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    • 2. 发明申请
    • Device and method for testing and for diagnosing digital circuits
    • 用于测试和诊断数字电路的装置和方法
    • US20070168814A1
    • 2007-07-19
    • US11364369
    • 2006-03-01
    • Andreas LeiningerMichael Goessel
    • Andreas LeiningerMichael Goessel
    • G01R31/28G06F11/00
    • G01R31/31928G01R31/31922G01R31/31937G11C29/40
    • A test apparatus includes a test input signal generator that generates a test input signal of word width N, and terminals that connect to inputs and outputs of an electrical circuit to be tested. The electrical circuit includes N digital test inputs and M digital test outputs. The terminals for the test inputs are connected to the test input signal and an electrical circuit is driven such that it outputs at its test outputs data with a macro clock cycle T of length L as test response. A compactor includes M inputs that are connected to the terminals for the test outputs of the circuit to be tested. The compactor compacts the test response with a micro clock cycle t of length l and outputs a data word of width m, where the length L is at least twice as large as the length l.
    • 测试装置包括测试输入信号发生器,其产生字宽N的测试输入信号,以及连接到要测试的电路的输入和输出的端子。 电路包括N个数字测试输入和M个数字测试输出。 测试输入的端子连接到测试输入信号,并且驱动电路,使得其测试输出以长度为L的宏时钟周期T作为测试响应输出数据。 压实机包括连接到端子的M个输入端,用于待测电路的测试输出。 压实机用长度为l的微时钟周期t压缩测试响应,并输出宽度为m的数据字,其中长度L至少是长度l的两倍。
    • 3. 发明授权
    • Device and method for testing and for diagnosing digital circuits
    • 用于测试和诊断数字电路的装置和方法
    • US08312332B2
    • 2012-11-13
    • US11364369
    • 2006-03-01
    • Andreas LeiningerMichael Goessel
    • Andreas LeiningerMichael Goessel
    • G01R31/28
    • G01R31/31928G01R31/31922G01R31/31937G11C29/40
    • A test apparatus includes a test input signal generator that generates a test input signal of word width N, and terminals that connect to inputs and outputs of an electrical circuit to be tested. The electrical circuit includes N digital test inputs and M digital test outputs. The terminals for the test inputs are connected to the test input signal and an electrical circuit is driven such that it outputs at its test outputs data with a macro clock cycle T of length L as test response. A compactor includes M inputs that are connected to the terminals for the test outputs of the circuit to be tested. The compactor compacts the test response with a micro clock cycle t of length l and outputs a data word of width m, where the length L is at least twice as large as the length l.
    • 测试装置包括测试输入信号发生器,其产生字宽N的测试输入信号,以及连接到要测试的电路的输入和输出的端子。 电路包括N个数字测试输入和M个数字测试输出。 测试输入的端子连接到测试输入信号,并且驱动电路,使得其测试输出以长度为L的宏时钟周期T作为测试响应输出数据。 压实机包括连接到端子的M个输入端,用于待测电路的测试输出。 压实机用长度为l的微时钟周期t压缩测试响应,并输出宽度为m的数据字,其中长度L至少是长度l的两倍。