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    • 2. 发明申请
    • Method and apparatus for measuring the phase shift induced in a light signal by a sample
    • 用于测量由样品在光信号中感应的相移的方法和装置
    • US20100006773A1
    • 2010-01-14
    • US12457074
    • 2009-06-01
    • Soren Aasmul
    • Soren Aasmul
    • G01N21/64
    • G01N21/6408G01J3/4406G01N21/274G01N21/6428G01N21/645G01N27/3271G01N2021/6419G01N2021/6421G01N2021/6441
    • A first light source emits a light signal along a measurement optical path that includes a sample and a second light source emits a light signal along a dummy measurement optical path. A measurement circuit receives the light signals and provides outputs separated in time which are indicative of the phase of the respective light signals. A phase shift is induced in light in the measurement optical path by the sample. A reference circuit receives a signal indicative of the phase of the light signals emitted by the first and second light sources. Circuitry compares the phases of light output from the two circuits to provide output indicative of a first measured phase difference during operation of the first light source. Correction is applied to this measurement by taking a similar phase difference measurement during operation of the second light source and comparing the two phase differences.
    • 第一光源沿着包括样本的测量光路发射光信号,并且第二光源沿着虚拟测量光路发射光信号。 测量电路接收光信号并提供时间上分离的指示各个光信号的相位的输出。 通过样品在测量光路中的光中引起相移。 参考电路接收指示由第一和第二光源发射的光信号的相位的信号。 电路比较来自两个电路的光输出的相位,以在第一光源的操作期间提供指示第一测量相位差的输出。 通过在第二光源的操作期间进行相似的相位差测量并比较两个相位差,对该测量进行校正。
    • 3. 发明申请
    • Fluorometers
    • 荧光计
    • US20070153279A1
    • 2007-07-05
    • US10584294
    • 2004-12-20
    • Soren Aasmul
    • Soren Aasmul
    • G01N21/64
    • G01N21/645G01J1/04G01J1/0422G01N2021/6463G01N2201/0636
    • In apparatus for the production and detection of fluorescence at a sample surface, the height of the apparatus above the sample surface is reduced, and loss of the emitted fluorescence due to reflection loss and light scattering is minimized. The apparatus comprises a three-dimensionally curved light reflecting surface (40) that directs light from a light source (32) transversely to its original path and focuses the light on to an illumination zone (30) at or below the sample surface. The reflecting surface (40) also collects, directs and at least partially collimates emitted fluorescence transversely to its original path and towards a detector (46).
    • 在用于在样品表面生产和检测荧光的装置中,样品表面上方的装置的高度减小,并且由于反射损失和光散射引起的发射的荧光的损失最小化。 该装置包括三维弯曲的光反射表面(40),其将来自光源(32)的光横向于其原始路径引导并将光聚焦到在样品表面处或下方的照明区域(30)。 反射表面(40)还收集,引导并至少部分地将发射的荧光横向于其原始路径并朝向检测器(46)准直。
    • 7. 发明授权
    • Method and apparatus for measuring the phase shift induced in a light signal by a sample
    • 用于测量由样品在光信号中感应的相移的方法和装置
    • US07884338B2
    • 2011-02-08
    • US12457074
    • 2009-06-01
    • Soren Aasmul
    • Soren Aasmul
    • G01N21/64
    • G01N21/6408G01J3/4406G01N21/274G01N21/6428G01N21/645G01N27/3271G01N2021/6419G01N2021/6421G01N2021/6441
    • A first light source emits a light signal along a measurement optical path that includes a sample and a second light source emits a light signal along a dummy measurement optical path. A measurement circuit receives the light signals and provides outputs separated in time which are indicative of the phase of the respective light signals. A phase shift is induced in light in the measurement optical path by the sample. A reference circuit receives a signal indicative of the phase of the light signals emitted by the first and second light sources. Circuitry compares the phases of light output from the two circuits to provide output indicative of a first measured phase difference during operation of the first light source. Correction is applied to this measurement by taking a similar phase difference measurement during operation of the second light source and comparing the two phase differences.
    • 第一光源沿着包括样本的测量光路发射光信号,并且第二光源沿着虚拟测量光路发射光信号。 测量电路接收光信号并提供时间上分离的指示相应光信号的相位的输出。 通过样品在测量光路中的光中引起相移。 参考电路接收指示由第一和第二光源发射的光信号的相位的信号。 电路比较来自两个电路的光输出的相位,以在第一光源的操作期间提供指示第一测量相位差的输出。 通过在第二光源的操作期间进行相似的相位差测量并比较两个相位差,对该测量进行校正。
    • 9. 发明申请
    • Method and Apparatus for Measuring the Phase Shift Induced in a Light Signal by a Sample
    • 用于测量由样品引起的光信号中的相移的方法和装置
    • US20080024779A1
    • 2008-01-31
    • US11658263
    • 2005-07-27
    • Soren Aasmul
    • Soren Aasmul
    • G01N21/64
    • G01N21/6408G01J3/4406G01N21/274G01N21/6428G01N21/645G01N27/3271G01N2021/6419G01N2021/6421G01N2021/6441
    • Apparatus for measuring a phase shift induced in a light signal has a first light source for emitting a light signal along a measurement optical path that includes a sample, for example a fluorescent sample, and a second light source for emitting a light signal along a dummy measurement optical path. A measurement electronic circuit is provided for receiving the light signals and providing outputs separated in time which are indicative of the phase of the respective light signals. In use, a phase shift is induced in light in the measurement optical path by the fluorescent sample. A reference electronic circuit is provided for receiving a signal indicative of the phase of the light signals emitted by the first and second light sources. Circuitry is provided to compare the respective phases of light output from the two circuits to provide an output indicative of a first measured phase difference during operation of the first light source. A correction is then applied to this measurement by taking a similar phase difference measurement during operation of the second light source and comparing the two phase differences.
    • 用于测量在光信号中感应的相移的装置具有第一光源,用于沿着包括样品例如荧光样品的测量光路发射光信号,以及用于沿虚拟物发射光信号的第二光源 测量光路。 提供了一种测量电子电路,用于接收光信号并提供时间上分离的表示各个光信号的相位的输出。 在使用中,通过荧光样品在测量光路中的光中引起相移。 提供参考电子电路用于接收指示由第一和第二光源发射的光信号的相位的信号。 提供电路以比较来自两个电路的光输出的各个相位,以提供指示在第一光源的操作期间的第一测量相位差的输出。 然后通过在第二光源的操作期间进行类似的相位差测量并比较两个相位差来对该测量进行校正。