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    • 1. 发明申请
    • Liquid crystal display apparatus
    • 液晶显示装置
    • US20080002129A1
    • 2008-01-03
    • US11805911
    • 2007-05-25
    • Sun-Kyu JooMyung-Sub LeeYun-Seok Lee
    • Sun-Kyu JooMyung-Sub LeeYun-Seok Lee
    • G02F1/1343
    • G02F1/133707G02F1/13394G02F2001/134318
    • Disclosed is a liquid crystal display device including a first substrate where pixel areas are defined, a second substrate facing the first substrate, liquid crystals aligned between the first and second substrates, and spacers that maintain a gap between the first and second substrates. The pixel areas are divided into a plurality of domains along the alignment direction of the liquid crystals by way of domain dividers. Optical characteristics are compensated in different domains, so that the viewing angle of the liquid crystal display device is increased. The display quality of the liquid crystal display device is improved by adjusting the shape and position of the domain dividers and the spacers.
    • 公开了一种液晶显示装置,其包括限定像素区域的第一基板,面向第一基板的第二基板,在第一和第二基板之间排列的液晶,以及保持第一和第二基板之间的间隙的间隔件。 像素区域通过畴分割器沿着液晶的排列方向分成多个畴。 光学特性在不同的区域中被补偿,使得液晶显示装置的视角增加。 液晶显示装置的显示质量通过调整分割器和间隔物的形状和位置来改善。
    • 2. 发明授权
    • Liquid crystal display apparatus
    • 液晶显示装置
    • US08081279B2
    • 2011-12-20
    • US11805911
    • 2007-05-25
    • Sun-Kyu JooMyung-Sub LeeYun-Seok Lee
    • Sun-Kyu JooMyung-Sub LeeYun-Seok Lee
    • G02F1/1339
    • G02F1/133707G02F1/13394G02F2001/134318
    • Disclosed is a liquid crystal display device including a first substrate where pixel areas are defined, a second substrate facing the first substrate, liquid crystals aligned between the first and second substrates, and spacers that maintain a gap between the first and second substrates. The pixel areas are divided into a plurality of domains along the alignment direction of the liquid crystals by way of domain dividers. Optical characteristics are compensated in different domains, so that the viewing angle of the liquid crystal display device is increased. The display quality of the liquid crystal display device is improved by adjusting the shape and position of the domain dividers and the spacers.
    • 公开了一种液晶显示装置,其包括限定像素区域的第一基板,面向第一基板的第二基板,在第一和第二基板之间排列的液晶,以及保持第一和第二基板之间的间隙的间隔件。 像素区域通过畴分割器沿着液晶的排列方向分成多个畴。 光学特性在不同的区域中被补偿,使得液晶显示装置的视角增加。 液晶显示装置的显示质量通过调整分割器和间隔物的形状和位置来改善。
    • 6. 发明申请
    • DISPLAY PANEL AND MANUFACTURING METHOD OF THE SAME
    • 显示面板及其制造方法
    • US20100156827A1
    • 2010-06-24
    • US12614377
    • 2009-11-06
    • Sun-Kyu JooJu-Hyeon BaekJi-Young JeongSung-Man KimMyung-Sub Lee
    • Sun-Kyu JooJu-Hyeon BaekJi-Young JeongSung-Man KimMyung-Sub Lee
    • G06F3/041H01H11/00
    • G06F3/0418G02F1/13338G02F1/13394G02F1/136259G02F2001/13396G02F2201/508G06F3/0412Y10T29/49105
    • Provided are a display panel which can detect a touch position derived from a user's touch and can prevent erroneous touch position data from being generated even when an erroneous connection to a position sensing line is present due a processing deviation or a cell gap deviation, and a manufacturing method of the same. The display panel includes a first substrate, a first sensor pad that is formed on the first substrate, a second sensor pad that is spaced apart from the first sensor pad, a second substrate that is disposed to face the first substrate, a first sensor spacer that is formed on the second substrate to overlap the first sensor pad and protrudes toward the first substrate, a second sensor spacer that is formed on the second substrate to overlap the second sensor pad and protrudes toward the first substrate, and a sensor electrode that is formed on the first sensor spacer and the second sensor spacer to overlap the first sensor pad and the second sensor pad, wherein the second sensor spacer protrudes toward the first substrate more than the first sensor spacer does.
    • 提供了一种显示面板,其可以检测从用户的触摸导出的触摸位置,并且即使当由于处理偏差或单元格间隙偏差而存在与位置感测线的错误连接时也可以防止错误的触摸位置数据,并且 制造方法相同。 显示面板包括第一基板,形成在第一基板上的第一传感器垫,与第一传感器垫间隔开的第二传感器垫,与第一基板相对设置的第二基板,第一传感器间隔件 形成在所述第二基板上以与所述第一传感器焊盘重叠并朝向所述第一基板突出的第二传感器间隔件,形成在所述第二基板上以与所述第二传感器焊盘重叠并朝向所述第一基板突出的第二传感器间隔件, 形成在所述第一传感器间隔物和所述第二传感器间隔物上以与所述第一传感器垫和所述第二传感器垫重叠,其中所述第二传感器间隔物比所述第一传感器间隔物更向第一基底突出。
    • 7. 发明授权
    • Sensitivity touch display panel and manufacturing method of the same
    • 灵敏度触摸显示面板及其制造方法相同
    • US08400412B2
    • 2013-03-19
    • US12614377
    • 2009-11-06
    • Sun-Kyu JooJu-Hyeon BaekJi-Young JeongSung-Man KimMyung-Sub Lee
    • Sun-Kyu JooJu-Hyeon BaekJi-Young JeongSung-Man KimMyung-Sub Lee
    • G06F3/041
    • G06F3/0418G02F1/13338G02F1/13394G02F1/136259G02F2001/13396G02F2201/508G06F3/0412Y10T29/49105
    • Provided are a display panel which can detect a touch position derived from a user's touch and can prevent erroneous touch position data from being generated even when an erroneous connection to a position sensing line is present due a processing deviation or a cell gap deviation, and a manufacturing method of the same. The display panel includes a first substrate, a first sensor pad that is formed on the first substrate, a second sensor pad that is spaced apart from the first sensor pad, a second substrate that is disposed to face the first substrate, a first sensor spacer that is formed on the second substrate to overlap the first sensor pad and protrudes toward the first substrate, a second sensor spacer that is formed on the second substrate to overlap the second sensor pad and protrudes toward the first substrate, and a sensor electrode that is formed on the first sensor spacer and the second sensor spacer to overlap the first sensor pad and the second sensor pad, wherein the second sensor spacer protrudes toward the first substrate more than the first sensor spacer does.
    • 提供了一种显示面板,其可以检测从用户的触摸导出的触摸位置,并且即使当由于处理偏差或单元格间隙偏差而存在与位置感测线的错误连接时也可以防止错误的触摸位置数据,并且 制造方法相同。 显示面板包括第一基板,形成在第一基板上的第一传感器垫,与第一传感器垫间隔开的第二传感器垫,与第一基板相对设置的第二基板,第一传感器间隔件 形成在所述第二基板上以与所述第一传感器焊盘重叠并朝向所述第一基板突出的第二传感器间隔件,形成在所述第二基板上以与所述第二传感器焊盘重叠并朝向所述第一基板突出的第二传感器间隔件, 形成在所述第一传感器间隔物和所述第二传感器间隔物上以与所述第一传感器垫和所述第二传感器垫重叠,其中所述第二传感器间隔物比所述第一传感器间隔物更向第一基底突出。
    • 8. 发明授权
    • Method for detecting defects in a substrate having a semiconductor device thereon
    • 用于检测其上具有半导体器件的衬底中的缺陷的方法
    • US08055057B2
    • 2011-11-08
    • US12007680
    • 2008-01-14
    • Moon-Shik KangJong-An KimMyung-Sub LeeYu-Sin YangJi-Hye Kim
    • Moon-Shik KangJong-An KimMyung-Sub LeeYu-Sin YangJi-Hye Kim
    • G06K9/00
    • G01N21/95607G01N21/9501G06T7/0006G06T2207/30148
    • An inspection apparatus and a method for detecting defects in a substrate having a semiconductor device thereon are provided. The method includes establishing a first inspection region including first patterns repeatedly formed in a first direction and a second inspection region including second patterns repeatedly formed in a second direction on the substrate, determining a first unit inspection size of the first inspection region and a second unit inspection size of the second inspection region, obtaining images of the first and second patterns by moving the substrate in the first direction, and detecting defects in the first and second inspection regions by comparing the obtained images of portions of the first and second inspection regions, respectively, with each other. The first inspection size and second inspection size function as comparison units if defects are detected. The substrate may face an image receiving member.
    • 提供一种用于检测其上具有半导体器件的衬底中的缺陷的检查装置和方法。 该方法包括建立包括在第一方向上重复形成的第一图案的第一检查区域和包括在基板上沿第二方向重复形成的第二图案的第二检查区域,确定第一检查区域的第一单位检查尺寸和第二单元检查区域 第二检查区域的检查尺寸,通过沿第一方向移动基板获得第一图案和第二图案的图像,并且通过比较获得的第一和第二检查区域的部分的图像来检测第一和第二检查区域中的缺陷, 分别彼此。 如果检测到缺陷,则第一检查尺寸和第二检查尺寸用作比较单元。 基板可面向图像接收部件。
    • 10. 发明申请
    • Method for detecting defects in a substrate having a semiconductor device thereon
    • 用于检测其上具有半导体器件的衬底中的缺陷的方法
    • US20080172196A1
    • 2008-07-17
    • US12007680
    • 2008-01-14
    • Moon-Shik KangJong-An KimMyung-Sub LeeYu-Sin YangJi-Hye Kim
    • Moon-Shik KangJong-An KimMyung-Sub LeeYu-Sin YangJi-Hye Kim
    • G06F19/00
    • G01N21/95607G01N21/9501G06T7/0006G06T2207/30148
    • An inspection apparatus and a method for detecting defects in a substrate having a semiconductor device thereon are provided. The method includes establishing a first inspection region including first patterns repeatedly formed in a first direction and a second inspection region including second patterns repeatedly formed in a second direction on the substrate, determining a first unit inspection size of the first inspection region and a second unit inspection size of the second inspection region, obtaining images of the first and second patterns by moving the substrate in the first direction, and detecting defects in the first and second inspection regions by comparing the obtained images of portions of the first and second inspection regions, respectively, with each other. The first inspection size and second inspection size function as comparison units if defects are detected. The substrate may face an image receiving member.
    • 提供一种用于检测其上具有半导体器件的衬底中的缺陷的检查装置和方法。 该方法包括建立包括在第一方向上重复形成的第一图案的第一检查区域和包括在基板上沿第二方向重复形成的第二图案的第二检查区域,确定第一检查区域的第一单位检查尺寸和第二单元检查区域 第二检查区域的检查尺寸,通过沿第一方向移动基板获得第一图案和第二图案的图像,并且通过比较获得的第一和第二检查区域的部分的图像来检测第一和第二检查区域中的缺陷, 分别彼此。 如果检测到缺陷,则第一检查尺寸和第二检查尺寸用作比较单元。 基板可面向图像接收部件。