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1. 发明授权

US06384612B2 Method and apparatus for testing the light output of light emitting devices 有权
标题翻译：用于测试发光器件的光输出的方法和装置
公开(公告)号：US06384612B2
公开(公告)日：2002-05-07
申请号：US09168035
申请日：1998-10-07
申请人： Joseph M. Freund , George J. Przybylek , Dennis M. Romero , John Stayt, Jr.
发明人： Joseph M. Freund , George J. Przybylek , Dennis M. Romero , John Stayt, Jr.
IPC分类号： G01R104
CPC分类号： G01J1/04 , G01J1/0422 , G01J2001/4247 , G01R31/2635
摘要： A method for testing the light emitted by a group of semiconductor light emitting devices arranged to emit light over a testing area, each light emitting device having a p-contact, the method including connecting a plurality of selectively connectable p-contact probes to the p-contacts of respective light emitting devices in the group of light emitting devices, selectively activating one of the light emitting devices in the group of light emitting devices to emit light over the testing area by selectively supplying a predetermined electrical current to the p-contact of the selected light emitting device via its respective p-contact probe, guiding the light emitted by the selected light emitting device via a light funnel having a collection end and a detection end, the collection end being in juxtaposition with all the light emitting devices in the group of light emitting devices, and detecting light exiting the detection end of the light funnel.
摘要翻译：一种用于测试被布置成在测试区域上发光的一组半导体发光器件发射的光的方法，每个发光器件具有p型接触，所述方法包括将多个可选择连接的p型接触探针连接到p - 各组发光器件中的各个发光器件的接触，选择性地激活该组发光器件中的一个发光器件以在测试区域上发光，通过选择性地将预定的电流提供给所选择的发光器件经由其相应的p型接触探针，经由具有收集端和检测端的光漏斗引导由所选择的发光器件发射的光，所述收集端与所述发光器件中的所有发光器件并置一组发光器件，以及检测从漏斗的检测端射出的光。

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