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    • 7. 发明授权
    • Liquid crystal display
    • 液晶显示器
    • US07834962B2
    • 2010-11-16
    • US12330105
    • 2008-12-08
    • Tetsuya SatakeTakumi NakahataTakanori OkumuraYusuke YamagataTakeshi OnoNaoki NakagawaSuguru Nagae
    • Tetsuya SatakeTakumi NakahataTakanori OkumuraYusuke YamagataTakeshi OnoNaoki NakagawaSuguru Nagae
    • G02F1/1333G02F1/1335
    • G02F1/133305G02F1/133512G02F2001/133354
    • In a liquid crystal display (10) having a curved display surface, long sides of pixel structures (11) are arranged along the curve direction (Y) of the display surface and on a side of counter substrate provided is a black matrix having a black matrix opening (41a) whose length in the curve direction (Y) is not longer than E−L {(T1/2)+(T2/2)+d}/R, assuming that the length of the display surface in the curve direction (Y) is L, the thickness of an array substrate is T1, the thickness of the counter substrate is T2, the size of the gap between the array substrate and the counter substrate is d, the radius of curvature of the curved display surface is R and the length of a long side of a pixel electrode (29) provided in each of the pixel structures (11) is E. It thereby becomes possible to suppress display unevenness resulting from positional misalignment of the two substrates due to curvature and provide a liquid crystal display achieving a high-quality display image.
    • 在具有弯曲显示面的液晶显示器(10)中,像素结构(11)的长边沿着显示面的曲线方向(Y)配置,在相对基板的一侧设有具有黑色 假设曲线中的显示面的长度,曲线方向(Y)的长度不长于E-L {(T1 / 2)+(T2 / 2)+ d} / R的矩阵开口41a 方向(Y)为L,阵列基板的厚度为T1,对置基板的厚度为T2,阵列基板与对置基板的间隔尺寸为d,曲面显示面的曲率半径 是R,并且设置在每个像素结构(11)中的像素电极(29)的长边的长度为E.因此,由此可以抑制由于曲率而导致的两个基板的位置偏移导致的显示不均匀,并且提供 实现高质量显示图像的液晶显示器。
    • 10. 发明申请
    • THIN-FILM TRANSISTOR, METHOD OF MANUFACTURING THE SAME, AND DISPLAY DEVICE
    • 薄膜晶体管,其制造方法和显示器件
    • US20090159884A1
    • 2009-06-25
    • US12335806
    • 2008-12-16
    • Koji ODANaoki NakagawaTakeshi OnoYusuke Uchida
    • Koji ODANaoki NakagawaTakeshi OnoYusuke Uchida
    • H01L29/78H01L21/02
    • H01L29/4908H01L29/66765
    • A method of manufacturing a thin-film transistor according to an embodiment of the present invention includes the step of forming a gate insulator on a gate electrode. The gate insulator includes at least a first region being in contact with a hydrogenated amorphous silicon film, and a second region positioned below the first region. The first and second regions are deposited using a source gas including NH3, N2, and SiH4, and H2 gas or a mixture of H2 and He. The first region is deposited by setting the flow-rate ratio NH3/SiH4 in a range from 11 to 14 and the second region is deposited by setting the flow-rate ratio NH3/SiH4 to be equal to or less than 4. It is thus possible to provide a thin-film transistor having excellent characteristics and high reliability, a method of manufacturing the same, and a display device including the thin-film transistor mounted thereon.
    • 根据本发明的实施例的制造薄膜晶体管的方法包括在栅电极上形成栅极绝缘体的步骤。 栅极绝缘体至少包括与氢化非晶硅膜接触的第一区域和位于第一区域下方的第二区域。 使用包括NH 3,N 2和SiH 4,H 2气体或H 2和He的混合物的源气体来沉积第一和第二区域。 通过将流量比NH3 / SiH4设定在11〜14的范围内来沉积第一区域,并且通过将流量比NH3 / SiH4设定为等于或小于4来沉积第二区域。因此 可以提供具有优异特性和高可靠性的薄膜晶体管,其制造方法以及安装在其上的薄膜晶体管的显示装置。