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1. 发明申请

US20060094763A1 Polymorphic forms of 6-[2-(methylcarbomoyl) phenyl sulfanyl]-3-E-[2-(pyridin-2-yl)ethenyl]indazole 审中-公开
标题翻译： 3-E- [2-（吡啶-2-基）乙烯基]吲唑的6- [2-（甲基羰基甲酰基）苯基硫烷基]
公开(公告)号：US20060094763A1
公开(公告)日：2006-05-04
申请号：US11264493
申请日：2005-10-31
申请人： Qiang Ye , Ryan Hart , Robert Kania , Michael Ouellette , Zhen Wu , Scott Zook
发明人： Qiang Ye , Ryan Hart , Robert Kania , Michael Ouellette , Zhen Wu , Scott Zook
IPC分类号： A61K31/4439 , C07D403/02
CPC分类号： C07D401/06
摘要： The present invention relates to novel polymorphic forms of 6-[2-(methylcarbamoyl)phenylsulfanyl]-3-E-[2-(pyridin-2-yl)ethenyl]indazole, and to processes for their preparation. Such polymorphic forms may be a component of a pharmaceutical composition and may be used to treat a hyperproliferative disorder or a mammalian disease condition mediated by protein kinase activity.
摘要翻译：本发明涉及6- [2-（甲基氨基甲酰基）苯基硫烷基] -3-E- [2-（吡啶-2-基）乙烯基]吲唑的新型多晶型物及其制备方法。这种多晶型物可以是药物组合物的组分，并且可以用于治疗由蛋白激酶活性介导的过度增殖性疾病或哺乳动物疾病状况。

2. 发明申请

US20050267158A1 Polymorphic and amorphous forms of 2,5-dimethyl-2H-pyrazole-3-carboxylic acid {2-fluoro-5-[3-((E)-2 pyridin-2-YL-vinyl)-1H-indazol-6-ylamino]-phenyl}-amide 审中-公开
标题翻译： 2,5-二甲基-2H-吡唑-3-羧酸{2-氟-5- [3 - （（E）-2-吡啶-2-基） - 乙烯基）-1H-吲唑-6-羧酸的多晶型和无定形形式，吡啶-2-基氨基] - 苯基} - 酰胺
公开(公告)号：US20050267158A1
公开(公告)日：2005-12-01
申请号：US11081708
申请日：2005-03-15
申请人： Qiang Ye , Scott Zook , Michael Ouellette , Don Hettinger , Jayaram Srirangam , Robert Kania , Nabil Saeed , Matthew Wightlin , Mark Mitchell
发明人： Qiang Ye , Scott Zook , Michael Ouellette , Don Hettinger , Jayaram Srirangam , Robert Kania , Nabil Saeed , Matthew Wightlin , Mark Mitchell
IPC分类号： A61K31/4439 , C07D401/14 , C07D43/14
CPC分类号： C07D401/14
摘要： The invention provides several polymorphic forms and an amorphous form of 2,5-Dimethyl-2H-pyrazole-3-carboxylic acid {2-fluoro-5-[3-((E)-2-pyridin-2-yl-vinyl)-1H-indazol-6-ylamino]-phenyl}-amide, pharmaceutical compositions containing such polymorphic or amorphous forms, and methods of using such pharmaceutical compositions to treat disease states mediated by protein kinases, such as cancer and other disease states associated with unwanted angiogenesis and/or cellular proliferation.
摘要翻译：本发明提供了几种多晶型和无定形形式的2,5-二甲基-2H-吡唑-3-羧酸{2-氟-5- [3 - （（E）-2-吡啶-2-基 - 乙烯基） -1H-吲唑-6-基氨基] - 苯基} - 酰胺，含有这种多晶型或无定形形式的药物组合物，以及使用这种药物组合物治疗由蛋白激酶介导的疾病状态的方法，例如与不想要的血管生成和/或细胞增殖。

3. 发明申请

US20200029542A1 Outrigger kit for fishing 审中-公开
公开(公告)号：US20200029542A1
公开(公告)日：2020-01-30
申请号：US15998281
申请日：2018-07-30
申请人： Michael Ouellette
发明人： Michael Ouellette
IPC分类号： A01K97/08 , A01K87/02 , A01K87/04
摘要： This invention provides an outrigger assembly for fishing that can be quickly deployed from a portable bag about 1 meter long into a fully rigged outrigger in a selected length of 4 meters, 5 meters or 6 meters. Variable length is obtained by adding sections of telescoping pole. Quick deployment is obtained by using detachable line guides that are radially (or side) threadable in conjunction with a separate preassembled outrigger line loop for each deployed length. Different length outrigger line loop assemblies are color coded for quick identification. Stowed length and volume of the collapsed telescoping pole is minimized by the use of outrigger line guides that are removable from the outrigger pole. Threading and unthreading of an outrigger line loop without opening the loop is enabled by the radially threadable line guides. The invention also provides an outrigger holder having two sockets, one for the outrigger and one for a fishing pole.

4. 发明申请

US20080037341A1 ENABLING MEMORY REDUNDANCY DURING TESTING 有权
标题翻译：在测试期间启用记忆冗余
公开(公告)号：US20080037341A1
公开(公告)日：2008-02-14
申请号：US11875011
申请日：2007-10-19
申请人： Michael Ouellette , Jeremy Rowland
发明人： Michael Ouellette , Jeremy Rowland
IPC分类号： G11C29/00
CPC分类号： G11C29/4401 , G11C29/14 , G11C29/24 , G11C29/44
摘要： Methods and apparatuses for enabling a redundant memory element (20) during testing of a memory array (14). The memory array (14) includes general memory elements (18) and redundant memory elements (20). The general memory elements (18) are tested and any defective general memory elements (18) are replaced with redundant memory elements (20). The redundant memory elements (20) are tested only when they are enabled.
摘要翻译：用于在存储器阵列（14）的测试期间启用冗余存储元件（20）的方法和装置。存储器阵列（14）包括通用存储元件（18）和冗余存储元件（20）。一般存储器元件（18）被测试，并且任何有缺陷的通用存储器元件（18）被替换为冗余存储元件（20）。冗余存储器元件（20）仅在使能时被测试。

5. 发明申请

US20070258296A1 METHOD AND APPARATUS FOR IN-SYSTEM REDUNDANT ARRAY REPAIR ON INTEGRATED CIRCUITS 失效
标题翻译：用于集成电路系统冗余阵列维修的方法和装置
公开(公告)号：US20070258296A1
公开(公告)日：2007-11-08
申请号：US11418052
申请日：2006-05-04
申请人： Arthur Bright , Paul Crumley , Marc Dombrowa , Steven Douskey , Rudolf Haring , Steven Oakland , Michael Ouellette , Scott Strissel
发明人： Arthur Bright , Paul Crumley , Marc Dombrowa , Steven Douskey , Rudolf Haring , Steven Oakland , Michael Ouellette , Scott Strissel
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C29/4401 , G11C29/802
摘要： Disclosed is a method of repairing an integrated circuit of the type comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The method comprises the steps of providing the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The method comprises the further step of, at a given time, passing the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.
摘要翻译：公开了一种修复包括多个存储器阵列的类型的集成电路的方法，以及用于控制用于控制阵列的冗余逻辑的控制数据的保险丝盒。该方法包括以下步骤：向集成电路提供控制数据选择器，用于将控制数据从保险丝盒传送到存储器阵列; 提供备用控制数据源，集成电路外部; 并将替代控制数据源连接到控制数据选择器。该方法还包括在给定时间，通过控制数据选择器将备用控制数据从其源传递到存储器阵列以控制存储器阵列的冗余逻辑的步骤。

6. 发明申请

US20070230260A1 AUTOMATIC SHUTDOWN OR THROTTLING OF A BIST STATE MACHINE USING THERMAL FEEDBACK 失效
标题翻译：使用热反馈自动关机或弯曲状态机
公开(公告)号：US20070230260A1
公开(公告)日：2007-10-04
申请号：US11278238
申请日：2006-03-31
申请人： Kevin Gorman , Emory Keller , Michael Ouellette
发明人： Kevin Gorman , Emory Keller , Michael Ouellette
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C29/16 , G11C2029/5002
摘要： A Built-In-Self-Test (BIST) state machine providing BIST testing operations associated with a thermal sensor device(s) located in proximity to the circuit(s) to which BIST testing operations are applied. The thermal sensor device compares the current temperature value sensed to a predetermined temperature threshold and determines whether the predetermined threshold is exceeded. A BIST control element suspends the BIST testing operation in response to meeting or exceeding said predetermined temperature threshold, and initiates resumption of BIST testing operations when the current temperature value normalizes or is reduced. A BIST testing methodology implements steps for mitigating the exceeded temperature threshold condition in response to determining that the predetermined temperature threshold is met or exceeded. These steps include one of: ignoring the BIST results of the suspect circuit(s), or by causing the BIST state machine to enter a wait state and adjusting operating parameters of the suspect circuits while in the wait state.
摘要翻译：内置自测试（BIST）状态机，提供与位于BIST测试操作所在电路附近的热传感器设备相关的BIST测试操作。热传感器装置将感测到的当前温度值与预定温度阈值进行比较，并确定是否超过预定阈值。 BIST控制元件响应于满足或超过所述预定温度阈值而暂停BIST测试操作，并且当当前温度值归一化或降低时，启动BIST测试操作的恢复。响应于确定满足或超过预定温度阈值，BIST测试方法实现了减轻超过温度阈值条件的步骤。这些步骤包括：忽略可疑电路的BIST结果，或通过使BIST状态机进入等待状态，并在等待状态下调整可疑电路的工作参数。

7. 发明申请

US20050270866A1 ENABLING MEMORY REDUNDANCY DURING TESTING 有权
标题翻译：在测试期间启用记忆冗余
公开(公告)号：US20050270866A1
公开(公告)日：2005-12-08
申请号：US11160268
申请日：2005-06-16
申请人： Michael Ouellette , Jeremy Rowland
发明人： Michael Ouellette , Jeremy Rowland
IPC分类号： G11C29/00 , G11C29/14 , G11C29/24 , G11C29/44
CPC分类号： G11C29/4401 , G11C29/14 , G11C29/24 , G11C29/44
摘要： Methods and apparatuses for enabling a redundant memory element (20) during testing of a memory array (14).
摘要翻译：用于在存储器阵列（14）的测试期间启用冗余存储元件（20）的方法和装置。

8. 发明申请

US20050013187A1 METHOD FOR REDUCED ELECTRICAL FUSING TIME 失效
标题翻译：降低电气熔融时间的方法
公开(公告)号：US20050013187A1
公开(公告)日：2005-01-20
申请号：US10604414
申请日：2003-07-18
申请人： Darren Anand , John Barth , Steven Oakland , Michael Ouellette
发明人： Darren Anand , John Barth , Steven Oakland , Michael Ouellette
IPC分类号： G11C17/00 , G11C17/16 , G11C17/18
CPC分类号： G11C17/16 , G11C17/18
摘要： A method and electrical fuse circuit design for reducing the testing time for a semiconductor device manufactured with redundant eFuse circuitry. A two-to-one multiplexer (MUX) is provided at each eFuse circuit in addition to the fuse latch and pattern latch and other logic components the eFuse circuit. Information on which fuse is to be blown is stored in the fuse's pattern latch. The output generated by the pattern latch is ANDed with a program input to provide a select signal for the MUX. Based on the select signal, the MUX allows the shifted “1” to either go to the next latch in the shift chain or bypass the next latch or latches in the shift chain depending on whether the next fuse is to be blown. Accordingly, rather than serially shifting through each fuse latch within the device, the invention enables only those fuse latches associated with fuses that are to be blown to hold up the propagation of the shifted “1” to the next eFuse circuits.
摘要翻译：一种用于减少使用冗余eFuse电路制造的半导体器件的测试时间的方法和电熔丝电路设计。除了保险丝锁存器和图案锁存器以及eFuse电路的其他逻辑元件之外，在每个eFuse电路上还提供两对一多路复用器（MUX）。保险丝图案锁存器中存储有要熔断保险丝的信息。由模式锁存器产生的输出与程序输入进行“与”运算以提供MUX的选择信号。基于选择信号，MUX允许移位的“1”转到下一个锁存器，或者旁路下一个锁存器或锁存在换档链中，这取决于下一个保险丝是否被熔断。因此，本发明不仅可以串联地转换器件内的每个熔丝锁存器，而且仅使与熔断器相关联的熔丝锁存器能够保持传输“1”到下一个eFuse电路的传输。

9. 发明申请

US20080022149A1 ENABLING MEMORY REDUNDANCY DURING TESTING 有权
标题翻译：在测试期间启用记忆冗余
公开(公告)号：US20080022149A1
公开(公告)日：2008-01-24
申请号：US11829187
申请日：2007-07-27
申请人： Michael Ouellette , Jeremy Rowland
发明人： Michael Ouellette , Jeremy Rowland
IPC分类号： G06F11/08
CPC分类号： G11C29/14 , G11C29/24 , G11C29/44 , G11C29/4401
摘要： A design structure embodied in a machine readable medium for designing, manufacturing, testing and/or enabling a redundant memory element (20) during testing of a memory array (14), and a method of repairing a memory array.
摘要翻译：体现在用于在存储器阵列（14）的测试期间设计，制造，测试和/或启用冗余存储器元件（20）的机器可读介质中的设计结构以及修复存储器阵列的方法。

10. 发明申请

US20060239088A1 METHOD AND APPARATUS FOR INCREASING FUSE PROGRAMMING YIELD THROUGH PREFERRED USE OF DUPLICATE DATA 有权
标题翻译：通过优化使用重复数据来增加保险丝编程的方法和装置
公开(公告)号：US20060239088A1
公开(公告)日：2006-10-26
申请号：US10908033
申请日：2005-04-26
申请人： Darren Anand , Michael Ouellette , Michael Ziegerhofer
发明人： Darren Anand , Michael Ouellette , Michael Ziegerhofer
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C17/165 , G11C29/027 , G11C29/4401 , G11C29/72
摘要： Integrated circuit memory is tested to discover defective memory elements. To replace the defective memory elements, spare memory elements are selected and a string is generated to indicate which ones of the spares replace which ones of the defective memory elements. The number of bits of the string depend upon how many of the memory elements are defective. Although a certain number of the memory elements are defective, which determines the number of the string bits, nevertheless, a number of fuses to program on the integrated circuit is determined responsive to how many fuses are available for programming relative to the number of the binary string bits. That is, if more fuses are available than a certain threshold number relative to the number of string bits (as is preferred), then more than the threshold number are programmed. If not, then only that certain threshold number of fuses are programmed.
摘要翻译：测试集成电路存储器以发现有缺陷的存储器元件。为了更换有缺陷的存储器元件，选择备用存储器元件，并且生成字符串以指示哪些备用件替换有缺陷存储器元件中的哪一个。字符串的位数取决于多少存储器元件有缺陷。尽管一定数量的存储器元件是有缺陷的，这确定了串比特的数目，然而，确定集成电路上编程的多个保险丝的响应是相对于二进制数的编号有多少个熔丝可用于编程字符串位。也就是说，如果比相对于字符串位数（优选的）更多的熔丝可用于某个阈值数，则多于阈值编号。如果没有，那么只有该阈值数量的保险丝被编程。

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