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    • 1. 发明授权
    • Mismatch error reduction method and system for STT MRAM
    • STT MRAM的不匹配误差减少方法和系统
    • US09070466B2
    • 2015-06-30
    • US13605693
    • 2012-09-06
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • G11C11/16
    • G11C11/1673
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In accordance with one aspect of the invention, a method for reading a memory cell includes combining a cell current from a memory cell with a reference current from a reference source to create an average current, enabling the average current to flow through a first mirror transistor in a sense path and a second mirror transistor in a reference path, storing the current mismatch on a capacitor coupled to the gates of the first mirror transistor and the second mirror transistor, disconnecting the memory cell from the reference path and disconnecting the reference source from the sense path, enabling the cell current only to flow through the sense path, and determining the output level of the memory cell.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 根据本发明的一个方面,一种用于读取存储单元的方法包括将来自存储单元的单元电流与来自参考源的参考电流组合以产生平均电流,使平均电流能够流过第一镜像晶体管 在参考路径中的感测路径和第二镜像晶体管中,将电流失配存储在耦合到第一镜面晶体管和第二镜像晶体管的栅极的电容器上,将存储器单元与参考路径断开并将参考源与 感测路径,使得电池电流仅能够流过感测路径,并且确定存储器单元的输出电平。
    • 3. 发明申请
    • Mismatch Error Reduction Method and System for STT MRAM
    • STT MRAM的不匹配误差减少方法和系统
    • US20140063923A1
    • 2014-03-06
    • US13605693
    • 2012-09-06
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • Mihail JefremowWolf AllersJan OtterstedtChristian PetersThomas Kern
    • G11C7/06G11C11/16
    • G11C11/1673
    • The invention relates to methods and systems for reading a memory cell and in particular, an STT MRAM. In accordance with one aspect of the invention, a method for reading a memory cell includes combining a cell current from a memory cell with a reference current from a reference source to create an average current, enabling the average current to flow through a first mirror transistor in a sense path and a second mirror transistor in a reference path, storing the current mismatch on a capacitor coupled to the gates of the first mirror transistor and the second mirror transistor, disconnecting the memory cell from the reference path and disconnecting the reference source from the sense path, enabling the cell current only to flow through the sense path, and determining the output level of the memory cell.
    • 本发明涉及用于读取存储器单元,特别是STT MRAM的方法和系统。 根据本发明的一个方面,一种用于读取存储单元的方法包括将来自存储单元的单元电流与来自参考源的参考电流组合以产生平均电流,使平均电流能够流过第一镜像晶体管 在参考路径中的感测路径和第二镜像晶体管中,将电流失配存储在耦合到第一镜面晶体管和第二镜像晶体管的栅极的电容器上,将存储器单元与参考路径断开并将参考源与 感测路径,使得电池电流仅能够流过感测路径,并且确定存储器单元的输出电平。