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1. 发明授权

US08169390B2 Liquid crystal display 有权
标题翻译：液晶显示器
公开(公告)号：US08169390B2
公开(公告)日：2012-05-01
申请号：US12011779
申请日：2008-01-28
申请人： Moon-Shik Kang , Inn-Sung Lee , Song-Yi Han
发明人： Moon-Shik Kang , Inn-Sung Lee , Song-Yi Han
IPC分类号： G09G3/36
CPC分类号： G09G3/3406 , G02F1/133604 , G09G3/3648 , G09G2320/0261 , G09G2320/0285 , G09G2320/0633 , G09G2320/064 , G09G2320/0646 , G09G2330/02 , G09G2360/16
摘要： The present invention relates to a method of controlling luminance of a backlight based on a processed image data after receiving information of image data, in order to improve the visibility of moving picture. An inverter according to the present invention includes a first block generating a first luminance control signal with an analog value depending on the luminance control signal with a duty ratio depending on a synchronization signal. The luminance control signals generated by the respective blocks are synthesized luminance control signal. Accordingly, a liquid crystal display employing two backlight control methods can be provided. Thus, it is possible to remove the drag phenomenon of a screen and, at the same time, to improve the visibility for moving picture.
摘要翻译：本发明涉及一种在接收到图像数据的信息之后基于经处理的图像数据控制背光的亮度的方法，以便提高运动图像的可视性。根据本发明的逆变器包括：第一块，其根据具有取决于同步信号的占空比的亮度控制信号产生具有模拟值的第一亮度控制信号。由各个块产生的亮度控制信号是合成亮度控制信号。因此，可以提供采用两种背光控制方法的液晶显示器。因此，可以消除屏幕的拖动现象，并且同时提高运动图像的可视性。

2. 发明授权

US08058813B2 Backlight unit and liquid crystal display device including the same 有权
标题翻译：背光单元和包括其的液晶显示装置
公开(公告)号：US08058813B2
公开(公告)日：2011-11-15
申请号：US12207639
申请日：2008-09-10
申请人： Jin-Won Jang , Jheen-Hyeok Park , Moon-Shik Kang
发明人： Jin-Won Jang , Jheen-Hyeok Park , Moon-Shik Kang
IPC分类号： H05B37/00
CPC分类号： H05B41/2827 , G02F2001/133612 , G09G3/342
摘要： A backlight unit of a liquid crystal display includes a lamp, a balancing pattern capacitor electrically connected to the lamp for current balance, a transformer electrically connected to the lamp via the balancing pattern capacitor, a sensing pattern capacitor electrically connected to a terminal of the balancing pattern capacitor connected to the lamp to detect an abnormal driving state of the lamp, and a feedback circuit unit electrically connected to the sensing pattern capacitor to control the abnormal driving state of the lamp. A liquid crystal display device including the backlight unit is also disclosed.
摘要翻译：液晶显示器的背光单元包括灯，电连接到用于电流平衡的灯的平衡图形电容器，通过平衡图形电容器电连接到灯的变压器，电连接到平衡端子的感测图案电容器连接到灯的图案电容器以检测灯的异常驱动状态，以及电连接到感测图案电容器以控制灯的异常驱动状态的反馈电路单元。还公开了包括背光单元的液晶显示装置。

3. 发明授权

US08055057B2 Method for detecting defects in a substrate having a semiconductor device thereon 失效
标题翻译：用于检测其上具有半导体器件的衬底中的缺陷的方法
公开(公告)号：US08055057B2
公开(公告)日：2011-11-08
申请号：US12007680
申请日：2008-01-14
申请人： Moon-Shik Kang , Jong-An Kim , Myung-Sub Lee , Yu-Sin Yang , Ji-Hye Kim
发明人： Moon-Shik Kang , Jong-An Kim , Myung-Sub Lee , Yu-Sin Yang , Ji-Hye Kim
IPC分类号： G06K9/00
CPC分类号： G01N21/95607 , G01N21/9501 , G06T7/0006 , G06T2207/30148
摘要： An inspection apparatus and a method for detecting defects in a substrate having a semiconductor device thereon are provided. The method includes establishing a first inspection region including first patterns repeatedly formed in a first direction and a second inspection region including second patterns repeatedly formed in a second direction on the substrate, determining a first unit inspection size of the first inspection region and a second unit inspection size of the second inspection region, obtaining images of the first and second patterns by moving the substrate in the first direction, and detecting defects in the first and second inspection regions by comparing the obtained images of portions of the first and second inspection regions, respectively, with each other. The first inspection size and second inspection size function as comparison units if defects are detected. The substrate may face an image receiving member.
摘要翻译：提供一种用于检测其上具有半导体器件的衬底中的缺陷的检查装置和方法。该方法包括建立包括在第一方向上重复形成的第一图案的第一检查区域和包括在基板上沿第二方向重复形成的第二图案的第二检查区域，确定第一检查区域的第一单位检查尺寸和第二单元检查区域第二检查区域的检查尺寸，通过沿第一方向移动基板获得第一图案和第二图案的图像，并且通过比较获得的第一和第二检查区域的部分的图像来检测第一和第二检查区域中的缺陷，分别彼此。如果检测到缺陷，则第一检查尺寸和第二检查尺寸用作比较单元。基板可面向图像接收部件。

4. 发明申请

US20080219547A1 METHOD OF ANALYZING A WAFER SAMPLE 失效
标题翻译：分析样品的方法
公开(公告)号：US20080219547A1
公开(公告)日：2008-09-11
申请号：US12041127
申请日：2008-03-03
申请人： Jong-An Kim , Yu-Sin Yang , Chung-Sam Jun , Moon-Shik Kang , Ji-Hye Kim
发明人： Jong-An Kim , Yu-Sin Yang , Chung-Sam Jun , Moon-Shik Kang , Ji-Hye Kim
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G01N21/95607 , G06T2207/10061 , G06T2207/30148
摘要： In a method of analyzing a wafer sample, a first defect of a photoresist pattern on the wafer sample having shot regions exposed with related exposure conditions is detected. A first portion of the pattern includes the shot regions exposed with an exposure condition corresponding to a reference exposure condition and a tolerance error range of the reference exposure condition. The first defect repeatedly existing in at least two of the shot regions in a second portion of the pattern is set up as a second defect of the pattern. A first reference image displaying the second defect is obtained. The first defect of the shot regions in the first portion corresponding to the second defect is set up as a third defect corresponding to weak points of the pattern. The exposure conditions of the shot region having no weak points are set up as an exposure margin of an exposure process.
摘要翻译：在分析晶片样品的方法中，检测具有用相关曝光条件曝光的拍摄区域的晶片样品上的光致抗蚀剂图案的第一缺陷。图案的第一部分包括用与参考曝光条件相对应的曝光条件和参考曝光条件的公差误差范围暴露的照射区域。在图案的第二部分中的至少两个拍摄区域中重复存在的第一缺陷被设置为图案的第二缺陷。获得显示第二缺陷的第一参考图像。对应于第二缺陷的第一部分中的拍摄区域的第一缺陷被设置为对应于图案的弱点的第三缺陷。没有弱点的照射区域的曝光条件被设置为曝光处理的曝光余量。

5. 发明申请

US20080137385A1 LAMP DRIVING CIRCUIT AND DISPLAY APPARATUS HAVING THE SAME 失效
标题翻译：灯具驱动电路及其显示装置
公开(公告)号：US20080137385A1
公开(公告)日：2008-06-12
申请号：US11933006
申请日：2007-10-31
申请人： Moon-Shik KANG
发明人： Moon-Shik KANG
IPC分类号： H02M7/5387
CPC分类号： H05B41/2827 , G09G3/3406 , G09G2320/064 , H05B41/2828
摘要： A lamp driving circuit includes: a first voltage generator which receives a direct current power voltage and outputs a first square wave voltage in response to a first switching signal and a second switching signal having a phase inverted with respect to the first switching signal; a second voltage generator which outputs a second square wave voltage in response to a third switching signal having a phase shifted by a predetermined time with respect to the phase of the first switching signal and a fourth switching signal having a phase inverted with respect to the phase of the third switching signal; and a transformer which receives the first square wave voltage and the second square wave voltage and boosts a first driving voltage defined by an electric potential difference therebetween to a second driving voltage and applies the second driving voltage to a lamp.
摘要翻译：灯驱动电路包括：第一电压发生器，其接收直流电源电压并响应于第一开关信号输出第一方波电压，并输出相对于第一开关信号相位反相的第二开关信号; 第二电压发生器，其响应于相对于第一开关信号的相位相移了预定时间的第三开关信号输出第二方波电压，以及相对于相位相位反相的第四开关信号的第三开关信号; 以及变压器，其接收第一方波电压和第二方波电压，并将由其间的电位差限定的第一驱动电压提升到第二驱动电压，并将第二驱动电压施加到灯。

6. 发明申请

US20080116819A1 LIQUID CRYSTAL DISPLAY DEVICE 有权
标题翻译：液晶显示装置
公开(公告)号：US20080116819A1
公开(公告)日：2008-05-22
申请号：US11930772
申请日：2007-10-31
申请人： Yun-gun LEE , Moon-shik KANG , Min-soo CHOI
发明人： Yun-gun LEE , Moon-shik KANG , Min-soo CHOI
IPC分类号： H05B41/36 , H02M7/44
CPC分类号： G02F1/133604 , G02F2001/133334 , G02F2001/133612
摘要： A liquid crystal display device includes a liquid crystal display panel, a lamp disposed behind the liquid crystal display panel, a cover accommodating the lamp, and an inverter disposed behind the cover. The inverter includes a substrate and a transformer mounted on the substrate and driving the lamp. The transformer includes a core and a coil that is wound around at least a part of the core. The liquid crystal display panel further includes a transformer cover which covers the coil, an inverter cover which covers the inverter and the transformer cover, and a metal member in the transformer cover.
摘要翻译：液晶显示装置包括液晶显示面板，设置在液晶显示面板后面的灯，容纳灯的盖和设置在盖后面的逆变器。逆变器包括安装在基板上并驱动灯的基板和变压器。该变压器包括一个磁芯和缠绕在磁芯的至少一部分上的线圈。液晶显示面板还包括覆盖线圈的变压器盖，覆盖逆变器的变换器盖和变压器盖，以及变压器盖中的金属构件。

7. 发明申请

US20080112608A1 Method of detecting defects in patterns and apparatus for performing the same 有权
标题翻译：检测图案中的缺陷的方法及其执行方法
公开(公告)号：US20080112608A1
公开(公告)日：2008-05-15
申请号：US11979776
申请日：2007-11-08
申请人： Yu-Sin Yang , Chung-Sam Jun , Jong-An Kim , Moon-Shik Kang , Ji-Hye Kim
发明人： Yu-Sin Yang , Chung-Sam Jun , Jong-An Kim , Moon-Shik Kang , Ji-Hye Kim
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G06T2207/10056 , G06T2207/20056 , G06T2207/30148
摘要： In a method of detecting defects in patterns and an apparatus for performing the method, a first image of a detection region on a semiconductor substrate may be acquired. A second image may be acquired from the first image by performing a Fourier transform and performing a low pass filtering. The second image may be compared with a reference image so that the defects of the detection region are detected. Existence of the defect of the second image is determined using a relation value between a grey level of each of pixels of the second image and the reference image, respectively. When a defect exists, the horizontal and the vertical positions of the pixel where the relation value is minimum are combined to determine the position of the defect.
摘要翻译：在检测图案中的缺陷的方法和执行该方法的装置中，可以获取半导体衬底上的检测区域的第一图像。可以通过执行傅里叶变换并执行低通滤波从第一图像获取第二图像。可以将第二图像与参考图像进行比较，从而检测出检测区域的缺陷。使用第二图像的每个像素的灰度级与参考图像之间的关系值来确定第二图像的缺陷的存在。当存在缺陷时，组合关系值最小的像素的水平和垂直位置以确定缺陷的位置。

8. 发明申请

US20080094001A1 POWER SUPPLY APPARATUS, BACKLIGHT ASSEMBLY AND LIQUID CRYSTAL DISPLAY APPARATUS HAVING THE SAME 有权
标题翻译：电源装置，背光组件和液晶显示装置
公开(公告)号：US20080094001A1
公开(公告)日：2008-04-24
申请号：US11958013
申请日：2007-12-17
申请人： Hyeong-Suk YOO , Moon-Shik KANG
发明人： Hyeong-Suk YOO , Moon-Shik KANG
IPC分类号： H05B41/24 , G05F1/00 , H05B41/36
CPC分类号： H05B41/02 , G09G3/3406 , H02M3/33569 , H05B41/2851 , H05B41/2855 , H05B41/392 , H05B41/3927 , Y02B20/186
摘要： A power supply apparatus includes an inverter controller, a power transforming part and a connecting part. The power transforming part converts a direct current supplied from the inverter controller into an alternating current to output first and second polarity currents. The connecting part outputs the first and second polarity currents to first and second end portions of a load through first and second terminals, respectively and has a third terminal to receive a sensed signal in response to the first or second polarity currents so as to output the sensed signal. The first terminal is spaced apart from the second terminal by a first insulating distance, and the third terminal is spaced apart from the first or second terminals adjacent to the third terminal by a second insulating distance. Therefore, the sensed signal is independent of the output power, thereby increasing the sensing efficiency.
摘要翻译：电源装置包括逆变器控制器，功率变换部分和连接部分。功率变换部分将从逆变器控制器提供的直流电转换为交流电流，以输出第一和第二极性电流。连接部分将第一和第二极性电流分别通过第一和第二端子输出到负载的第一和第二端部，并且具有响应于第一或第二极性电流接收感测信号的第三端子，以便输出感测信号。第一端子与第二端子隔开第一绝缘距离，并且第三端子与第三端子相邻的第一端子或第二端子间隔开第二绝缘距离。因此，感测到的信号与输出功率无关，从而提高感测效率。

9. 发明申请

US20080049219A1 WAFER INSPECTING METHOD 有权
标题翻译：波形检测方法
公开(公告)号：US20080049219A1
公开(公告)日：2008-02-28
申请号：US11693356
申请日：2007-03-29
申请人： Ji-Hye Kim , Yu-Sin Yang , Jong-An Kim , Moon-Shik Kang , Ji-Young Shin
发明人： Ji-Hye Kim , Yu-Sin Yang , Jong-An Kim , Moon-Shik Kang , Ji-Young Shin
IPC分类号： G01N21/00
CPC分类号： G01N21/95607 , G01N21/9501 , G01N2021/8864 , G01N2021/8867 , G01N2021/8887
摘要： A wafer inspecting method including the steps of: multi-scanning a pattern image of a unit inspection region in a normal state and a pattern image of a unit inspection region to be inspected, respectively, using different inspection conditions; comparing the multi-scanned pattern images in the normal state with the multi-scanned pattern images to be inspected obtained by the same inspection conditions, and storing differences between the pattern images as difference images; generating a discrimination difference image by calculating a balance between the stored difference images; and discriminating a defect from noise by using the discrimination difference image.
摘要翻译：一种晶片检查方法，包括以下步骤：使用不同的检查条件分别对正常状态下的单位检查区域的图案图像和要检查的单位检查区域的图案图像进行多次扫描; 将正常状态下的多扫描图案图像与通过相同检查条件获得的待检查的多扫描图案图像进行比较，并且将图案图像之间的差异存储为差分图像; 通过计算所存储的差分图像之间的平衡来产生鉴别差异图像; 以及通过使用辨别差异图像来区分缺陷和噪声。

10. 发明申请

US20080024422A1 INVERTER DRIVING APPARATUS AND LIQUID CRYSTAL DISPLAY INCLUDING INVERTER DRIVING APPARATUS 有权
标题翻译：逆变器驱动装置和液晶显示器，包括逆变器驱动装置
公开(公告)号：US20080024422A1
公开(公告)日：2008-01-31
申请号：US11833631
申请日：2007-08-03
申请人： Sang-Soo KIM , Moon-Shik KANG , Jin-Ho HA , Seung-Hwan MOON
发明人： Sang-Soo KIM , Moon-Shik KANG , Jin-Ho HA , Seung-Hwan MOON
IPC分类号： G09G3/36
CPC分类号： H05B41/00 , G09G3/342 , H05B41/282 , Y02B20/183
摘要： An inverter driving apparatus for driving a plurality of lamp units is provided. The inverter driving apparatus includes a plurality of inverter boards for generating driving signals for driving respective lamp units based on a control signal and a voltage signal. Each lamp unit includes at least one lamp, and the plurality of inverter boards are connected in series and include a first outer inverter board receiving the control signal and a second outer inverter board located opposite the first outer inverter board receiving the voltage signal. Each of the plurality of inverter boards transmits the control signal and/or the voltage signal to at least one of the plurality of inverter boards adjacent thereto.
摘要翻译：提供了用于驱动多个灯单元的逆变器驱动装置。逆变器驱动装置包括多个逆变器基板，用于基于控制信号和电压信号产生用于驱动各灯单元的驱动信号。每个灯单元包括至少一个灯，并且多个逆变器板串联连接，并且包括接收控制信号的第一外部逆变器板和与接收电压信号的第一外部逆变器板相对的第二外部逆变器板。多个逆变器板中的每一个将控制信号和/或电压信号发送到与其相邻的多个逆变器板中的至少一个。

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