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    • 1. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US4984207A
    • 1991-01-08
    • US490550
    • 1990-03-05
    • Minoru TatenoAkira Ide
    • Minoru TatenoAkira Ide
    • G11C7/06G11C11/416G11C11/419
    • G11C11/419G11C7/062
    • A sense amplifier in a semiconductor memory device comprising a differential pair of bipolar transistors whose bases are supplied with read signals appearing on a pair of common data lines pulled up to the side of a positive power source potential, a regulated current circuit which causes a constant current to flow from the common emitters of the pair of bipolar transistors, as well as regulated current circuits which bias the respective bases of the pair of bipolar transistors to the side of a negative power source potential, and a control circuit which switches and controls the respective regulated current circuits in accordance with the select state of the sense amplifier, and also comprising saturation preventive circuits which cause minute currents to flow from the respective bases of the pair of bipolar transistors toward the negative power source potential, so that the bipolar transistors are avoided from falling into saturated states when the regulated current circuits are turned "off," thereby making it possible to reduce the average power consumption of the memory device without delaying the operating speed thereof.
    • 一种半导体存储器件中的读出放大器,包括一对双极型晶体管,其基极被提供在上升到正电源电位侧的一对公共数据线上出现的读出信号,一个恒定电流电路 一对双极晶体管的公共发射极的电流以及将一对双极晶体管的各个基极偏压到负电源电位侧的稳压电路,以及控制电路,其切换和控制 根据感测放大器的选择状态的各自的稳压电流电路,并且还包括使微小电流从一对双极晶体管的各个基极流向负电源电位的饱和预防电路,使得双极晶体管 避免在调节电流回路时陷入饱和状态 ed“关闭”,从而可以在不延迟其操作速度的情况下降低存储器件的平均功耗。
    • 3. 发明授权
    • Semiconductor device and manufacturing method thereof
    • 半导体装置及其制造方法
    • US08687444B2
    • 2014-04-01
    • US13200649
    • 2011-09-28
    • Akira IdeHiroki Ichikawa
    • Akira IdeHiroki Ichikawa
    • G11C7/00
    • G11C29/44G11C29/56008G11C2029/1208G11C2029/5606
    • A plurality of memory cells are tested in order. Each time a defective memory cell is detected by the test, error pattern information is updated based on a relative arrangement relationship between a plurality of defective memory cells, and error address information is updated based on the addresses of at least part of the plurality of defective memory cells. According to the present invention, it is possible to significantly reduce the storage capacity of the analysis memory. This allows the implementation of the analysis memory itself in the semiconductor device, in which case external testers need not include the analysis memory.
    • 按顺序测试多个存储单元。 每次通过测试检测到有缺陷的存储单元时,基于多个有缺陷的存储单元之间的相对布置关系来更新错误模式信息,并且基于多个缺陷存储器单元的至少一部分的地址来更新错误地址信息 记忆细胞 根据本发明,可以显着降低分析存储器的存储容量。 这允许在半导体器件中实现分析存储器本身,在这种情况下外部测试器不需要包括分析存储器。
    • 10. 发明授权
    • Computer product, apparatus and method for generating configuration-information for use in monitoring information technology services
    • 用于生成用于监控信息技术服务的配置信息的计算机产品,设备和方法
    • US08468238B2
    • 2013-06-18
    • US12512822
    • 2009-07-30
    • Kazuyuki SakaiAkira IdeYasushi Kobayashi
    • Kazuyuki SakaiAkira IdeYasushi Kobayashi
    • G06F15/16G06F12/00
    • H04L43/0817G06F11/3476H04L41/0856H04L41/0886
    • Computer product for generating configuration-information that performs obtaining a first process information operating on a server from each of a plurality of servers constituting an IT system prior to a start of processes in any of the servers, the processes including a process corresponding to an application for an IT service; repeatedly obtaining a second process information from each of the servers through the start to end of the processes performing the application; specifying third process information corresponding to the application by removing the first process information from the second process information; and generating configuration information for monitoring a process condition of the processes, from the third process information, a process name corresponding to the application and identification information of the server where the process corresponds to the process name of the application, the extracted process name being associated with the identification information.
    • 一种用于生成配置信息的计算机产品,所述配置信息在任何服务器中开始处理之前从构成IT系统的多个服务器中的每一个服务器获得第一处理信息,所述处理包括与应用相对应的处理 为IT服务; 通过执行应用的处理的开始到结束,重复从每个服务器获得第二处理信息; 通过从所述第二处理信息中移除所述第一处理信息来指定与所述应用相对应的第三处理信息; 以及生成用于监视所述处理的处理条件的配置信息,从所述第三处理信息,与所述应用程序对应的处理名称和所述处理对应于所述应用的处理名称的所述服务器的识别信息,所提取的进程名称相关联 具有识别信息。