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1. 发明申请

US20100229131A1 SWARM INTELLIGENCE FOR ELECTRICAL DESIGN SPACE MODELING AND OPTIMIZATION 有权
标题翻译：电气设计空间建模与优化的SWARM智能
公开(公告)号：US20100229131A1
公开(公告)日：2010-09-09
申请号：US12398535
申请日：2009-03-05
申请人： Moises Cases , Jinwoo Choi , Bhyrav Mutnury , Navraj Singh , Caleb J. Wesley
发明人： Moises Cases , Jinwoo Choi , Bhyrav Mutnury , Navraj Singh , Caleb J. Wesley
IPC分类号： G06F17/50
CPC分类号： G06F17/5045 , G06F2217/08
摘要： A method, system, and computer program product for exploring and optimizing an electrical design space. A computer receiving a design space assigns a plurality of initial values (random or predetermined) for optimizing the design space. A particle swarm containing a plurality of particles is created and an optimization of the design space is then performed using the assigned initial values. Following completion of optimization, the global best and personal best for each particle are updated. Velocity vectors and position vectors of the design space are then updated before the computer performs the optimization process again. The process loops, continually updating global and personal bests and velocity and position vectors until a termination criteria is reached. Upon reaching the termination criteria, the best fitness of each particle of the swarm is assigned as an optimized design space. In an alternate embodiment, the particle with the worst target fitness may be assigned.
摘要翻译：一种用于探索和优化电气设计空间的方法，系统和计算机程序产品。接收设计空间的计算机分配用于优化设计空间的多个初始值（随机或预定）。产生包含多个粒子的粒子群，然后使用分配的初始值来执行设计空间的优化。在优化完成后，更新每个粒子的全球最佳和个人最好的。然后在计算机再次执行优化处理之前更新设计空间的速度向量和位置向量。过程循环，持续更新全局和个人最佳状态以及速度和位置向量，直到达到终止标准。达到终止标准后，群体的每个粒子的最佳适应度被指定为优化的设计空间。在替代实施例中，可以分配具有最差目标适应度的粒子。

2. 发明授权

US08276106B2 Swarm intelligence for electrical design space modeling and optimization 有权
标题翻译：用于电气设计空间建模和优化的群体智能
公开(公告)号：US08276106B2
公开(公告)日：2012-09-25
申请号：US12398535
申请日：2009-03-05
申请人： Moises Cases , Jinwoo Choi , Bhyrav Mutnury , Navraj Singh , Caleb J. Wesley
发明人： Moises Cases , Jinwoo Choi , Bhyrav Mutnury , Navraj Singh , Caleb J. Wesley
IPC分类号： G06F17/50 , G06G7/48
CPC分类号： G06F17/5045 , G06F2217/08
摘要： A method, system, and computer program product for exploring and optimizing an electrical design space. A computer receiving a design space assigns a plurality of initial values (random or predetermined) for optimizing the design space. A particle swarm containing a plurality of particles is created and an optimization of the design space is then performed using the assigned initial values. Following completion of optimization, the global best and personal best for each particle are updated. Velocity vectors and position vectors of the design space are then updated before the computer performs the optimization process again. The process loops, continually updating global and personal bests and velocity and position vectors until a termination criteria is reached. Upon reaching the termination criteria, the best fitness of each particle of the swarm is assigned as an optimized design space. In an alternate embodiment, the particle with the worst target fitness may be assigned.
摘要翻译：一种用于探索和优化电气设计空间的方法，系统和计算机程序产品。接收设计空间的计算机分配用于优化设计空间的多个初始值（随机或预定）。产生包含多个粒子的粒子群，然后使用分配的初始值来执行设计空间的优化。在优化完成后，更新每个粒子的全球最佳和个人最好的。然后在计算机再次执行优化处理之前更新设计空间的速度向量和位置向量。过程循环，持续更新全局和个人最佳状态以及速度和位置向量，直到达到终止标准。达到终止标准后，群体的每个粒子的最佳适应度被指定为优化的设计空间。在替代实施例中，可以分配具有最差目标适应度的粒子。

3. 发明授权

US08327196B2 Identifying an optimized test bit pattern for analyzing electrical communications channel topologies 失效
标题翻译：识别用于分析电气通信信道拓扑的优化测试位模式
公开(公告)号：US08327196B2
公开(公告)日：2012-12-04
申请号：US12174349
申请日：2008-07-16
申请人： Moises Cases , Bhyrav M. Mutnury , Navraj Singh , Caleb J. Wesley
发明人： Moises Cases , Bhyrav M. Mutnury , Navraj Singh , Caleb J. Wesley
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： H04L43/50
摘要： Identifying an optimized test bit pattern for analyzing electrical communications channel topologies, including: ranking according to channel quality, from worst to best, a set of channel topologies for an electrical communications channel; and for each ranked channel topology beginning with the worst, carrying out the following steps in an iterative loop until a concatenated test bit pattern and a previously optimized test bit pattern are functionally equally fit: concatenating to a previously optimized test bit pattern an additional test bit pattern; optimizing the concatenated test bit pattern values for a next ranked channel in the subset, leaving the optimized values of the previously optimized test bit pattern unchanged; and comparing through use of a fitness function the relative qualities of the previously optimized test bit pattern and the optimized concatenated test bit pattern.
摘要翻译：识别用于分析电气通信信道拓扑的优化的测试位模式，包括：根据信道质量进行排序，从最差到最佳，用于电通信信道的一组信道拓扑; 并且对于以最坏情况开始的每个排名的信道拓扑，在迭代循环中执行以下步骤，直到级联的测试位模式和先前优化的测试位模式在功能上相等地适合：级联到先前优化的测试位模式，附加测试位模式; 优化子集中下一个排名的信道的级联测试位模式值，保留先前优化的测试位模式的优化值不变; 并且通过使用适应度函数来比较先前优化的测试位模式和优化的级联测试位模式的相对质量。

4. 发明申请

US20100014569A1 Identifying An Optimized Test Bit Pattern For Analyzing Electrical Communications Channel Topologies 失效
标题翻译：识别用于分析电气通信通道拓扑的优化测试位模式
公开(公告)号：US20100014569A1
公开(公告)日：2010-01-21
申请号：US12174349
申请日：2008-07-16
申请人： Moises Cases , Bhyrav M. Mutnury , Navraj Singh , Caleb J. Wesley
发明人： Moises Cases , Bhyrav M. Mutnury , Navraj Singh , Caleb J. Wesley
IPC分类号： H04B17/00
CPC分类号： H04L43/50
摘要： Identifying an optimized test bit pattern for analyzing electrical communications channel topologies, including: ranking according to channel quality, from worst to best, a set of channel topologies for an electrical communications channel; and for each ranked channel topology beginning with the worst, carrying out the following steps in an iterative loop until a concatenated test bit pattern and a previously optimized test bit pattern are functionally equally fit: concatenating to a previously optimized test bit pattern an additional test bit pattern; optimizing the concatenated test bit pattern values for a next ranked channel in the subset, leaving the optimized values of the previously optimized test bit pattern unchanged; and comparing through use of a fitness function the relative qualities of the previously optimized test bit pattern and the optimized concatenated test bit pattern.
摘要翻译：识别用于分析电气通信信道拓扑的优化的测试位模式，包括：根据信道质量进行排序，从最差到最佳，用于电通信信道的一组信道拓扑; 并且对于以最坏情况开始的每个排名的信道拓扑，在迭代循环中执行以下步骤，直到级联的测试位模式和先前优化的测试位模式在功能上是相等的：连接到先前优化的测试位模式，附加测试位模式; 优化子集中下一个排名的信道的级联测试位模式值，保留先前优化的测试位模式的优化值不变; 并且通过使用适应度函数来比较先前优化的测试位模式和优化的级联测试位模式的相对质量。

5. 发明授权

US08572004B2 Space solution search 失效
标题翻译：空间解决方案搜索
公开(公告)号：US08572004B2
公开(公告)日：2013-10-29
申请号：US12649064
申请日：2009-12-29
申请人： Moises Cases , Jinwoo Choi , Bhyrav M. Mutnury , Navraj Singh
发明人： Moises Cases , Jinwoo Choi , Bhyrav M. Mutnury , Navraj Singh
IPC分类号： G06E1/00 , G06E3/00 , G06F15/00 , G06G7/00 , G06N99/00
CPC分类号： G06N3/126 , G06F17/5009 , G06F2217/10
摘要： A statistical approach can be used to efficiently supply an initial population that provides a good global description of a design space. The SI based simulation can then find a global best design within a reduced number of simulations. The statistical approach can be utilized to determine a plurality of potential best and worst case designs from a design space. The plurality of potential best and worst case designs from the design space seed or prime a SI based simulation. The best case designs are based on design parameters than can be controlled. The worst case designs are based on design parameters than cannot be controlled due. SI based simulations can then be run on the best case designs with respect to the worst case designs to determine probability of failure of the best case design.
摘要翻译：可以使用统计方法来有效地提供提供设计空间的良好全局描述的初始种群。然后，基于SI的仿真可以在减少数量的模拟中找到全局最佳设计。统计方法可用于从设计空间确定多个潜在的最佳和最差情况设计。从设计空间种子的多个潜在的最佳和最坏情况的设计或基于SI的模拟。最好的案例设计是基于设计参数而不是可控制的。最坏的情况设计是基于设计参数而不是不能控制的。然后可以在最坏情况设计的最佳案例设计上运行基于SI的模拟，以确定最佳案例设计的故障概率。

6. 发明申请

US20110161055A1 SPACE SOLUTION SEARCH 失效
标题翻译：空间解决方案搜索
公开(公告)号：US20110161055A1
公开(公告)日：2011-06-30
申请号：US12649064
申请日：2009-12-29
申请人： Moises Cases , Jinwoo Choi , Bhyrav M. Mutnury , Navraj Singh
发明人： Moises Cases , Jinwoo Choi , Bhyrav M. Mutnury , Navraj Singh
IPC分类号： G06F17/50 , G06N3/12 , G06G7/62
CPC分类号： G06N3/126 , G06F17/5009 , G06F2217/10
摘要： A statistical approach can be used to efficiently supply an initial population that provides a good global description of a design space. The SI based simulation can then find a global best design within a reduced number of simulations. The statistical approach can be utilized to determine a plurality of potential best and worst case designs from a design space. The plurality of potential best and worst case designs from the design space seed or prime a SI based simulation. The best case designs are based on design parameters than can be controlled. The worst case designs are based on design parameters than cannot be controlled due. SI based simulations can then be run on the best case designs with respect to the worst case designs to determine probability of failure of the best case design.
摘要翻译：可以使用统计方法来有效地提供提供设计空间的良好全局描述的初始种群。然后，基于SI的仿真可以在减少数量的模拟中找到全局最佳设计。统计方法可用于从设计空间确定多个潜在的最佳和最差情况设计。从设计空间种子的多个潜在的最佳和最坏情况的设计或基于SI的模拟。最好的案例设计是基于设计参数而不是可控制的。最坏的情况设计是基于设计参数而不是不能控制的。然后可以在最坏情况设计的最佳案例设计上运行基于SI的模拟，以确定最佳案例设计的故障概率。

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