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    • 4. 发明申请
    • Diagnostic Method and Apparatus For Non-Destructively Observing Latch Data
    • 用于非破坏性观察锁存数据的诊断方法和装置
    • US20070033458A1
    • 2007-02-08
    • US11533907
    • 2006-09-21
    • Darren AnandJohn GossPeter JacobsenMichael OuelletteThomas SopchakDonald Wheater
    • Darren AnandJohn GossPeter JacobsenMichael OuelletteThomas SopchakDonald Wheater
    • G01R31/28
    • G11C19/00G11C29/003
    • The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.
    • 本发明提供一种可以观察移位寄存器内的数据而不改变数据的电路。 该电路包括连接到移位寄存器的输入和输出的选择器。 选择器选择性地将输入与所选移位寄存器的输出连接,以形成所选移位寄存器的布线回路。 连接到布线回路的控制装置使用布线回路使得数据从所选择的移位寄存器的输出连续地传送到所选择的移位寄存器的输入端并循环地返回所选择的移位寄存器。 控制装置包括用于确定所选择的移位寄存器的长度的计数器和一组寄存器,用于存储当在移位寄存器中旋转数据时将来使用的每个移位寄存器的长度。 控制装置还包括从电路外部可访问的数据输出。 观察线连接到布线回路,数据通过观察线从布线回路传递给控制装置。 当数据通过选定的移位寄存器循环时,控制装置输出出现在布线环路上的数据,以允许在电路外观察所选移位寄存器内的数据,而不改变所选移位寄存器内的数据。
    • 5. 发明申请
    • COMPILABLE MEMORY STRUCTURE AND TEST METHODOLOGY FOR BOTH ASIC AND FOUNDRY TEST ENVIRONMENTS
    • 可编程存储器结构和测试方法用于两个ASIC和基准测试环境
    • US20060176745A1
    • 2006-08-10
    • US10906147
    • 2005-02-04
    • Steven EustisJames MonzelSteven OaklandMichael Ouellette
    • Steven EustisJames MonzelSteven OaklandMichael Ouellette
    • G11C29/00
    • G11C29/48G11C29/1201G11C2029/3202
    • A memory structure configured for supporting multiple test methodologies includes a first plurality of multiplexers configured for selectively coupling at least one data input path and at least one address path between an external customer connection and a corresponding internal memory connection associated therewith. A second multiplexer is configured for selectively coupling an input of a test latch between a functional memory array connection and a memory logic connection coupled to the at least one data input path, with an output of the test latch defining a data out customer connection. Flush logic is further configured to direct data from the memory logic connection to the data out customer connection during a test of logic associated with a customer chip, thereby facilitating observation of the memory logic connection at the customer chip, wherein test elements of the memory structure comprise a scan architecture of a first type, and test elements of the customer chip comprise a scan architecture of a second type.
    • 配置用于支持多种测试方法的存储器结构包括:第一多个复用器,被配置为选择性地耦合至少一个数据输入路径和外部客户连接与与其相关联的对应的内部存储器连接之间的至少一个地址路径。 第二多路复用器被配置用于在功能存储器阵列连接和耦合到所述至少一个数据输入路径的存储器逻辑连接之间选择性地耦合测试锁存器的输入,测试锁存器的输出定义数据输出客户连接。 冲洗逻辑还被配置为在与客户芯片相关联的逻辑的测试期间将数据从存储器逻辑连接引导到数据输出客户连接,从而有助于观察客户芯片处的存储器逻辑连接,其中存储器结构的测试元件 包括第一类型的扫描架构,并且客户芯片的测试元件包括第二类型的扫描架构。