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    • 8. 发明申请
    • Lithographic apparatus, position quantity detection system and method
    • 光刻设备,位置量检测系统及方法
    • US20060250617A1
    • 2006-11-09
    • US11120193
    • 2005-05-03
    • Edwin DonkelaarEvert DraaijerLeon LevasierNicolas LallemantGerardus De Rooij
    • Edwin DonkelaarEvert DraaijerLeon LevasierNicolas LallemantGerardus De Rooij
    • G01B11/02
    • G03F7/70858G03F7/70775
    • A lithographic apparatus includes a position quantity determination system to determine a position quantity of a movable part which is in operation at least partly surrounded by an area comprising a fluid. The position quantity determination system includes an interferometer system, a global sensor to determine a global value of a physical quantity of the fluid in the area, and a local sensor to determine a local value of the physical quantity of the fluid in the part of the area. The position quantity determination system is configured to determine the position quantity from an output of the interferometer, the global value of the physical quantity and the local value of the physical quantity. The physical quantity may include a pressure, a temperature, etc. The local physical quantity determination system may include a sensor, such as a high-speed sensor, a computational fluid dynamics model or a linear approximation model.
    • 光刻设备包括位置量确定系统,用于确定至少部分地被包括流体的区域包围的可操作部件的位置量。 位置量确定系统包括干涉仪系统,用于确定该区域中的流体的物理量的总体值的全局传感器,以及局部传感器,用于确定该部分中的流体的物理量的局部值 区。 位置量确定系统被配置为从干涉仪的输出,物理量的总体值和物理量的局部值确定位置量。 物理量可以包括压力,温度等。局部物理量确定系统可以包括传感器,例如高速传感器,计算流体动力学模型或线性近似模型。