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    • 2. 发明授权
    • Binocular ophthalmoscope
    • 双眼检眼镜
    • US4449797A
    • 1984-05-22
    • US265121
    • 1981-05-19
    • Jakob KocherMichael Foerster
    • Jakob KocherMichael Foerster
    • G03B21/18A61B3/13A61B3/10
    • A61B3/132
    • In a binocular ophthalmoscope for indirect observation of an eye to be examined, having an observation unit and an illumination unit connected to the observation unit, wherein the observation unit deflects two closely spaced converging observation beams defining an observation plane with two first and two second mirrors to increase the beam spacing to the interpupillary distance of the observer's eyes. The two first mirrors are mounted closely together between the two second mirrors in a wedge and wherein the illumination unit includes a light source and a third mirror at the emergent side thereof which directs the light issuing from said light source along an illumination beam to the eye to be examined. The first two mirrors are mutually displaceable within the observation unit in the observation plane towards and away from the eyes of the observer to vary the convergence angle of the observation beams and the illumination beam is movable towards and away from said observation plane to vary the angle of the illumination beam with respect thereto.
    • 在用于间接观察被检眼的双眼检眼镜中,具有连接到观察单元的观察单元和照明单元,其中观察单元使用两个第一和第二后视镜偏转限定观察平面的两个紧密间隔的会聚观察波束 将光束间距增加到观察者眼睛的瞳孔间距离。 两个第一反射镜在楔形件中紧密地安装在两个第二反射镜之间,并且其中照明单元包括光源和在其出射侧的第三反射镜,其将从所述光源发出的光沿照明光束引导到眼睛 要检查 前两个反射镜在观察单元内观察单元内相互移动,朝向和远离观察者的眼睛,以改变观察光束的会聚角度,并且照明光束可朝向和远离观察平面移动以改变角度 的照明光束。
    • 7. 发明申请
    • WAFERSTART PROCESSES AND SYSTEMS FOR INTEGRATED CIRCUIT FABRICATION
    • WAFERSTART集成电路制造的方法和系统
    • US20140046474A1
    • 2014-02-13
    • US13568449
    • 2012-08-07
    • Tony GenenncherStephan PuelmMichael FoersterJuergen Sieberg
    • Tony GenenncherStephan PuelmMichael FoersterJuergen Sieberg
    • G06F19/00
    • G06Q50/04G06Q10/08G06Q50/28H01L21/67294H01L21/67769Y02P90/30
    • A waferstart process for integrated circuit fabrication includes entering order information from requested wafers into a computer through a data input interface of the computer. A container is provided including supplied wafers and having a machine-readable medium associated therewith. The machine-readable medium is encoded with wafer data pertaining to the supplied wafers. The wafer data is entered from the machine-readable medium associated with the container into the computer. The order information and the wafer data are compared within the computer to create a verified data set in the computer upon the computer determining that the supplied wafers in the container correspond to the requested wafers in the order information. The verified data set is stored in a storage medium within the computer. The supplied wafers are transferred from the container to a front opening unified pod after creating the verified data set.
    • 用于集成电路制造的晶片启动过程包括通过计算机的数据输入接口将请求的晶片的订单信息输入计算机。 提供容器,包括提供的晶片并具有与其相关联的机器可读介质。 机器可读介质用与提供的晶片有关的晶片数据进行编码。 将晶片数据从与容器相关联的机器可读介质输入到计算机中。 计算机中的订单信息和晶片数据在计算机内进行比较,以便在计算机确定容器中提供的晶片与订购信息中所请求的晶片相对应时,在计算机中创建经验证的数据集。 验证的数据集存储在计算机内的存储介质中。 所提供的晶片在创建验证数据集之后从容器转移到前开口统一的盒。