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    • 5. 发明申请
    • SOLDER BONDING STRUCTURE AND SOLDERING FLUX
    • 焊接结构和焊接焊接
    • US20110036628A1
    • 2011-02-17
    • US12918169
    • 2009-02-19
    • Masami Aihara
    • Masami Aihara
    • H01R4/02B23K35/38B23K1/00
    • B23K1/0016B23K35/0222B23K35/0244B23K35/025B23K35/36B23K35/3612B23K35/3613C21D2251/00H05K3/3442H05K3/3484H05K3/3489H05K2201/068Y02P10/212
    • Disclosed is a solder bonding structure which is capable of retaining sufficient solder bonding strength and ensuring high bonding reliability even in severe environments having an extremely large temperature difference. In the solder bonding structure, an electronic component 4 is mounted on a main surface 1a of a substrate having an electrode section 2 and an insulating film 3, and the electrode section 2 and the electronic component 4 are electrically bonded to each other through a solder section 5, and a flux residue 6 exuded from the solder section 5 is present between the electronic component 4 and the insulating film 3. The flux contains an acrylic resin, an activating agent, and a thixotropic agent having a hydroxyl group. The glass transition point of the acrylic resin is not higher than −40° C., or not lower than the softening temperature of the flux residue. The flux residue has a maximum value of 300×10−6/K or less of linear thermal expansion coefficient within a temperature range from −40° C. to the softening temperature of the flux residue.
    • 公开了一种能够保持足够的焊接接合强度并且即使在具有非常大的温度差的恶劣环境中也确保高的接合可靠性的焊接接合结构。 在焊接结构中,电子部件4安装在具有电极部2和绝缘膜3的基板的主面1a上,电极部2和电子部件4通过焊料彼此电接合 并且在电子部件4和绝缘膜3之间存在从焊料部5渗出的焊剂残渣6。焊剂含有丙烯酸树脂,活化剂和具有羟基的触变剂。 丙烯酸树脂的玻璃化转变点不高于-40℃,或不低于焊剂残留物的软化温度。 焊剂残留物在-40℃至焊剂残留物的软化温度范围内的线性热膨胀系数的最大值为300×10 -6 / K以下。
    • 6. 发明申请
    • SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND METHOD OF MANUFACTURING THE SAME
    • 半导体发光元件及其制造方法
    • US20090110017A1
    • 2009-04-30
    • US12275750
    • 2008-11-21
    • Masami Aihara
    • Masami Aihara
    • H01S5/00H01L21/02
    • H01L33/0079H01L33/44
    • A semiconductor light-emitting element includes a semiconductor layer including a light-emitting layer, a refractive index gradient layer provided on a light extraction surface of the semiconductor layer, and a holding substrate bounded to an outer surface of the refractive index gradient layer with an adhesion layer interposed therebetween. A refractive index of the refractive index gradient layer is changed continuously or stepwise in a film thickness direction such that a semiconductor-layer-side refractive index is substantially equivalent to a refractive index of the semiconductor layer and a holding-substrate-side refractive index is substantially equivalent to a refractive index of the holding substrate. The refractive index gradient layer is formed by vapor plating.
    • 半导体发光元件包括:半导体层,包括发光层,设置在半导体层的光提取表面上的折射率梯度层;以及保持基板,其与折射率梯度层的外表面界定, 粘合层插入其间。 折射率梯度层的折射率在膜厚方向上连续地或逐步地变化,使得半导体层侧折射率基本上等于半导体层的折射率,保持基板侧的折射率为 基本上等于保持基板的折射率。 折射率梯度层通过蒸镀形成。
    • 8. 发明授权
    • Test assistant system for logical design process
    • 用于逻辑设计过程的测试助理系统
    • US5282146A
    • 1994-01-25
    • US694136
    • 1991-05-01
    • Masami AiharaMasatoshi SekineTsutomu TakeiHiroaki NishiKazuyoshi KohnoTakeshi KitaharaAtsushi Masuda
    • Masami AiharaMasatoshi SekineTsutomu TakeiHiroaki NishiKazuyoshi KohnoTakeshi KitaharaAtsushi Masuda
    • G06F11/25G01R31/3183G06F17/50G06F15/60
    • G01R31/318357G01R31/318307G06F17/5022
    • Disclosed is a test assistant system for a logical design process comprising a description storage data base for storing statements expressing logical functions of circuit components to be tested, a compiler for compiling the statements to output object data, a data base for storing the object data, a test pattern generator for generating test patterns by using the object data stored in the data base, a test pattern data base for storing the test patterns, each having a level number, a simulator for executing a simulation for the logical function by using the test patterns stored in the test pattern data base, and a display for displaying the object data, the test patterns, the information used in the simulation, and relationships among them. The data base comprises a region for storing a statement correspondence table expressing statements as descriptions of the logical functions of the circuit components, a region for storing a circuit component table expressing a circuit component corresponding to the function described in the statement, a region for storing a dependent relationship table expressing the dependent relationship between the statements, and a correspondence relationship table expressing the correspondence relationship between the statement correspondence table and the circuit component table.
    • 公开了一种用于逻辑设计过程的测试辅助系统,包括用于存储表示要测试的电路组件的逻辑功能的语句的描述存储数据库,用于编译语句以输出对象数据的编译器,用于存储对象数据的数据库, 用于通过使用存储在数据库中的对象数据来生成测试模式的测试模式发生器,用于存储测试模式的测试模式数据库,每个具有级别号码,用于通过使用测试执行用于逻辑功能的模拟的模拟器 存储在测试模式数据库中的模式,以及用于显示对象数据,测试模式,模拟中使用的信息以及它们之间的关系的显示。 数据库包括用于存储表示语句的语句对应表的区域,作为对电路组件的逻辑功能的描述的区域,用于存储表示对应于语句中描述的功能的电路组件的电路组件表的区域,用于存储 表示语句之间的依赖关系的依赖关系表和表示语句对应表与电路分量表之间的对应关系的对应关系表。