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    • 3. 发明授权
    • Apparatus for all-optical self-aligning holographic phase modulation and
motion sensing and method sensing and method for sensing such phase
modulation
    • 用于全光学自对准全息相位调制和运动感测的装置以及用于感测这种相位调制的方法感测和方法
    • US5335062A
    • 1994-08-02
    • US978811
    • 1992-11-19
    • Rudolf HofmeisterAmnon Yariv
    • Rudolf HofmeisterAmnon Yariv
    • G01D5/26G01H9/00G03H1/02G01B9/02
    • G03H1/02G01D5/266G01H9/00G03H2001/0033G03H2001/0268
    • An all-optical, self-aligning, holographic phase modulation and motion sensing apparatus includes a crystal exhibiting a zero electric field photorefractive effect, a phase modulation or vibration source or mechanism, a source of coherent optical radiation, beam splitting and directing optics, and at least one optical radiation detector. The output from the optical radiation source is split into separate beams, one or all of which are phase modulated. The beams are directed through the crystal exhibiting a zero electric field photorefractive effect, and the resultant transmitted beams are detected by an optical radiation detector to provide a measurement of the phase modulation of the beams. The sensor functions in the absence of an electric field because of the unique characteristic of the crystal exhibiting the zero electric field photorefractive effect whereby if either the phase of the crystal's index grating or of the interfering beams is modulated with a phase change very much less than .pi./2, the intensity of the beam transmitted through the crystal varies linearly with the modulation. Such linear modulation allows crystals exhibiting the zero electric field photorefractive effect to remotely sense phase modulations or vibrations of any type in the absence of electrical signals in the vicinity of the sensor.
    • 全光学自对准全息相位调制和运动感测装置包括呈现零电场光折射效应的晶体,相位调制或振动源或机构,相干光辐射源,分束和引导光学器件,以及 至少一个光辐射检测器。 来自光辐射源的输出被分成单独的光束,其中一个或全部是相位调制的。 光束被引导通过呈现零电场光折射效应的晶体,并且所得到的透射光束由光学辐射检测器检测以提供光束的相位调制的测量。 由于具有零电场光折变效应的晶体的独特特性,传感器在不存在电场的情况下起作用,由此,如果晶体的折射率光栅的相位或干涉光束的相位相位变化非常小于 pi / 2,透射通过晶体的光束的强度随着调制线性变化。 这种线性调制允许呈现零电场光折变效应的晶体在传感器附近没有电信号的情况下远程检测任何类型的相位调制或振动。
    • 8. 发明申请
    • Transceiver module and integrated circuit with clock and data recovery clock diplexing
    • 收发器模块和具有时钟和数据恢复时钟双工的集成电路
    • US20050281193A1
    • 2005-12-22
    • US11118172
    • 2005-04-29
    • Rudolf HofmeisterLewis Aronson
    • Rudolf HofmeisterLewis Aronson
    • H04L1/00H04L1/20H04L1/24
    • H04L1/243H04L1/205
    • An integrated circuit. The integrated circuit is usable in a transceiver module. The integrated circuit includes an input port that is configured to receive a data stream. A clock port on the integrated circuit is configured to receive a reference clock diplexed with another signal or voltage used by the integrated circuit. An eye opening circuit is connected to the input port and clock. The eye opening circuit is configured to retime the data stream received at the input port. An output port is connected to the eye opening circuits The output port is configured to transmit a retimed signal from the eye opening circuit to a device external to the integrated circuit. A bypass circuit is connected to the input port and the output port. The bypass circuit may selectively bypass the eye opening circuit.
    • 集成电路。 集成电路可用于收发器模块。 集成电路包括被配置为接收数据流的输入端口。 集成电路上的时钟端口被配置为接收与由集成电路使用的另一信号或电压双工的参考时钟。 打开电路连接到输入端口和时钟。 眼睛打开电路被配置为重新计算在输入端口处接收的数据流。 输出端口连接到眼睛打开电路。输出端口被配置为将重新定时信号从眼睛打开电路传输到集成电路外部的装置。 旁路电路连接到输入端口和输出端口。 旁路电路可以选择性地旁路眼睛打开电路。
    • 9. 发明申请
    • Electrical testing system with electrical adapter
    • 带电器的电气测试系统
    • US20050064743A1
    • 2005-03-24
    • US10994581
    • 2004-11-22
    • Rudolf HofmeisterSamantha Bench
    • Rudolf HofmeisterSamantha Bench
    • H01R20060101H01R9/03H01R12/00H01R12/71H01R13/64H01R25/00H01R27/00H01R27/02H01R31/00H01R33/88H05K1/00
    • H01R12/716H01R2201/20
    • A system for using an electrical adapter to test an electrical device is provided. The system includes a tester, an electrical device, and the electrical adapter. The electrical adapter includes a board having first and second planar surfaces, a first electrical socket coupled to the first planar surface of the printed circuit board and a second electrical socket coupled to the second planar surface of the printed circuit board. The board includes electrical connectors electrically coupling the first and second electrical sockets to each other. The first electrical socket of the adapter is suitable for temporary connection to an electrical interface of the tester, and the second electrical socket is suitable for temporary connection to an electrical interface of the electrical device. The electrical device can be one of a plurality of electrical devices and the tester can be one of a plurality of testers.
    • 提供了一种使用电气适配器测试电气设备的系统。 该系统包括测试仪,电气设备和电气适配器。 电适配器包括具有第一和第二平面的板,连接到印刷电路板的第一平面的第一电插座和耦合到印刷电路板的第二平面的第二电插座。 该电路板包括将第一和第二电插座彼此电耦合的电连接器。 适配器的第一个电源插座适合临时连接到测试仪的电气接口,第二个电源插座适合临时连接到电气设备的电气接口。 电气设备可以是多个电气设备中的一个,测试器可以是多个测试仪中的一个。