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    • 9. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD
    • 半导体器件和方法
    • US20110095364A1
    • 2011-04-28
    • US12984910
    • 2011-01-05
    • Matthias StecherTobias Smorodin
    • Matthias StecherTobias Smorodin
    • H01L29/78H01L23/522H01L21/336
    • H01L29/7809H01L23/4824H01L27/0922H01L29/0653H01L29/0692H01L29/0696H01L29/0865H01L29/0878H01L29/0882H01L29/41741H01L29/41758H01L29/7395H01L29/7398H01L29/7802H01L29/7816H01L2924/0002H03K17/0822H01L2924/00
    • A semiconductor device and method is disclosed. One embodiment provides an active region in a semiconductor substrate, including a first terminal region and a second terminal region. wherein the active region is interrupted by an inactive region, wherein an electrical power dissipation in the inactive region is zero or smaller than an electrical power dissipation in the active region; and a metallization layer arranged with respect to the active region on a surface of the semiconductor device and at least partly overlapping the active area, wherein the metallization layer is divided into a first part, in electrical contact to the first terminal region, and a second part, in electrical contact to the second terminal region, wherein the first and the second part are separated by a gap; and wherein the gap and the inactive region are mutually arranged so that an electrical power dissipation below the gap is reduced compared to an electrical power dissipation below the first part and the second part of the metallization layer.
    • 公开了半导体器件和方法。 一个实施例提供半导体衬底中的有源区,包括第一端区和第二端区。 其中所述有源区域被非活性区域中断,其中所述无源区域中的功率消耗为零或小于所述有源区域中的功率耗散; 以及金属化层,其相对于所述半导体器件的表面上的所述有源区域布置并且至少部分地与所述有源区域重叠,其中所述金属化层被分成与所述第一端子区域电接触的第一部分,以及第二部分 部分地与第二端子区域电接触,其中第一和第二部分被间隙隔开; 并且其中所述间隙和所述非活性区域相互布置,使得与所述金属化层的第一部分和所述第二部分下方的电功率耗散相比,所述间隙之下的电功率耗散减小。
    • 10. 发明授权
    • Semiconductor device and method
    • 半导体器件及方法
    • US07888794B2
    • 2011-02-15
    • US12032760
    • 2008-02-18
    • Matthias StecherTobias Smorodin
    • Matthias StecherTobias Smorodin
    • H01L21/00H01L23/34
    • H01L29/7809H01L23/4824H01L27/0922H01L29/0653H01L29/0692H01L29/0696H01L29/0865H01L29/0878H01L29/0882H01L29/41741H01L29/41758H01L29/7395H01L29/7398H01L29/7802H01L29/7816H01L2924/0002H03K17/0822H01L2924/00
    • A semiconductor device and method is disclosed. One embodiment provides an active region in a semiconductor substrate, including a first terminal region and a second terminal region. wherein the active region is interrupted by an inactive region, wherein an electrical power dissipation in the inactive region is zero or smaller than an electrical power dissipation in the active region; and a metallization layer arranged with respect to the active region on a surface of the semiconductor device and at least partly overlapping the active area, wherein the metallization layer is divided into a first part, in electrical contact to the first terminal region, and a second part, in electrical contact to the second terminal region, wherein the first and the second part are separated by a gap; and wherein the gap and the inactive region are mutually arranged so that an electrical power dissipation below the gap is reduced compared to an electrical power dissipation below the first part and the second part of the metallization layer.
    • 公开了半导体器件和方法。 一个实施例提供半导体衬底中的有源区,包括第一端区和第二端区。 其中所述有源区域被非活性区域中断,其中所述无源区域中的功率消耗为零或小于所述有源区域中的功率耗散; 以及金属化层,其相对于所述半导体器件的表面上的所述有源区域布置并且至少部分地与所述有源区域重叠,其中所述金属化层被分成与所述第一端子区域电接触的第一部分,以及第二部分 部分地与第二端子区域电接触,其中第一和第二部分被间隙隔开; 并且其中所述间隙和所述非活性区域相互布置,使得与所述金属化层的第一部分和所述第二部分下方的电功率耗散相比,所述间隙之下的电功率耗散减小。