
    • An etching composition and method for its use in etching a semiconductor structure, the semiconductor structure comprising a substrate and one or more epitaxial layers. The etching composition comprises a solvent, an etchant, and first and second complexing agents, the etchant and complexing agents being soluble in the solvent. The etchant preferentially etches the substrate with respect to at least one epitaxial layer. The first complexing agent is reactive with the substrate so as to accelerate the rate at which the etchant etches the substrate. The second completing agent is reactive with a component of the at least one epitaxial layer so as to form a resulting compound with the component. This reaction establishes an equilibrium between the resulting compound, the second complexing agent and the component, the equilibrium precluding significant etching of the at least one epitaxial layer. The etching composition preferably comprises an agent which provides for adjusting the acidity of the solution, and thereby provides for adjusting the etch rate of the substrate while maintaining the composition's etching characteristics with respect to the at least one epitaxial layer.
    • 一种用于蚀刻半导体结构的蚀刻组合物和方法,所述半导体结构包括衬底和一个或多个外延层。 蚀刻组合物包括溶剂,蚀刻剂和第一和第二络合剂,蚀刻剂和络合剂可溶于溶剂中。 蚀刻剂相对于至少一个外延层优先蚀刻衬底。 第一络合剂与衬底反应,以加速蚀刻剂蚀刻衬底的速率。 第二完成剂与至少一个外延层的组分反应,以便与组分形成所得化合物。 该反应在所得化合物,第二络合剂和组分之间建立平衡,排除了至少一个外延层的显着蚀刻的平衡。 蚀刻组合物优选包含提供溶液酸度的调节剂,从而提供调整衬底的蚀刻速率,同时保持组合物相对于至少一个外延层的蚀刻特性。