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    • 9. 发明申请
    • TEST CHIP VALIDATION AND DEVELOPMENT SYSTEM
    • 测试芯片验证和开发系统
    • US20090241075A1
    • 2009-09-24
    • US12053852
    • 2008-03-24
    • Shahriar AhmedKedar DongreJeffrey C. HunterRott PavelVincent RayappaJoseph Yip
    • Shahriar AhmedKedar DongreJeffrey C. HunterRott PavelVincent RayappaJoseph Yip
    • G06F17/50
    • G06F17/5045G06F2217/12G06F2217/14Y02P90/265
    • Embodiments of an IC design system for test row/structure layout design are described in this application. The design system may include a test chip complier database, a test chip complier engine (TCCE), and a user interface module. The TCCE may be configured to communicate with at least the test chip compiler database and the user interface module, and configured to allow a user to automatically generate a test chip layout by providing an integrated circuit design system. With the system, a user can automatically generate a design by specifying the test row or test structure layout requirements for the design using sets of predefined templates, changing design template parameters using a table driven input format, scheduling generation of the design on a preferred layout design tool, visually inspecting the generated design for errors, and/or applying version controls to the generated design. Other embodiments are described.
    • 在本申请中描述了用于测试行/结构布局设计的IC设计系统的实施例。 该设计系统可以包括测试芯片编码器数据库,测试芯片编译器引擎(TCCE)和用户接口模块。 TCCE可以被配置为与至少测试芯片编译器数据库和用户界面模块通信,并且被配置为允许用户通过提供集成电路设计系统来自动生成测试芯片布局。 使用该系统,用户可以通过使用预定义模板集来指定设计的测试行或测试结构布局要求来自动生成设计,使用表驱动的输入格式更改设计模板参数,在优选布局上调度生成设计 设计工具,目视检查生成的设计错误,和/或对生成的设计应用版本控制。 描述其他实施例。