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1. 发明申请

US20120212212A1 VOLTAGE DETECTING CIRCUIT 有权
标题翻译：电压检测电路
公开(公告)号：US20120212212A1
公开(公告)日：2012-08-23
申请号：US13396235
申请日：2012-02-14
申请人： Po-Hung CHEN , Makoto TAKAMIYA , Takayasu SAKURAI
发明人： Po-Hung CHEN , Makoto TAKAMIYA , Takayasu SAKURAI
IPC分类号： G01R19/155
CPC分类号： G01R19/16519 , G01F3/20
摘要： In a voltage detecting circuit, a transistor is configured as a P-type MOSFET, and includes a source connected with an input terminal, a gate connected with a ground voltage terminal and a drain connected with an output terminal. A transistor is configured as a P-type MOSFET, and includes a gate and a source connected with the output terminal and a drain connected with the ground terminal. Gate width and gate length of the transistor and gate width and gate length of the transistor are adjusted so that source-drain current flowing between the source and the drain of the transistor becomes equal to source-drain current flowing between the source and the drain of the transistor when the voltage applied to the input terminal is set to be preset trigger voltage. This configuration accomplishes detecting that the input voltage exceeds the trigger voltage with simple configuration.
摘要翻译：在电压检测电路中，晶体管被配置为P型MOSFET，并且包括与输入端连接的源极，与接地电压端子连接的栅极和与输出端子连接的漏极。晶体管被配置为P型MOSFET，并且包括与输出端连接的栅极和源极以及与接地端子连接的漏极。调节晶体管的栅极宽度和栅极长度，并调整晶体管的栅极宽度和栅极长度，使得在晶体管的源极和漏极之间流动的源极 - 漏极电流变得等于在源极和漏极之间流动的源极 - 漏极电流当施加到输入端子的电压被设置为预置触发电压时，晶体管。该配置通过简单的配置实现了输入电压超过触发电压的检测。

2. 发明申请

US20110298534A1 INTEGRATED CIRCUIT DEVICE 有权
标题翻译：集成电路设备
公开(公告)号：US20110298534A1
公开(公告)日：2011-12-08
申请号：US13093343
申请日：2011-04-25
申请人： Ken TAKEUCHI , Teruyoshi HATANAKA , Koichi ISHIDA , Tadashi YASUFUKU , Makoto TAKAMIYA , Takayasu SAKURAI
发明人： Ken TAKEUCHI , Teruyoshi HATANAKA , Koichi ISHIDA , Tadashi YASUFUKU , Makoto TAKAMIYA , Takayasu SAKURAI
IPC分类号： G05F1/10
CPC分类号： H01L25/0657 , H01L25/18 , H01L2225/06565 , H01L2924/0002 , H01L2924/00
摘要： The channel number detecting circuit 50 detects the operation channel number Nch based on the the output terminal voltage Vpgm after falling down when the output terminal voltage Vpgm falls down during the voltage boosting control, and the switching control circuit 70 generates the control clock signal CLK having the on-time and the off-time adjusted based on the operation channel number Nch and performs the voltage boosting control using generating control clock signal CLK. The voltage boosting control is properly performed based on the operation channel number Nch when the operation channel number Nch increase during performing the voltage boosting control. Thus boosting the power supply voltage Vdd up to the voltage V2 is accomplished.
摘要翻译：通道号检测电路50在升压控制期间当输出端子电压Vpgm下降时，基于降低后的输出端子电压Vpgm来检测运算通道数Nch，切换控制电路70生成具有基于操作通道数Nch调节导通时间和关断时间，并使用产生控制时钟信号CLK来执行升压控制。在执行升压控制时，当操作通道数Nch增加时，基于操作通道数Nch适当地执行升压控制。从而实现将电源电压Vdd提高到电压V2。

3. 发明申请

US20080037125A1 IMAGE PICKUP APPARATUS 有权
标题翻译：图像拾取装置
公开(公告)号：US20080037125A1
公开(公告)日：2008-02-14
申请号：US11837191
申请日：2007-08-10
申请人： Makoto TAKAMIYA
发明人： Makoto TAKAMIYA
IPC分类号： G02B27/44
CPC分类号： G02B5/1871
摘要： An image pickup apparatus which is capable of suppressing generation of shadows even when the aperture of the photographic lens is stopped down. A digital camera as an image pickup apparatus includes a photographic lens, a image pickup element that picks up an image of an object, and an optical low-pass filter disposed between the photographic lens and the image pickup element. The filter includes a liner phase diffraction grating having unit cells which are disposed in a regular pattern at a grating pitch P and are formed by equal-width recesses and equal-width protrusions adjacent to each other. When a shortest wavelength of a reference wavelength employed is λS, and a longest wavelength of the reference wavelength is λL, an optical path difference ΔH between lengths of optical paths of light of which a phase is varied by the phase grating is larger than λS/2 and smaller than λL/2.
摘要翻译：即使当拍摄镜头的孔径被停止时，也能够抑制阴影的产生的摄像装置。作为图像拾取装置的数码相机包括摄影镜头，拾取物体的图像的摄像元件和设置在摄影镜头和摄像元件之间的光学低通滤波器。滤光器包括具有单位单元的衬垫相位衍射光栅，其以格栅间距P以规则图案设置，并且由彼此相邻的等宽度的凹槽和等宽度的突起形成。当所使用的参考波长的最短波长为λS，并且参考波长的最长波长为λL时，由相位光栅改变相位的光的光路长度之间的光程差ΔH大于λS/ 2并且小于λL/ 2。

4. 发明申请

US20200183121A1 Camera System 审中-公开
公开(公告)号：US20200183121A1
公开(公告)日：2020-06-11
申请号：US16303652
申请日：2017-05-09
申请人： Makoto TAKAMIYA
发明人： Makoto TAKAMIYA
IPC分类号： G02B7/04 , G03B15/00 , G03B35/08
摘要： The purpose of the present invention is to provide a camera system that acquires entertaining three-dimensional images and to provide a controller of the camera system. In the present invention relates to the camera system, there are two cameras, and a control means for varying the camera distance Dc [m] between the two camera units, each camera has a zoom lens. And the focal length (f1, f2) of the zoom lens of the two cameras between the two camera units is interlocked with the camera distance Dc [m].

5. 发明申请

US20070296440A1 SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20070296440A1
公开(公告)日：2007-12-27
申请号：US11847712
申请日：2007-08-30
申请人： Makoto TAKAMIYA , Masayuki Mizuno
发明人： Makoto TAKAMIYA , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

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