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    • 2. 发明授权
    • Vertical cavity surface emitting laser
    • 垂直腔表面发射激光
    • US08218594B2
    • 2012-07-10
    • US12458754
    • 2009-07-22
    • Osamu MaedaYuji MasuiMasaki ShiozakiTakahiro ArakidaTakayuki Kawasumi
    • Osamu MaedaYuji MasuiMasaki ShiozakiTakahiro ArakidaTakayuki Kawasumi
    • H01S5/00
    • H01S5/18327H01S5/02461H01S5/1221H01S5/18311H01S5/18358H01S5/18391H01S2301/166H01S2304/02H01S2304/04
    • The present invention provides a Vertical Cavity Surface Emitting Laser including: a first multilayer film reflector; an active layer having a light emission region; a second multilayer film reflector; and a reflectance adjustment layer in this order on a substrate side. The first multilayer film reflector and the second multilayer film reflector have a laminated structure in which reflectance of oscillation wavelength λx is almost constant without depending on temperature change. The active layer is made of a material with which a maximum gain is obtained at temperature higher than ambient temperature. The reflectance adjustment layer has a laminated structure in which difference ΔR(=Rx−Ry) between reflectance Rx of a region opposed to a central region of the light emission region and reflectance Ry of a region opposed to an outer edge region of the light emission region is increased associated with temperature increase from ambient temperature to high temperature.
    • 本发明提供一种垂直腔表面发射激光器,包括:第一多层膜反射器; 具有发光区域的有源层; 第二多层膜反射器; 和反射率调整层。 第一多层膜反射器和第二多层膜反射器具有振荡波长λx的反射率几乎恒定而不依赖于温度变化的层叠结构。 有源层由在高于环境温度的温度下获得最大增益的材料制成。 反射率调整层具有层叠结构,其中与发光区域的中心区域相对的区域的反射率Rx与与发光区域的外边缘区域相对的区域的反射率Ry之间的差Dgr R(= Rx-Ry) 发光区域随温度从环境温度升高到高温而增加。
    • 6. 发明授权
    • Semiconductor light emitting device
    • 半导体发光器件
    • US08488647B2
    • 2013-07-16
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/00
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。
    • 8. 发明申请
    • Semiconductor light emitting device
    • 半导体发光器件
    • US20110096806A1
    • 2011-04-28
    • US12923634
    • 2010-09-30
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • Takahiro ArakidaShiro UchidaMasaki ShiozakiOsamu Maeda
    • H01S5/02
    • H01S5/0264H01S5/18313H01S5/18325
    • The present invention provides a semiconductor light emitting device realizing increased light detection precision by a simple manufacture process. One or more second oxidation layers are provided between an active layer and a semiconductor light detecting element in addition to a first oxidation layer for narrowing current. Since natural emission light includes many divergence components, the natural emission light is reflected and scattered by the second oxidation layer, and propagation of the natural emission light to the semiconductor light detecting element side is suppressed. The detection level of the natural emission light by the semiconductor light detecting element decreases, and light detection precision increases. The first and second oxidation layers are formed by a single oxidizing process so that the manufacturing process is simplified.
    • 本发明提供一种通过简单的制造工艺实现增加的光检测精度的半导体发光器件。 除了用于变窄的电流的第一氧化层之外,在有源层和半导体光检测元件之间提供一个或多个第二氧化层。 由于天然发射光包含许多发散分量,所以天然发射光被第二氧化层反射和散射,并且抑制了将自然发射光传播到半导体光检测元件侧。 半导体光检测元件的自然发光的检测水平降低,光检测精度提高。 第一和第二氧化层通过单一氧化工艺形成,从而简化了制造工艺。