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    • 3. 发明授权
    • Method and system of providing a high speed Tomlinson-Harashima Precoder
    • 提供高速Tomlinson-Harashima Precoder的方法和系统
    • US08090013B2
    • 2012-01-03
    • US12043751
    • 2008-03-06
    • Arash FarhoodfarKishore KotaAlan KwentusDavid Hwang
    • Arash FarhoodfarKishore KotaAlan KwentusDavid Hwang
    • H03H7/30H04B15/00H04N5/00
    • H04L25/497H04L25/4975
    • Herein described are at least a method and a system for implementing a high speed Tomlinson-Harashima Precoder. The method comprises using an L-tap transpose configuration of a Tomlinson-Harashima Precoder and processing a first discrete time sampled sequence using said L coefficients and L state variables by clocking the L-tap Tomlinson-Harashima Precoder using a clock signal wherein the clock signal has a clock rate equal to one half the symbol rate of the discrete time sampled sequence. In a representative embodiment, an L-tap Tomlinson-Harashima Precoder comprises a single integrated circuit chip, wherein the integrated circuit chip comprises at least one circuitry for processing a discrete time sampled sequence using L coefficients and L state variables by way of clocking the discrete time sampled sequence using a clock signal having a clock rate that is one half the symbol rate of the discrete time sampled sequence.
    • 这里描述了至少一种用于实现高速Tomlinson-Harashima Precoder的方法和系统。 该方法包括使用Tomlinson-Harashima预编码器的L抽头转置配置,并使用时钟信号对所述L系数和L状态变量进行处理,以便使用L抽头Tomlinson-Harashima Precoder,其中时钟信号 具有等于​​离散时间采样序列的符号速率的一半的时钟速率。 在代表性实施例中,L抽头Tomlinson-Harashima预编码器包括单个集成电路芯片,其中该集成电路芯片包括至少一个电路,用于通过使用离散的时钟来处理使用L个系数和L个状态变量的离散时间采样序列 使用时钟速率为离散时间采样序列的符号率的一半的时钟信号的时间采样序列。
    • 4. 发明申请
    • Methods of Forming Vertical Field Effect Transistors, Vertical Field Effect Transistors, And DRAM Cells
    • 形成垂直场效应晶体管,垂直场效应晶体管和DRAM单元的方法
    • US20110140187A1
    • 2011-06-16
    • US13036725
    • 2011-02-28
    • Larson LindholmDavid Hwang
    • Larson LindholmDavid Hwang
    • H01L27/108H01L21/8242H01L21/336H01L29/78
    • H01L29/66666H01L27/0207H01L27/10876H01L29/0657H01L29/0692H01L29/7827
    • A method of forming a vertical field effect transistor includes etching an opening into semiconductor material. Sidewalls and radially outermost portions of the opening base are lined with masking material. A semiconductive material pillar is epitaxially grown to within the opening adjacent the masking material from the semiconductor material at the opening base. At least some of the masking material is removed from the opening. A gate dielectric is formed radially about the pillar. Conductive gate material is formed radially about the gate dielectric. An upper portion of the pillar is formed to comprise one source/drain region of the vertical transistor. Semiconductive material of the pillar received below the upper portion is formed to comprise a channel region of the vertical transistor. Semiconductor material adjacent the opening is formed to comprise another source/drain region of the vertical transistor. Other aspects and implementations are contemplated.
    • 形成垂直场效应晶体管的方法包括将开口蚀刻成半导体材料。 开口底座的侧壁和径向最外部的部分衬有掩模材料。 半导体材料柱外延生长在与开口底部的半导体材料的掩模材料相邻的开口内。 至少一些掩模材料从开口去除。 栅极电介质围绕柱径向地形成。 导电栅极材料围绕栅极电介质径向地形成。 柱的上部形成为包括垂直晶体管的一个源极/漏极区域。 接收在上部下方的柱的半导体材料形成为包括垂直晶体管的沟道区。 与开口相邻的半导体材料形成为包括垂直晶体管的另一个源极/漏极区域。 考虑了其他方面和实现。
    • 9. 发明申请
    • SEMICONDUCTOR STRUCTURES INCLUDING DUAL FINS
    • 包括双FINS的半导体结构
    • US20110057269A1
    • 2011-03-10
    • US12944529
    • 2010-11-11
    • Aaron R. WilsonLarson LindholmDavid Hwang
    • Aaron R. WilsonLarson LindholmDavid Hwang
    • H01L27/088
    • H01L21/76224H01L29/66795H01L29/7853
    • Fin-FET (fin field effect transistor) devices and methods of fabrication are disclosed. The Fin-FET devices include dual fin structures that may form a channel region between a source region and a drain region. In some embodiments, the dual fin structures are formed by thinning shallow trench isolation structures, using a pair of shallow trench isolation (STI) structures as a mask to define a recess in a portion of the substrate between the pair of STI structures, and recessing the STI structures so that the resulting dual fin structure protrudes from an active surface of the substrate. The dual fin structure may be used to form single-gate, double-gate or triple-gate fin-FET devices. Electronic systems including such fin-FET devices are also disclosed.
    • Fin-FET(鳍场效应晶体管)器件及其制造方法。 Fin-FET器件包括双鳍结构,其可以在源极区域和漏极区域之间形成沟道区域。 在一些实施例中,通过使用一对浅沟槽隔离(STI)结构作为掩模来减薄浅沟槽隔离结构来形成双鳍结构,以在该一对STI结构之间限定衬底的一部分中的凹陷,以及凹陷 STI结构使得所得到的双翅片结构从基板的有效表面突出。 双鳍结构可用于形成单栅极,双栅极或三栅极鳍FET器件。 还公开了包括这种鳍式FET器件的电子系统。