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1. 发明授权

US07323862B2 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US07323862B2
公开(公告)日：2008-01-29
申请号：US11380044
申请日：2006-04-25
申请人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

2. 发明申请

US20060108997A1 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US20060108997A1
公开(公告)日：2006-05-25
申请号：US11296888
申请日：2005-12-08
申请人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

3. 发明授权

US07417424B2 Magnetic-field-measuring device 失效
标题翻译：磁场测量装置
公开(公告)号：US07417424B2
公开(公告)日：2008-08-26
申请号：US10575231
申请日：2004-10-08
申请人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
发明人： Romain Desplats , Olivier Crepel , Felix Beaudoin , Philippe Perdu
IPC分类号： G01R33/12
CPC分类号： G01R33/02 , G01R31/002 , G01R33/09
摘要： A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain (28) includes elements (136) for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).
摘要翻译：用于测量磁场的至少一个分量的装置（16）包括磁阻传感器（102）和测量链（28）。测量链的输入连接到磁阻传感器（102），而其输出旨在提供表示传感器区域中的磁场的信息。此外，测量链（28）包括元件（136），用于隔离用于唯一预定频率（FI）的表示磁场的传感器的信号的频率分量。

4. 发明授权

US07190822B2 Method for customizing an integrated circuit element 失效
标题翻译：定制集成电路元件的方法
公开(公告)号：US07190822B2
公开(公告)日：2007-03-13
申请号：US10312632
申请日：2001-06-26
申请人： Romain Desplats , Philippe Perdu
发明人： Romain Desplats , Philippe Perdu
IPC分类号： G06K9/00
CPC分类号： G01R31/2846 , G01R31/303 , G01R31/307 , G01R31/31703
摘要： A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vector representing the state of a common set of elements of the circuit among which the element to be customized (12); b) defining on the basis of a comparison of vectors, a composite of logic operators applied on the vectors and enabling to extract the coefficient corresponding to the element to be customized (30); c) producing images of the operating circuit at times corresponding to the vectors whereon is applied the composite of logic operators (32); and d) graphically combining the images produced in accordance with a composite of graphic operators corresponding to the composite of logic operators (36).
摘要翻译：定制方法包括以下步骤：a）基于电路模型确定当应用预定的测试序列时每个对应于电路的理论操作时间的一组向量，每个矢量的系数表示电路的一组共同元件的状态，其中要定制的元件（12）; b）基于向量的比较来定义应用于向量的逻辑运算符的组合，并且能够提取与要定制的元素相对应的系数（30）; c）在对应于应用逻辑运算符（32）的复合的矢量的时间产生操作电路的图像; 以及d）以图形方式组合根据与逻辑运算符（36）的复合物对应的图形运算符的合成产生的图像。

5. 发明申请

US20060181268A1 APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS 有权
标题翻译：用于检测晶体管光子发射的装置和方法
公开(公告)号：US20060181268A1
公开(公告)日：2006-08-17
申请号：US11380044
申请日：2006-04-25
申请人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.
摘要翻译：用于分析光子发射数据以鉴别由晶体管发射的光子和由背景源发射的光子的系统，装置和方法。该分析涉及光子发射的空间和/或时间相关性。在相关之后，分析可进一步涉及获得相关光子由晶体管发射的可能性。在相关之后，分析还可以进一步包括将权重分配给单个光子发射作为相关性的函数。在一些情况下，重量反映了光子被晶体管发射的可能性。该分析还可以包括自动识别光子发射图像中的晶体管。

6. 发明授权

US07038442B2 Apparatus and method for detecting photon emissions from transistors 有权
标题翻译：用于检测晶体管的光子发射的装置和方法
公开(公告)号：US07038442B2
公开(公告)日：2006-05-02
申请号：US11040333
申请日：2005-01-20
申请人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/302
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.
摘要翻译：用于分析光子发射数据以鉴别由晶体管发射的光子和由背景源发射的光子的系统，装置和方法。该分析涉及光子发射的空间和/或时间相关性。在相关之后，分析可进一步涉及获得相关光子由晶体管发射的可能性。在相关之后，分析还可以进一步包括将权重分配给单个光子发射作为相关性的函数。在一些情况下，重量反映了光子被晶体管发射的可能性。该分析还可以包括自动识别光子发射图像中的晶体管。

7. 发明授权

US06816614B1 Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip 失效
标题翻译：用于比较表示至少一个集成电路芯片的等势线的记录像素图像的方法
公开(公告)号：US06816614B1
公开(公告)日：2004-11-09
申请号：US09831519
申请日：2001-05-10
申请人： Romain Desplats , Philippe Perdu
发明人： Romain Desplats , Philippe Perdu
IPC分类号： G06K900
CPC分类号： G06T7/001 , G01R31/307 , G06T2207/30148
摘要： The invention concerns a method for comparing two recorded pixelated source images (2a, 2b) of the same rectangular format representing in contrasted form the equipotential lines on an integrated circuit chip. The method consists in subjecting each source image (2a, 2b) to an adaptive thresholding processing with three contrast levels, then forming a result image (14) from the processed source images (3a, 3b) by assigning to each pixel a contrast level defined according to a logical rule of comparison.
摘要翻译：本发明涉及一种用于比较两个记录的相同矩形格式的像素化源图像（2a，2b）的方法，其以对比的形式表示集成电路芯片上的等电位线。该方法包括使每个源图像（2a，2b）经受三个对比度水平的自适应阈值处理，然后通过向每个像素分配定义的对比度水平，从处理的源图像（3a，3b）形成结果图像（14）根据比较的逻辑规则。

8. 发明授权

US07439730B2 Apparatus and method for detecting photon emissions from transistors 有权
标题翻译：用于检测晶体管的光子发射的装置和方法
公开(公告)号：US07439730B2
公开(公告)日：2008-10-21
申请号：US11296888
申请日：2005-12-08
申请人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William K. Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/28
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.
摘要翻译：用于分析光子发射数据以鉴别由晶体管发射的光子和由背景源发射的光子的系统，装置和方法。该分析涉及光子发射的空间和/或时间相关性。在相关之后，分析可进一步涉及获得相关光子由晶体管发射的可能性。在相关之后，分析还可以进一步包括将权重分配给单个光子发射作为相关性的函数。在一些情况下，重量反映了光子被晶体管发射的可能性。该分析还可以包括自动识别光子发射图像中的晶体管。

9. 发明授权

US06967491B2 Spatial and temporal selective laser assisted fault localization 有权
标题翻译：空间和时间选择性激光辅助故障定位
公开(公告)号：US06967491B2
公开(公告)日：2005-11-22
申请号：US10888840
申请日：2004-07-09
申请人： Philippe Perdu , Romain Desplats , Felix Beaudoin , Praveen Vedagarbha , Martin Leibowitz , Kenneth R. Wilsher
发明人： Philippe Perdu , Romain Desplats , Felix Beaudoin , Praveen Vedagarbha , Martin Leibowitz , Kenneth R. Wilsher
IPC分类号： G01R31/26 , G01R31/302 , G01R31/311 , G03C5/00 , G06F17/50 , G21K5/10 , H01J37/08 , H01S20060101
CPC分类号： G01R31/31816 , G01R31/311
摘要： A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.
摘要翻译：一种用于激光辅助故障映射的方法和装置，其将激光控制与测试器单元同步。本发明的方法提供了激光辅助伪静态故障映射以定位其输入被测试仪动态地刺激的设备中的缺陷。它进一步提供激光辅助动态软误差映射，通过利用诸如通过失败状态输出的设备性能标准来定位位置方面并且相对于特定测试矢量，设备中的敏感区域相关。该装置包括连接到与测试器单元完全同步的控制单元的完全可控的动态激光刺激装置。

10. 发明申请

US20050146321A1 Apparatus and method for detecting photon emissions from transistors 有权
公开(公告)号：US20050146321A1
公开(公告)日：2005-07-07
申请号：US11040333
申请日：2005-01-20
申请人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
发明人： Romain Desplats , Patricia Le Coupanec , William Lo , Philippe Perdu , Steven Kasapi
IPC分类号： G01R31/311 , G01R1/00
CPC分类号： G01R31/2656 , G01R31/311
摘要： A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

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