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    • 5. 发明授权
    • Circuit and method to convert a single ended signal to duplicated signals
    • 将单端信号转换为重复信号的电路和方法
    • US07538593B2
    • 2009-05-26
    • US11710270
    • 2007-02-23
    • Prabhat AgarwalMayank GoelPradip Mandal
    • Prabhat AgarwalMayank GoelPradip Mandal
    • G06F1/04
    • H03K5/151
    • A circuit to convert a single ended signal to differential signals is disclosed. The circuit has two paths with each of the two paths comprising a plurality of stages. The number of stages in each of the two paths is the same. A first path of the two paths includes a buffer stage and at least one inverter stage. A second path of the two paths includes at least two inverter stages. The buffer stage has a delay matched to that of a first inverter stage of the second path. The buffer stage comprises a first pair of transistors comprising a first transistor of a first category operatively connected to a first transistor of a second category with their channel connections being connected in series.
    • 公开了将单端信号转换为差分信号的电路。 该电路具有两条路径,其中两条路径中的每条路径包括多个级。 两个路径中的每个路段的数量是相同的。 两个路径的第一路径包括缓冲段和至少一个逆变器级。 两路径的第二路径包括至少两个逆变器级。 缓冲级具有与第二路径的第一反相器级的延迟匹配的延迟。 缓冲级包括第一对晶体管,其包括第一类别的第一晶体管,其可操作地连接到第二类别的第一晶体管,其沟道连接串联连接。
    • 10. 发明授权
    • Implementation of avalanche photo diodes in (Bi)CMOS processes
    • (Bi)CMOS工艺中雪崩光电二极管的实现
    • US07759650B2
    • 2010-07-20
    • US12298206
    • 2007-04-10
    • Anco HeringaThomas FrachPrabhat Agarwal
    • Anco HeringaThomas FrachPrabhat Agarwal
    • G01T1/24
    • H01L31/115H01L27/1446H01L31/107H01L31/1804Y02E10/547Y02P70/521
    • A radiation detector (46) includes a semiconductor layer(s) (12) formed on a substrate (14) and a scintillator (30) formed on the semiconductor layer(s) (12). The semiconductor layer(s) (12) includes an n-doped region (16) disposed adjacent to the substrate (14), and a p-doped region (18) disposed adjacent to the n-doped region (16). A trench (20) is formed within the semiconductor layer(s) (12) and around the p-doped region (18) and is filled with a material (22) that reduces pn junction curvature at the edges of the pn junction, which reduces breakdown at the edges. The scintillator (30) is disposed over and optically coupled to the p-doped regions (18). The radiation detector (46) further includes at least one conductive electrode (24) that electrically contacts the n-doped region.
    • 辐射检测器(46)包括形成在衬底(14)上的半导体层(12)和形成在半导体层(12)上的闪烁体(30)。 半导体层(12)包括邻近衬底(14)设置的n掺杂区域(16)和邻近于n掺杂区域(16)设置的p掺杂区域(18)。 沟槽(20)形成在半导体层(12)内并且围绕p掺杂区域(18)并且填充有减小pn结边缘处的pn结曲率的材料(22),其中 减少边缘的破坏。 闪烁体(30)设置在p掺杂区域(18)上并且光耦合到p掺杂区域(18)。 辐射检测器(46)还包括与n掺杂区域电接触的至少一个导电电极(24)。