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1. 发明授权

US06281692B1 Interposer for maintaining temporary contact between a substrate and a test bed 失效
标题翻译：用于保持基板和试验台之间的临时接触的插入件
公开(公告)号：US06281692B1
公开(公告)日：2001-08-28
申请号：US09166468
申请日：1998-10-05
申请人： Paul F. Bodenweber , Ralph R. Comulada , Mukta S. Farooq , Charles J. Hendricks , Philo B. Hodge , Vincent P. Peterson , Terence W. Spoor , Kathleen M. Wiley , Yuet-Ying Yu
发明人： Paul F. Bodenweber , Ralph R. Comulada , Mukta S. Farooq , Charles J. Hendricks , Philo B. Hodge , Vincent P. Peterson , Terence W. Spoor , Kathleen M. Wiley , Yuet-Ying Yu
IPC分类号： G01R3102
CPC分类号： G01R1/07378
摘要： Disclosed is an interposer and test structure for making contact between a substrate and a test bed. One embodiment of the interposer has a floating, rigid conductive element in a nonconductive body which makes temporary contact between the test bed and the substrate. In another embodiment of the invention, the interposer includes two layers of material, in which one layer includes pogo pins for contacting the substrate and the other layer includes pads for contacting the test bed. The pogo pins are on a grid spacing corresponding to that of the substrate input/output pads while the interposer pads are on a grid spacing corresponding to that of the pogo pin contactors of the test bed.
摘要翻译：公开了一种用于在基板和试验台之间进行接触的插入件和测试结构。插入器的一个实施例在非导体中具有浮动的刚性导电元件，其使得测试台与基板之间暂时接触。在本发明的另一个实施例中，插入件包括两层材料，其中一层包括用于接触衬底的弹簧针，另一层包括用于接触测试台的衬垫。弹簧针位于与衬底输入/输出焊盘相对应的栅格间隔上，而插入垫位于对应于测试台的弹簧针接触器的栅格间隔上。

2. 发明授权

US06984997B2 Method and system for testing multi-chip integrated circuit modules 失效
标题翻译：用于测试多芯片集成电路模块的方法和系统
公开(公告)号：US06984997B2
公开(公告)日：2006-01-10
申请号：US10714215
申请日：2003-11-13
申请人： Yuet-Ying Yu , Paul F. Bodenweber , Charles J. Hendricks , Frank C. Seelmann
发明人： Yuet-Ying Yu , Paul F. Bodenweber , Charles J. Hendricks , Frank C. Seelmann
IPC分类号： G01R31/02
CPC分类号： G01R31/2886
摘要： A system and method for utilizing a multi-probe tester to test an electrical device having a plurality of contact pads. Multi-probe tester test probes and electrical device contact pads are arrayed in a common distribution pitch, wherein at least one test probe is masked, thereby preventing the at least one test probe from returning a test result to the testing apparatus. In one embodiment mask membrane physically prevents at least one test probe from making contact with the electrical device. In another embodiment at least one software command is provided configured to cause an input from at least one test probe to be disregarded during a test routine. Another embodiment features both mask membrane and software command probe masking.
摘要翻译：一种利用多探针测试仪测试具有多个接触垫的电气设备的系统和方法。多探针测试器测试探针和电气设备接触垫以公共分布间距排列，其中至少一个测试探针被掩蔽，从而防止至少一个测试探针将测试结果返回到测试设备。在一个实施例中，掩膜膜物理地防止至少一个测试探针与电气装置接触。在另一个实施例中，提供至少一个软件命令被配置为在测试例程期间使来自至少一个测试探针的输入被忽略。另一个实施例具有掩膜膜和软件命令探针掩蔽。

3. 发明申请

US20050104608A1 Method and system of testing complex MCM's 失效
标题翻译：复杂MCM测试方法与系统
公开(公告)号：US20050104608A1
公开(公告)日：2005-05-19
申请号：US10714215
申请日：2003-11-13
申请人： Yuet-Ying Yu , Paul Bodenweber , Charles Hendricks , Frank Seelmann
发明人： Yuet-Ying Yu , Paul Bodenweber , Charles Hendricks , Frank Seelmann
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2886
摘要： A system and method for utilizing a multi-probe tester to test an electrical device having a plurality of contact pads. Multi-probe tester test probes and electrical device contact pads are arrayed in a common distribution pitch, and a means for masking test probes masks at least one test probe, thereby preventing the at least one test probe from returning a test result to the testing apparatus. In one embodiment the means for masking test probes is a mask membrane physically preventing at least one test probe from making contact with the electrical device. In another embodiment, the means for masking is at least one software command configured to cause an input from at least one test probe to be disregarded during a test routine. Another embodiment features both mask membrane and software command probe masking.
摘要翻译：一种利用多探针测试仪测试具有多个接触垫的电气设备的系统和方法。多探头测试器测试探针和电气设备接触垫以公共分配间距排列，并且用于掩蔽测试探针的装置掩蔽至少一个测试探针，从而防止至少一个测试探针将测试结果返回到测试装置。在一个实施例中，用于掩蔽测试探针的装置是物理上防止至少一个测试探针与电气装置接触的掩模膜。在另一个实施例中，用于屏蔽的装置是至少一个软件命令，配置成在测试例程期间使来自至少一个测试探针的输入被忽略。另一个实施例具有掩膜膜和软件命令探针掩蔽。

4. 发明申请

US20110287638A1 LARGE SCALE HYBRID SOCKET FOR AN AREA ARRAY DEVICE 失效
标题翻译：用于区域阵列设备的大规模混合插座
公开(公告)号：US20110287638A1
公开(公告)日：2011-11-24
申请号：US12783451
申请日：2010-05-19
申请人： Brian S. Beaman , William L. Brodsky , John L. Colbert , Mark K. Hoffmeyer , Yuet-Ying Yu
发明人： Brian S. Beaman , William L. Brodsky , John L. Colbert , Mark K. Hoffmeyer , Yuet-Ying Yu
IPC分类号： H01R12/16
CPC分类号： H05K7/1069 , H01L23/4006 , H01L23/49811 , H01L23/49827 , H01L2924/0002 , H01L2924/00
摘要： An apparatus is disclosed for aligning socket housing segments for an area array device. Each socket housing segment includes at least a first surface and a second surface, with the second surface opposite the first surface. The second surface of each socket housing segment provides electrical connections for a portion of the area array device. Socket contact pads are disposed on the first surfaces of the plurality of socket housing segments. The socket contact pads correspond to substrate contact pads disposed on a substrate. One or more alignment structures are disposed at a space between the socket housing segments. Each alignment structure is coupled to at least two of the socket housing segments. The one or more alignment structures maintain a predetermined alignment of each socket housing segment so that the socket contact pads align with the substrate contact pads during a surface mount connection process.
摘要翻译：公开了一种用于对准用于区域阵列装置的插座壳体段的装置。每个插座壳体段至少包括第一表面和第二表面，其中第二表面与第一表面相对。每个插座壳体段的第二表面为区域阵列器件的一部分提供电连接。插座接触垫设置在多个插座壳体段的第一表面上。插座接触焊盘对应于设置在衬底上的衬底接触焊盘。一个或多个对准结构设置在插座壳体段之间的空间处。每个对准结构联接到插座壳体段中的至少两个。一个或多个对准结构保持每个插座壳体段的预定对准，使得在表面安装连接过程期间，插座接触垫与衬底接触垫对准。

5. 发明授权

US06627052B2 Electroplating apparatus with vertical electrical contact 有权
公开(公告)号：US06627052B2
公开(公告)日：2003-09-30
申请号：US09734830
申请日：2000-12-12
申请人： James Edward Fluegel , Peter Stevens Locke , Yuet-Ying Yu
发明人： James Edward Fluegel , Peter Stevens Locke , Yuet-Ying Yu
IPC分类号： C25D1700
CPC分类号： H01L21/2885 , C25D7/123 , C25D17/001
摘要： An electrodeposition apparatus for depositing material on a surface of a substrate. The electrodeposition apparatus includes at least one contact for vertically contacting the substrate and providing electrical connection to the substrate. The at least one contact does not scratch the surface of the substrate to be plated. A voltage source is connected to the at least one contact.

6. 发明授权

US06404211B2 Metal buckling beam probe 失效
标题翻译：金属弯曲光束探头
公开(公告)号：US06404211B2
公开(公告)日：2002-06-11
申请号：US09248733
申请日：1999-02-11
申请人： Harvey C. Hamel , Charles H. Perry , Yuet-Ying Yu
发明人： Harvey C. Hamel , Charles H. Perry , Yuet-Ying Yu
IPC分类号： G01R3102
CPC分类号： G01R1/07357
摘要： A buckling beam probe assembly and a process to make the assembly using insulated metal to hold the vertical beam probe wires. The buckling beam probe assembly electrically connects a test apparatus with contact pads on the surface of a device to be tested. The assembly is formed with a plurality of buckling beam wires each having a head, a body, and a tail. Each of the beam wires is pressed vertically onto the contact pads and buckles laterally to adapt to height differences of the contact pads caused by irregularities on the surface of the device to be tested. A top plate has a first plurality of apertures receiving the heads of the plurality of buckling beam wires. A bottom plate has a second plurality of apertures receiving the tails of the plurality of buckling beams wires. A plurality of intermediate metal sections are positioned between the top plate and the bottom plate. Each of the intermediate metal sections is formed with a plurality of thin metal layers and has a plurality of openings coated with an insulation layer. The bodies of the plurality of buckling beam wires pass through the openings.
摘要翻译：屈曲梁探头组件和使用绝缘金属组装以保持垂直梁探针线的工艺。屈曲梁探针组件将测试装置与待测试装置的表面上的接触垫电连接。组件形成有多个屈曲束线，每个弯曲束线具有头部，主体和尾部。每根光束线被垂直地按压到接触垫上并且侧向弯曲，以适应由待测试装置的表面上的不规则引起的接触垫的高度差。顶板具有容纳多个屈曲束线的头部的第一多个孔。底板具有接收多个弯曲梁线的尾部的第二多个孔。多个中间金属部分位于顶板和底板之间。每个中间金属部分形成有多个薄金属层，并且具有涂覆有绝缘层的多个开口。多个屈曲束线的主体穿过开口。

7. 发明授权

US4803774A Method of making molded case circuit breaker contact arrangement 失效
标题翻译：制造塑壳断路器接触装置的方法
公开(公告)号：US4803774A
公开(公告)日：1989-02-14
申请号：US113836
申请日：1987-10-28
申请人： Robert A. Morris , James M. Mitsch , Irenaeus S. Panus , Yuet-Ying Yu , Roger N. Castonguay
发明人： Robert A. Morris , James M. Mitsch , Irenaeus S. Panus , Yuet-Ying Yu , Roger N. Castonguay
IPC分类号： H01H1/22 , H01H1/58 , H01H11/00
CPC分类号： H01H1/22 , H01H1/5833 , H01H2001/5838 , Y10T29/49105
摘要： A molded case circuit breaker movable contact arm or carrier electrically connects with the circuit breaker trip unit or load terminal without requiring a flexible electrical conducting braid. The contact carrier is pivotally arranged within a contact carrier support to which the trip unit or load terminal lug is attached. The contact carrier pivot pin is supported on a pair of parallel posts extending from the contact carrier and a spring clip is positioned around the parallel posts and the pivoting end of the contact carrier to promote good electric transport without interfering with the rotational movement of the contact carrier.
摘要翻译：模制外壳断路器可动接触臂或载体与断路器跳闸单元或负载端子电连接，而不需要柔性导电编织物。接触托架枢转地布置在接触托架支撑件内，脱扣单元或负载端子凸耳附接到该托架支撑件。接触托架枢轴销支撑在从接触托架延伸的一对平行柱上，并且弹簧夹定位在接触托架的平行柱和枢转端周围，以促进良好的电输送而不会妨碍接触件的旋转运动载体

8. 发明授权

US06504388B2 Electrical test tool having easily replaceable electrical probe 有权
标题翻译：电气测试工具具有易于更换的电气探头
公开(公告)号：US06504388B2
公开(公告)日：2003-01-07
申请号：US09464925
申请日：1999-12-16
申请人： Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
发明人： Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
IPC分类号： G01R3102
CPC分类号： G01R1/06705
摘要： Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.
摘要翻译：公开了一种改进的探针容纳机构，其允许从测试工具快速释放探针尖端。本发明包括探针壳体，用于保持探针尖端的双悬臂梁和用于将梁保持就位的可释放弹簧机构。可以通过将弹簧挤压在一起或通过释放不可拆卸的锁定螺钉来释放弹簧机构，从而允许将梁从探针壳体滑动地移除以便于更换。

9. 发明授权

US06429672B2 Contamination-tolerant electrical test probe 失效
标题翻译：耐污电测试探头
公开(公告)号：US06429672B2
公开(公告)日：2002-08-06
申请号：US09107660
申请日：1998-06-30
申请人： Robert N. Wiggin , Yuet-Ying Yu
发明人： Robert N. Wiggin , Yuet-Ying Yu
IPC分类号： G01R3102
CPC分类号： G01R1/07357
摘要： A bed-of-nails type or needle-card type test probe has clusters of parallel buckling beams arranged in a spaced arrangement. The buckling beams are arranged and electrically connected within a cluster so that a contaminant, which may be on the device being tested, does not reduce the accuracy of the test measurements. In particular, the spacing of the buckling beams is such that multiple buckling beams are capable of contacting a single feature on an electronics package to be tested. The buckling beams deflect independently of each other in response to compressive force, and the buckling beams within a cluster are electrically connected in parallel to each other to define redundant, independent conductive paths through the buckling beams. In this way, if a contaminant prevents one of the buckling beams of the cluster from making electrical contact with the feature to be tested, the other one or more of the buckling beams of the cluster will make the required electrical connection.
摘要翻译：甲床型或针卡型测试探针具有以间隔布置的方式布置的平行弯曲梁的簇。屈曲梁被布置和电连接在群集内，使得可能在被测试的设备上的污染物不会降低测试测量的精度。特别地，屈曲梁的间距使得多个屈曲梁能够接触待测试的电子封装上的单个特征。屈曲梁响应于压缩力而彼此独立地偏转，并且簇内的弯曲梁彼此并联地电连接以限定通过弯曲梁的冗余的独立导电路径。以这种方式，如果污染物防止簇的一个屈曲梁与要测试的特征电接触，则簇的另一个或多个屈曲梁将进行所需的电连接。

10. 发明授权

US6127832A Electrical test tool having easily replaceable electrical probe 失效
公开(公告)号：US6127832A
公开(公告)日：2000-10-03
申请号：US003486
申请日：1998-01-06
申请人： Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
发明人： Ralph Richard Comulada, Jr. , Michael Philip Goldowsky , John P. Karidis , Gerard McVicker , Yuet-Ying Yu
IPC分类号： G01R1/067 , G01R31/28 , G01R31/02
CPC分类号： G01R1/06705
摘要： Disclosed is an improved probe housing mechanism that will allow for the quick release of a probe tip from a testing tool. The invention includes a probe housing, a double cantilevered beam for holding a probe tip, and a releasable spring mechanism for holding the beam into place. The spring mechanism can be released by squeezing the spring together or by releasing a non-removable locking screw, thereby allowing the beam to be slidably removed from the probe housing for easy replacement.

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