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    • 5. 发明授权
    • Apparatus and method for transferring semiconductor die to a carrier
    • 将半导体管芯转移到载体上的装置和方法
    • US06204092B1
    • 2001-03-20
    • US09290421
    • 1999-04-13
    • Joseph M. FreundGeorge J. PrzybylekDennis M. Romero
    • Joseph M. FreundGeorge J. PrzybylekDennis M. Romero
    • H01L2144
    • H01L21/67132H01L2221/68354Y10S438/976
    • An apparatus and method for transferring a semiconductor die from an adhesive film to an output carrier is disclosed. The adhesive film and associated hoop assembly on which the die are secured are inverted so that die face downward, p-side down, from the film. And an output pack is positioned beneath the die. An ejector pin exerts a force on a side of the adhesive film opposite the side on which the semiconductor die is secured to release the die. A vacuum is provided through a port in the output pack, pulling the released die into the output pack. The transfer occurs in a single step and orients the die p-side down in the output pack, thus eliminating the control arm/vacuum collet assembly and associated handling steps of conventional transfer mechanisms.
    • 公开了一种用于将半导体管芯从粘合剂膜转移到输出载体的装置和方法。 模具固定在其上的粘合膜和相关联的箍组件被倒置,使得模具从膜向下,p侧向下。 并且输出组件位于模具下方。 顶针在与固定半导体管芯的一侧相对的粘合膜的一侧上施加力以释放模具。 通过输出包装中的端口提供真空,将释放的模具拉入输出包装。 转移发生在单个步骤中,并将模具p侧定向在输出包装中,从而消除了传统转移机构的控制臂/真空夹头组件和相关的处理步骤。
    • 9. 发明授权
    • Method and apparatus for testing the light output of light emitting devices
    • 用于测试发光器件的光输出的方法和装置
    • US06384612B2
    • 2002-05-07
    • US09168035
    • 1998-10-07
    • Joseph M. FreundGeorge J. PrzybylekDennis M. RomeroJohn Stayt, Jr.
    • Joseph M. FreundGeorge J. PrzybylekDennis M. RomeroJohn Stayt, Jr.
    • G01R104
    • G01J1/04G01J1/0422G01J2001/4247G01R31/2635
    • A method for testing the light emitted by a group of semiconductor light emitting devices arranged to emit light over a testing area, each light emitting device having a p-contact, the method including connecting a plurality of selectively connectable p-contact probes to the p-contacts of respective light emitting devices in the group of light emitting devices, selectively activating one of the light emitting devices in the group of light emitting devices to emit light over the testing area by selectively supplying a predetermined electrical current to the p-contact of the selected light emitting device via its respective p-contact probe, guiding the light emitted by the selected light emitting device via a light funnel having a collection end and a detection end, the collection end being in juxtaposition with all the light emitting devices in the group of light emitting devices, and detecting light exiting the detection end of the light funnel.
    • 一种用于测试被布置成在测试区域上发光的一组半导体发光器件发射的光的方法,每个发光器件具有p型接触,所述方法包括将多个可选择连接的p型接触探针连接到p - 各组发光器件中的各个发光器件的接触,选择性地激活该组发光器件中的一个发光器件以在测试区域上发光,通过选择性地将预定的电流提供给 所选择的发光器件经由其相应的p型接触探针,经由具有收集端和检测端的光漏斗引导由所选择的发光器件发射的光,所述收集端与所述发光器件中的所有发光器件并置 一组发光器件,以及检测从漏斗的检测端射出的光。