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1. 发明申请

US20070296440A1 SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20070296440A1
公开(公告)日：2007-12-27
申请号：US11847712
申请日：2007-08-30
申请人： Makoto TAKAMIYA , Masayuki Mizuno
发明人： Makoto TAKAMIYA , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

2. 发明授权

US07786746B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07786746B2
公开(公告)日：2010-08-31
申请号：US11847712
申请日：2007-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

3. 发明申请

US20090128134A1 SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER 审中-公开
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20090128134A1
公开(公告)日：2009-05-21
申请号：US12358652
申请日：2009-01-23
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/00
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

4. 发明授权

US07911220B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07911220B2
公开(公告)日：2011-03-22
申请号：US11512361
申请日：2006-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/28
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors.A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip.Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

5. 发明授权

US07307439B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 失效
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07307439B2
公开(公告)日：2007-12-11
申请号：US10926364
申请日：2004-08-26
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

6. 发明申请

US20060290373A1 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20060290373A1
公开(公告)日：2006-12-28
申请号：US11512361
申请日：2006-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/26
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

7. 发明申请

US20050165573A1 Semiconductor integrated circuit apparatus, measurement result management system, and management server 失效
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20050165573A1
公开(公告)日：2005-07-28
申请号：US10926364
申请日：2004-08-26
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/26 , G01R31/28 , G01R31/317 , G01R31/319 , G06F15/00 , H01L21/822 , H01L27/04
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

8. 发明授权

US08862934B2 Redundant computing system and redundant computing method 有权
标题翻译：冗余计算系统和冗余计算方法
公开(公告)号：US08862934B2
公开(公告)日：2014-10-14
申请号：US13510621
申请日：2010-11-26
申请人： Yoshio Kameda , Masayuki Mizuno
发明人： Yoshio Kameda , Masayuki Mizuno
IPC分类号： G06F11/00 , G06F11/22 , G06F11/07 , G06F11/16
CPC分类号： G06F11/1658 , G06F11/0793 , G06F11/1629 , G06F11/1641 , G06F11/165 , G06F11/1687 , G06F11/2236
摘要： A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.
摘要翻译：冗余计算系统由具有相同功能的第一算术处理单元（A系统）和第二算术处理单元（B系统）组成。诊断控制单元执行一个系统的诊断，而另一个系统执行算术处理操作。诊断控制单元根据诊断操作通过输入控制单元控制对第一和第二算术处理单元的输入，并且输出控制单元根据诊断结果控制来自第一和第二算术处理单元的输出。在诊断结束后，从尚未被诊断的系统的存储单元复制到被诊断的系统的存储单元，并且冗余计算系统恢复冗余操作。

9. 发明授权

US08635040B2 Signal measuring device and signal measuring method 失效
标题翻译：信号测量装置及信号测量方法
公开(公告)号：US08635040B2
公开(公告)日：2014-01-21
申请号：US12519837
申请日：2007-12-19
申请人： Koichi Nose , Masayuki Mizuno , Atsufumi Shibayama
发明人： Koichi Nose , Masayuki Mizuno , Atsufumi Shibayama
IPC分类号： G01R13/02
CPC分类号： G01R31/31937 , G01R31/31708 , G01R31/31726
摘要： A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal.
摘要翻译：一种信号测量装置，包括测量与测量的驱动时钟信号同步的测量对象的一组或多组测量单元，并将测量结果作为第一数据输出，以及定时识别单元，根据测量开始命令，将与每个周期不同的值作为与具有规定周期和速度低于驱动时钟信号的参考信号同步的第二数据输出; 以及与所述驱动时钟信号同步地收集并依次存储所述第一数据和所述第二数据作为一组的存储单元。

10. 发明授权

US08444316B2 Temperature measuring device and method 失效
标题翻译：温度测量装置及方法
公开(公告)号：US08444316B2
公开(公告)日：2013-05-21
申请号：US12746947
申请日：2008-11-27
申请人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
发明人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
IPC分类号： G01K13/00
CPC分类号： G01K7/01 , G01K2219/00
摘要： Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.
摘要翻译：电流读取装置检测输出电流随温度变化而变化的电流源的输出电流，并输出与输出电流成比例的值。测量与电流读取装置的输出值对应的电流源的温度，其与电流源的输出电流成比例，并且根据电流的输出值确定将输出值转换为温度信息的参数读数手段和对应于输出值的电流源的温度测量值。使用所确定的参数将电流读取装置的输出值转换为温度信息。

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