专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20190250386A1 FLUORESCENCE OBSERVATION DEVICE 审中-公开
公开(公告)号：US20190250386A1
公开(公告)日：2019-08-15
申请号：US16394857
申请日：2019-04-25
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE
IPC分类号： G02B21/00 , G01N21/64 , G02B21/16
CPC分类号： G02B21/0032 , G01N21/64 , G01N21/6458 , G02B21/0048 , G02B21/06 , G02B21/16 , G02B26/10
摘要： A fluorescence observation device includes: a first intensity-modulating unit that intensity-modulates, at a frequency f1, pump light that excites fluorescence of an observed subject; a second intensity-modulating unit that intensity-modulates, at a frequency f2 different from the frequency f1, probe light that induces stimulated emission of the observed subject; a light-receiving unit that receives the fluorescence from the observed subject irradiated with the intensity-modulated pump light and probe light; and a sensing unit that senses a component with a frequency of i×f1±j×f2 (i and j are positive integers, at least one of which is equal to or larger than two) in a reception-light signal sensed at the light-receiving unit.

2. 发明申请

US20190235223A1 STRUCTURED ILLUMINATION MICROSCOPE, STRUCTURED ILLUMINATION METHOD, AND PROGRAM 审中-公开
公开(公告)号：US20190235223A1
公开(公告)日：2019-08-01
申请号：US16377634
申请日：2019-04-08
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE , Ryosuke KOMATSU , Yosuke SHIMIZU
IPC分类号： G02B21/08 , G02B27/58 , G02B21/00 , H04N5/232 , G02F1/137 , G02F1/29 , G02B21/36 , G02B21/06
摘要： A structured illumination microscope includes a spatial light modulator containing ferroelectric liquid crystals, an interference optical system for illuminating a specimen with an interference fringe generated by making lights from the spatial light modulator interfere with each other, a controller for applying a voltage pattern having a predetermined voltage value distribution to the ferroelectric liquid crystals, an image forming optical system for forming an image of the specimen, which has been irradiated with the interference fringe, an imaging element for generating an image by imaging the image formed by the image forming optical system, and a demodulating part for generating a demodulated image using a plurality of images, wherein the controller applies an image generation voltage pattern for generating the demodulated images and a burn-in prevention voltage pattern calculated based on the image generation voltage pattern to the ferroelectric liquid crystals.

3. 发明申请

US20160320600A1 STRUCTURED ILLUMINATION MICROSCOPE, STRUCTURED ILLUMINATION METHOD, AND PROGRAM 有权
标题翻译：结构照明显微镜，结构照明方法和程序
公开(公告)号：US20160320600A1
公开(公告)日：2016-11-03
申请号：US15103646
申请日：2014-12-11
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE , Ryosuke KOMATSU , Yosuke SHIMIZU
IPC分类号： G02B21/08 , G02B21/00 , H04N5/232 , G02B21/36 , G02F1/29 , G02F1/137 , G02B27/58
CPC分类号： G02B21/082 , G01N21/6458 , G02B21/0032 , G02B21/0056 , G02B21/0068 , G02B21/008 , G02B21/06 , G02B21/367 , G02B27/58 , G02F1/13768 , G02F1/141 , G02F1/292 , G09G3/3629 , H04N5/232
摘要： A structured illumination microscope includes a spatial light modulator containing ferroelectric liquid crystals, an interference optical system for illuminating a specimen with an interference fringe generated by making lights from the spatial light modulator interfere with each other, a controller for applying a voltage pattern having a predetermined voltage value distribution to the ferroelectric liquid crystals, an image forming optical system for forming an image of the specimen, which has been irradiated with the interference fringe, an imaging element for generating an image by imaging the image formed by the image forming optical system, and a demodulating part for generating a demodulated image using a plurality of images, wherein the controller applies an image generation voltage pattern for generating the demodulated images and a burn-in prevention voltage pattern calculated based on the image generation voltage pattern to the ferroelectric liquid crystals.
摘要翻译：一种结构化照明显微镜，包括：含有铁电液晶的空间光调制器，用于使来自空间光调制器的光产生的干涉条纹照射样本的干涉光学系统相互干涉;控制器，用于施加具有预定对铁电液晶的电压值分布，用于形成已经被干涉条纹照射的样本的图像的成像光学系统，用于通过对由图像形成光学系统形成的图像进行成像而生成图像的成像元件，以及解调部，其使用多个图像生成解调图像，其中，所述控制器将用于生成所述解调图像的图像生成电压图案和基于所述图像生成电压图案计算出的预防电压图案应用于所述铁电液晶。

4. 发明申请

US20150211997A1 LIGHTING DEVICE AND MICROSCOPE, AND LIGHTING METHOD AND OBSERVATION METHOD 审中-公开
标题翻译：照明装置和显微镜，以及照明方法和观察方法
公开(公告)号：US20150211997A1
公开(公告)日：2015-07-30
申请号：US14683507
申请日：2015-04-10
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE
IPC分类号： G01N21/64 , G02F1/11 , G02F1/21
CPC分类号： G01N21/64 , G01N21/6458 , G01N2201/063 , G02B21/0032 , G02B21/367 , G02F1/11 , G02F1/21
摘要： An illumination apparatus including: a traveling wave forming unit that is disposed in an optical path of a light flux emitted from a light source unit and that is configured to form a sonic traveling wave in a direction traversing the emitted light flux; and an illumination optical system that is configured to form, on a plane to be observed, position-variable interference fringes caused by a plurality of diffracted light beams generated from the traveling wave forming unit.
摘要翻译：一种照明装置，包括：行波形成单元，其设置在从光源单元发射的光束的光路中，并且被构造成在穿过所述发射光束的方向上形成声波; 以及照明光学系统，被配置为在待观察的平面上形成由从行波形成单元产生的多个衍射光束引起的位置变化的干涉条纹。

5. 发明申请

US20170082545A1 SUPER-RESOLUTION OBSERVATION DEVICE AND SUPER-RESOLUTION OBSERVATION METHOD 审中-公开
公开(公告)号：US20170082545A1
公开(公告)日：2017-03-23
申请号：US15275707
申请日：2016-09-26
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE , Tomoko UJIKE , Hiroki YAZAWA
IPC分类号： G01N21/64 , G01N21/65 , G02B21/00
CPC分类号： G01N21/6458 , G01N21/6445 , G01N21/65 , G01N2021/653 , G01N2201/0675 , G02B21/0032 , G02B21/0076 , G02B21/0096
摘要： A super-resolution observation device includes an illumination optical system collecting a first illuminating light having a first optical frequency co, on a first region of an observation object, collecting a second illuminating light having a second optical frequency ω2′ on a second region partially overlapping the first region, and collecting a third illuminating light having a third optical frequency ω2 on a third region containing a non-overlap region which is a region of the first region and does not overlap the second region; and an extraction unit extracting a signal light generated in accordance with a change in an energy level of a substance in the non-overlap region from a light generated in all of the first region, the second region, and the third region.

6. 发明申请

US20170038300A1 STRUCTURED ILLUMINATION MICROSCOPIC DEVICE AND STRUCTURED ILLUMINATION OBSERVATION METHOD 审中-公开
标题翻译：结构照明微观器件和结构化照明观察方法
公开(公告)号：US20170038300A1
公开(公告)日：2017-02-09
申请号：US15298864
申请日：2016-10-20
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE , Hiroki YAZAWA
IPC分类号： G01N21/64 , G02B21/06 , G02B21/36 , G02B21/16
CPC分类号： G01N21/6458 , G01N21/6428 , G01N2021/6439 , G01N2201/06113 , G01N2201/0697 , G01N2201/12 , G02B21/0032 , G02B21/0056 , G02B21/0072 , G02B21/06 , G02B21/16 , G02B21/36 , G02B21/367
摘要： A structured illumination microscopic device includes a first spatial modulation unit spatially modulating a fluorescent sample using an excitation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ω1 for shifting a fluorescent substance to an excitation level; a second spatial modulation unit spatially modulating the fluorescent sample using a stimulation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency ω2 for shifting the excited fluorescent substance to a base level; and an imaging unit obtaining, as a modulated image, an image of the fluorescent sample with spontaneously emitted light generated at the fluorescent sample in accordance with the excitation light and the stimulation light.
摘要翻译：一种结构化照明显微镜装置，包括：第一空间调制单元，其使用具有空间频率K的正弦照明分布且具有用于将荧光物质移动到激发电平的光频率ω1的激发光对荧光样品进行空间调制; 使用具有空间频率K的正弦照明分布并且具有用于将激发的荧光物质移动到基准电平的光频率ω2的刺激光对荧光样品进行空间调制的第二空间调制单元; 以及成像单元，其根据所述激发光和所述刺激光获得在所述荧光样品处产生的自发发射的光的荧光样品的图像作为调制图像。

7. 发明申请

US20130286182A1 FOCUS POSITION MAINTAINING APPARATUS, AND MICROSCOPE 有权
标题翻译：重点定位装置和显微镜
公开(公告)号：US20130286182A1
公开(公告)日：2013-10-31
申请号：US13927747
申请日：2013-06-26
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE
IPC分类号： H04N7/18
CPC分类号： H04N7/18 , G02B3/0056 , G02B21/244
摘要： A focus position maintaining apparatus and a microscope are provided. The focus position maintaining apparatus can three-dimensionally correct a shift of a specimen in real time to maintain the focal point of an objective lens in a desired position in the specimen, and the microscope includes the focus position maintaining apparatus. The focus position maintaining apparatus includes a microlens array having a plurality of unit lenses and disposed in a position where the microlens array receives light from a specimen via an objective lens, a focus imaging device disposed in a position where the focus imaging device receives light from the unit lenses of the microlens array, and a control unit that outputs a signal for controlling operation of a focus actuator based on image formation positions of a plurality of images of the specimen detected by the focus imaging device via the microlens array.
摘要翻译：提供了聚焦位置维持装置和显微镜。聚焦位置维持装置能够实时地三维地校正试样的移动，将物镜的焦点保持在试样的期望位置，显微镜包括聚焦位置保持装置。聚焦位置维持装置包括具有多个单位透镜并且设置在微透镜阵列经由物镜从样本接收光的位置的微透镜阵列，焦点成像装置设置在焦点成像装置接收光的位置微透镜阵列的单位透镜，以及控制单元，其基于由聚焦成像装置经由微透镜阵列检测到的样本的多个图像的图像形成位置，输出用于控制聚焦致动器的操作的信号。

8. 发明申请

US20180238803A1 STRUCTURED ILLUMINATION MICROSCOPE, OBSERVATION METHOD, AND STORAGE MEDIUM 审中-公开
公开(公告)号：US20180238803A1
公开(公告)日：2018-08-23
申请号：US15956795
申请日：2018-04-19
申请人： NIKON CORPORATION
发明人： Hisao OSAWA , Fumihiro DAKE
IPC分类号： G01N21/64 , G02B21/08 , G02B27/58 , G02B21/00 , G02B21/16
CPC分类号： G01N21/6458 , G02B21/0092 , G02B21/08 , G02B21/082 , G02B21/16 , G02B21/367 , G02B27/58
摘要： A structured illumination microscope includes: a brancher that includes a first substrate on which a plurality of pixel electrodes are provided; a second substrate opposed to the first substrate; and a ferroelectric liquid crystal disposed between the first substrate and the second substrate, and branches light from a light source into diffracted light beams; an illumination optical system that illuminates a sample with interference fringes formed by at least some of the diffracted light beams; an imaging device that forms an image of the sample irradiated with the interference fringes; a demodulator; and a controller that controls a direction and a phase of the interference fringes. In one frame period during which the imaging device takes the image, the controller applies a first voltage pattern and a second voltage pattern obtained by inverting the first voltage pattern to at least some of the pixel electrodes.

9. 发明申请

US20170082546A1 SUPER-RESOLUTION OBSERVATION DEVICE AND SUPER-RESOLUTION OBSERVATION METHOD 审中-公开
公开(公告)号：US20170082546A1
公开(公告)日：2017-03-23
申请号：US15276397
申请日：2016-09-26
申请人： NIKON CORPORATION
发明人： Fumihiro DAKE , Hiroki YAZAWA
IPC分类号： G01N21/64 , G02B21/36 , G02B21/16 , G01N21/63 , G02B21/08 , G02F1/11
CPC分类号： G01N21/6458 , G01N21/636 , G01N2201/0675 , G01N2201/0697 , G02B21/0076 , G02B21/0084 , G02B21/086 , G02B21/16 , G02B21/367 , G02B27/58 , G02F1/11
摘要： A super-resolution observation device includes an illumination optical system that focus a first illuminating light at optical frequency ω1 and a second illuminating light at optical frequency ω2 on a region of an observation object plane; a modulation unit that modulates a property of the first illuminating light heading toward the region at a modulation frequency fm; and an extraction unit that extracts a component at the optical frequency ω1 or ω2 from a light generated in the region according to the first illuminating light and the second illuminating light, the component of which the property changes at a frequency higher than the modulation frequency fm.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式