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    • 1. 发明授权
    • Chemical vapor deposition methods
    • 化学气相沉积法
    • US06858264B2
    • 2005-02-22
    • US10132003
    • 2002-04-24
    • Ross S. DandoPhilip H. CampbellCraig M. CarpenterAllen P. Mardian
    • Ross S. DandoPhilip H. CampbellCraig M. CarpenterAllen P. Mardian
    • C23C16/44C23C16/56
    • C23C16/4405C23C16/4412
    • A chemical vapor deposition chamber has a vacuum exhaust line extending therefrom. Material is deposited over a first plurality of substrates within the deposition chamber under conditions effective to deposit effluent product over internal walls of the vacuum exhaust line. At least a portion of the vacuum exhaust line is isolated from the deposition chamber. While isolating, a cleaning fluid is flowed to the vacuum exhaust line effective to at least reduce thickness of the effluent product over the internal walls within the vacuum exhaust line from what it was prior to initiating said flowing. After said flowing, the portion of the vacuum exhaust line and the deposition chamber are provided in fluid communication with one another and material is deposited over a second plurality of substrates within the deposition chamber under conditions effective to deposit effluent product over internal walls of the vacuum exhaust line.
    • 化学气相沉积室具有从其延伸的真空排气管。 在有效地将流出物产物沉积在真空排气管的内壁上的条件下,材料沉积在沉积室内的第一组多个衬底上。 真空排气管线的至少一部分与沉积室隔离。 在分离时,清洁流体流到真空排气管线,有效地至少将真空排气管内的内壁上的流出物的厚度从起始流动之前的厚度减小到最小。 在所述流动之后,真空排气管线和沉积室的部分设置成彼此流体连通,并且在有效地将流出物产物沉积在真空内壁上的条件下,在沉积室内的第二多个基板上沉积材料 排气管路。
    • 4. 发明授权
    • Semiconductor substrate deposition processor chamber liner apparatus
    • 半导体衬底沉积处理器室衬套装置
    • US07234412B2
    • 2007-06-26
    • US10350554
    • 2003-01-23
    • Craig M. CarpenterRoss S. DandoPhilip H. CampbellAllen P. MardianGurtej S. Sandhu
    • Craig M. CarpenterRoss S. DandoPhilip H. CampbellAllen P. MardianGurtej S. Sandhu
    • C23C16/00
    • C23C16/54C23C16/4401
    • A method includes removing at least a piece of a deposition chamber liner from a deposition chamber by passing it through a passageway to the deposition chamber through which semiconductor substrates pass into and out of the chamber for deposition processing. A replacement for the removed deposition chamber liner piece is provided into the chamber by passing the replacement through said passageway. A liner apparatus includes a plurality of pieces which when assembled within a selected semiconductor substrate deposition processor chamber are configured to restrict at least a majority portion of all internal wall surfaces which define said semiconductor substrate deposition processor chamber from exposure to deposition material within the chamber. At least some of the pieces are sized for passing completely through a substrate passageway to the chamber through which semiconductor substrates pass into and out of the chamber for deposition processing.
    • 一种方法包括通过将沉积室衬套通过通道传送到沉积室,通过半导体衬底通过其进入和离开室进行沉积处理,从沉积室去除至少一块沉积室衬里。 通过使替换通过所述通道,将移除的沉积室衬垫件的替代物提供到腔室中。 衬套装置包括多个片段,当组装在所选择的半导体衬底沉积处理器室中时,其被限定为限定所述半导体衬底沉积处理器室的所有内壁表面的至少大部分部分暴露于腔室内的沉积材料。 至少一些片的尺寸被设计成完全通过衬底通道到半导体衬底通过其进入和离开室以进行沉积处理的室。
    • 5. 发明授权
    • Chemically sensitive warning apparatus and method
    • 化学敏感报警装置及方法
    • US07185601B2
    • 2007-03-06
    • US09798672
    • 2001-03-01
    • Craig M. CarpenterAllen P. MardianPhilip H. CampbellRoss S. Dando
    • Craig M. CarpenterAllen P. MardianPhilip H. CampbellRoss S. Dando
    • G01N31/22
    • G01N21/78G01N21/293Y10S116/14
    • A chemically sensitive warning apparatus capable of changing colors upon contact with a chemical is disclosed. The apparatus preferably comprises an elongated tape having opposed, first and second major surfaces and warning indicia visible to an individual viewing the first surface to provide visual indication of possible danger or hazardous condition. Mounted to the tape is at least one chemical indicator that is responsive to the presence of at least one chemical by changing colors so as to provide a visual indication of the exposure of the indicator to the chemical. The tape may also include at least one color reference indicia to facilitate interpretation of the color of the chemical indicator when the chemical indicator changes color upon exposure to the chemical.
    • 公开了能够在与化学品接触时改变颜色的化学敏感警报装置。 该装置优选地包括具有相对的第一和第二主表面的细长带,并且警告标记对于观看第一表面的个体可见以提供可能的危险或危险状况的视觉指示。 安装到胶带上的是至少一种化学指示剂,其通过改变颜色来响应至少一种化学品的存在,从而提供指示剂暴露于化学品的视觉指示。 当化学品指示剂在暴露于化学品时变色时,胶带还可以包括至少一个颜色参考标记,以便于解释化学指示剂的颜色。
    • 10. 发明授权
    • Chemical vapor deposition apparatus
    • 化学气相沉积装置
    • US06814813B2
    • 2004-11-09
    • US10132767
    • 2002-04-24
    • Ross S. DandoCraig M. CarpenterPhilip H. CampbellAllen P. Mardian
    • Ross S. DandoCraig M. CarpenterPhilip H. CampbellAllen P. Mardian
    • C23C1600
    • C23C16/45519C23C16/4401C23C16/54Y10S156/914Y10S414/139
    • A chemical vapor deposition apparatus includes a subatmospheric substrate transfer chamber. A subatmospheric deposition chamber is defined at least in part by a chamber sidewall. A passageway in the chamber sidewall extends from the transfer chamber to the deposition chamber. Semiconductor substrates pass into and out of the deposition chamber through the passageway for deposition processing. A mechanical gate is included within at least one of the deposition chamber and the sidewall passageway, and is configured to open and close at least a portion of the passageway to the chamber. A chamber liner apparatus of a chemical vapor deposition apparatus forms a deposition subchamber within the chamber. At least a portion of the chamber liner apparatus is selectively movable to fully expose and to fully cover the passageway to the chamber.
    • 化学气相沉积设备包括低于大气压的基底传送室。 至少部分地由室侧壁限定低于大气压的沉积室。 腔室侧壁中的通道从传送室延伸到沉积室。 半导体衬底通过用于沉积处理的通道进入和离开沉积室。 机械闸门包括在沉积室和侧壁通道中的至少一个中,并且构造成打开和关闭至腔室的通道的至少一部分。 化学气相沉积设备的腔室衬垫设备在室内形成沉积子室。 腔室衬套装置的至少一部分选择性地可移动以完全暴露并完全覆盖到腔室的通道。