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    • 1. 发明申请
    • COATING AND DEVELOPING APPARATUS AND METHOD
    • 涂料和开发设备和方法
    • US20120009528A1
    • 2012-01-12
    • US13177976
    • 2011-07-07
    • Nobuaki MATSUOKAAkira MiyataShinichi HayashiSuguru Enokida
    • Nobuaki MATSUOKAAkira MiyataShinichi HayashiSuguru Enokida
    • G03F7/20G03B27/52
    • H01L21/6715H01L21/67178H01L21/67288H01L21/67745
    • In one embodiment, a coating and developing apparatus includes a processing block including a vertical stack of early-stage processing unit blocks; a vertical stack of later-stage processing unit blocks disposed laterally adjacent to respective ones of the early-stage processing unit blocks; a vertical stack of developing unit blocks stacked on the early-stage processing unit blocks; a vertical stack of auxiliary processing unit blocks disposed laterally adjacent to respective ones of the developing unit blocks; first transfer units, each of which are disposed between the laterally adjacent early-stage processing unit and later-stage processing unit; second transfer units, each of which is disposed between the laterally adjacent developing unit block and auxiliary processing unit block; and a auxiliary transfer mechanism for transferring a substrate between the first transfer units and between the second transfer units.
    • 在一个实施例中,涂层和显影装置包括处理块,其包括早期处理单元块的垂直堆叠; 垂直堆叠的后级处理单元块,其横向相邻于所述早期处理单元块中的相应处理单元块; 堆叠在早期处理单元块上的显影单元块的垂直堆叠; 辅助处理单元块的垂直堆叠,其横向邻近于相应的显影单元块设置; 第一传送单元,每个传送单元布置在横向相邻的早期处理单元和后期处理单元之间; 第二转印单元,其各自设置在横向相邻的显影单元块和辅助处理单元块之间; 以及用于在第一转印单元之间和第二转印单元之间转印衬底的辅助转印机构。
    • 3. 发明申请
    • SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
    • 基板处理装置和基板处理方法
    • US20110014562A1
    • 2011-01-20
    • US12887019
    • 2010-09-21
    • Nobuaki MATSUOKAYoshio KIMURAAkira MIYATA
    • Nobuaki MATSUOKAYoshio KIMURAAkira MIYATA
    • G03G13/16
    • H01L21/67173H01L21/67178H01L21/67184H01L21/67276H01L21/67754
    • A substrate transfer system to reduce total processing time by transferring a substrate at a first delivery stage to a process block where processing can be carried out earliest. The substrate processing apparatus includes a first transfer device delivering a wafer with respect to a substrate carrier, and a second transfer device delivering a wafer between a plurality of process blocks and the first transfer device via a first delivery stage, to transfer the wafer with respect to the process blocks. The process block where there is no wafer or where processing of the last wafer within the relevant process block will be completed earliest is determined based on processing information of the wafers from the process blocks, and the wafer of the first delivery stage is transferred by the second transfer device to the relevant process block. This ensures smooth transfer of the wafer to the process block.
    • 一种基板转印系统,用于通过在第一递送阶段将基底转移到可以最早进行处理的工艺块来减少总处理时间。 衬底处理设备包括相对于衬底载体传送晶片的第一传输装置和经由第一传送级在多个处理块和第一传送装置之间传送晶片的第二传送装置,以相对于 到过程块。 基于来自处理块的晶片的处理信息,确定最早期完成相关处理块内没有晶片或最后晶片的处理块的处理块,并且第一传送阶段的晶片由 第二传输设备到相关进程块。 这确保晶片平滑地转移到处理块。
    • 6. 发明申请
    • COATING AND DEVELOPING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM
    • 涂料和开发设备,基板加工方法和储存介质
    • US20110211825A1
    • 2011-09-01
    • US13103290
    • 2011-05-09
    • Nobuaki MATSUOKAYasushi HayashidaShinichi Hayashi
    • Nobuaki MATSUOKAYasushi HayashidaShinichi Hayashi
    • G03D5/04
    • H01L21/67745H01L21/67178
    • A coating and developing apparatus is provided which requires a smaller occupation space even when it incorporates a substrate inspection unit, while eliminating a disadvantageous layout. A coating film forming part B3 including a plurality of process units and transfer mechanisms A3 and A4, and a developing part B1 including a plurality of process units 31 and a transfer mechanism A1 are vertically arranged in a process block S2. There are disposed in the process block S2 on a side of a carrier block S1, a plurality of vertically arranged transfer units TRS for transferring a substrate W between the same and transfer mechanisms for the respective parts, and a vertically movable transfer mechanism D1 for the transfer unit for transferring a substrate between these transfer units. At least one of the coating film forming part and the developing part includes a substrate inspection unit 43 for inspecting a substrate transferred by the transfer mechanism for the corresponding part.
    • 提供了一种涂覆和显影装置,即使当其包含基板检查单元时也需要较小的占用空间,同时消除不利的布局。 包括多个处理单元和转印机构A3和A4的涂膜形成部分B3和包括多个处理单元31和转印机构A1的显影部分B1垂直地布置在处理块S2中。 在载体块S1的一侧设置有处理块S2,多个垂直设置的传送单元TRS,用于将基板W传送到相应部件的传送机构和用于各部件的传送机构之间, 转印单元,用于在这些转印单元之间转印衬底。 涂膜形成部和显影部中的至少一个包括用于检查由相应部分的转印机构转印的基板的基板检查单元43。
    • 10. 发明申请
    • COATING/DEVELOPING APPARATUS AND COATING/DEVELOPING METHOD
    • 涂料/开发设备和涂料/开发方法
    • US20110043773A1
    • 2011-02-24
    • US12859559
    • 2010-08-19
    • Nobuaki MATSUOKA
    • Nobuaki MATSUOKA
    • G03B27/52
    • G03B27/52
    • Disclosed is an coating/developing apparatus and method thereof in which the processing time is shortened and the foot prints is reduced by shortening the travel distance of a wafer transfer arm. The coating/developing apparatus of the present disclosure includes, inter alia, liquid processing part (COT) that processes the substrate using a liquid, a cooling processing part (CA) provided to correspond to the liquid processing part (COT) and perform the cooling process for the substrate, a liquid processing unit (COTU) provided to correspond to the cooling processing part (CA) and equipped with a heating processing part (HP) that performs a heating processing for the substrate. The cooling processing part (CA) transfers the substrate to/from the liquid processing part (COT) and the heating processing part (HP).
    • 公开了一种涂布/显影装置及其方法,其中缩短了晶片传送臂的移动距离,从而缩短了处理时间并缩小了脚印。 本公开的涂布/显影装置尤其包括使用液体处理基板的液体处理部分(COT),与液体处理部分(COT)相对应地设置的冷却处理部分(CA),并执行冷却 处理基板,液体处理单元(COTU),其被设置为对应于冷却处理部分(CA)并配备有对基板执行加热处理的加热处理部分(HP)。 冷却处理部(CA)将基板传送到液体处理部(COT)和加热处理部(HP)。